TW200641953A - Plasma source, ion source, and ion generation method - Google Patents

Plasma source, ion source, and ion generation method

Info

Publication number
TW200641953A
TW200641953A TW095104344A TW95104344A TW200641953A TW 200641953 A TW200641953 A TW 200641953A TW 095104344 A TW095104344 A TW 095104344A TW 95104344 A TW95104344 A TW 95104344A TW 200641953 A TW200641953 A TW 200641953A
Authority
TW
Taiwan
Prior art keywords
thermal
thermal electrode
ion
source
electrode
Prior art date
Application number
TW095104344A
Other languages
Chinese (zh)
Inventor
Yasuhiko Kasama
Kenji Omote
Kuniyoshi Yokoh
Kenichiro Komatsu
Original Assignee
Ideal Star Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ideal Star Inc filed Critical Ideal Star Inc
Publication of TW200641953A publication Critical patent/TW200641953A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00Ion beam tubes
    • H01J27/02Ion sources; Ion guns
    • H01J27/26Ion sources; Ion guns using surface ionisation, e.g. field effect ion sources, thermionic ion sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/08Ion sources; Ion guns
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation

Abstract

To provide a method for manufacturing endohedral fullerene of a quantity sufficient for using it as an industrial material, and to provide a plasma source capable of extracting plasma with a high ionic current for synthesizing a large volume of included fullerene. A metal plate having a plurality of openings, such as a metallic mesh is used for a thermal electrode. In addition, since the surface area of thermal electrode in contact with steam is increased markedly, by stacking a plurality of the thermal electrodes, ionization efficiency is improved, and a large ion current can be extracted. By forming the thermal electrode with a thin tungsten wire or the like, heat can be generated, by carrying a current to the thermal electrode itself without heating the thermal electrode by a heater, and the effect of improving the utilization efficiency of thermal energy is obtained.
TW095104344A 2005-02-09 2006-02-09 Plasma source, ion source, and ion generation method TW200641953A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005032425 2005-02-09
JP2006030536A JP2006253122A (en) 2005-02-09 2006-02-08 Plasma source, ion source, and ion generation method

Publications (1)

Publication Number Publication Date
TW200641953A true TW200641953A (en) 2006-12-01

Family

ID=36793147

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095104344A TW200641953A (en) 2005-02-09 2006-02-09 Plasma source, ion source, and ion generation method

Country Status (3)

Country Link
JP (1) JP2006253122A (en)
TW (1) TW200641953A (en)
WO (1) WO2006085576A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI414213B (en) * 2007-12-19 2013-11-01 Asml Netherlands Bv Radiation source, lithographic apparatus and device manufacturing method
TWI570767B (en) * 2014-05-23 2017-02-11 A plasma processing chamber and its DC electrode and heating device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112616233B (en) * 2020-12-16 2023-03-21 中国科学院合肥物质科学研究院 Stable-state high-beam-density long-life lithium ion source suitable for accelerator

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4096373B2 (en) * 1997-03-25 2008-06-04 住友電気工業株式会社 Hard coating and manufacturing method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI414213B (en) * 2007-12-19 2013-11-01 Asml Netherlands Bv Radiation source, lithographic apparatus and device manufacturing method
TWI570767B (en) * 2014-05-23 2017-02-11 A plasma processing chamber and its DC electrode and heating device

Also Published As

Publication number Publication date
JP2006253122A (en) 2006-09-21
WO2006085576A1 (en) 2006-08-17

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