TW200641369A - Chip capable of testing itself and testing method thereof - Google Patents

Chip capable of testing itself and testing method thereof

Info

Publication number
TW200641369A
TW200641369A TW094116179A TW94116179A TW200641369A TW 200641369 A TW200641369 A TW 200641369A TW 094116179 A TW094116179 A TW 094116179A TW 94116179 A TW94116179 A TW 94116179A TW 200641369 A TW200641369 A TW 200641369A
Authority
TW
Taiwan
Prior art keywords
testing
itself
circuit
result
chip
Prior art date
Application number
TW094116179A
Other languages
English (en)
Other versions
TWI266065B (en
Inventor
Jien-Chung Huang
Wei-Kuo Chia
Kae-Jiun Mo
Original Assignee
Via Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Via Tech Inc filed Critical Via Tech Inc
Priority to TW094116179A priority Critical patent/TWI266065B/zh
Priority to US11/274,780 priority patent/US20060265632A1/en
Application granted granted Critical
Publication of TWI266065B publication Critical patent/TWI266065B/zh
Publication of TW200641369A publication Critical patent/TW200641369A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
TW094116179A 2005-05-18 2005-05-18 Chip capable of testing itself and testing method thereof TWI266065B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW094116179A TWI266065B (en) 2005-05-18 2005-05-18 Chip capable of testing itself and testing method thereof
US11/274,780 US20060265632A1 (en) 2005-05-18 2005-11-15 Chip capable of testing itself and testing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094116179A TWI266065B (en) 2005-05-18 2005-05-18 Chip capable of testing itself and testing method thereof

Publications (2)

Publication Number Publication Date
TWI266065B TWI266065B (en) 2006-11-11
TW200641369A true TW200641369A (en) 2006-12-01

Family

ID=37449670

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094116179A TWI266065B (en) 2005-05-18 2005-05-18 Chip capable of testing itself and testing method thereof

Country Status (2)

Country Link
US (1) US20060265632A1 (zh)
TW (1) TWI266065B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI679529B (zh) * 2018-10-08 2019-12-11 新唐科技股份有限公司 自我檢測系統及其方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI306951B (en) 2006-12-19 2009-03-01 Via Tech Inc Chipset and chipset testing method
US8484524B2 (en) * 2007-08-21 2013-07-09 Qualcomm Incorporated Integrated circuit with self-test feature for validating functionality of external interfaces
US8136001B2 (en) * 2009-06-05 2012-03-13 Freescale Semiconductor, Inc. Technique for initializing data and instructions for core functional pattern generation in multi-core processor

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5485467A (en) * 1993-09-24 1996-01-16 Vlsi Technology, Inc. Versatile reconfigurable matrix based built-in self-test processor for minimizing fault grading
US6148425A (en) * 1998-02-12 2000-11-14 Lucent Technologies Inc. Bist architecture for detecting path-delay faults in a sequential circuit
US6247151B1 (en) * 1998-06-30 2001-06-12 Intel Corporation Method and apparatus for verifying that data stored in a memory has not been corrupted
US6463561B1 (en) * 1999-09-29 2002-10-08 Agere Systems Guardian Corp. Almost full-scan BIST method and system having higher fault coverage and shorter test application time
US6694451B2 (en) * 2000-12-07 2004-02-17 Hewlett-Packard Development Company, L.P. Method for redundant suspend to RAM
US6789220B1 (en) * 2001-05-03 2004-09-07 Xilinx, Inc. Method and apparatus for vector processing
US6966017B2 (en) * 2001-06-20 2005-11-15 Broadcom Corporation Cache memory self test
US6988232B2 (en) * 2001-07-05 2006-01-17 Intellitech Corporation Method and apparatus for optimized parallel testing and access of electronic circuits
US6950974B1 (en) * 2001-09-07 2005-09-27 Synopsys Inc. Efficient compression and application of deterministic patterns in a logic BIST architecture
EP1491906B1 (en) * 2003-06-24 2007-05-16 STMicroelectronics S.r.l. An integrated device with an improved BIST circuit for executing a structured test

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI679529B (zh) * 2018-10-08 2019-12-11 新唐科技股份有限公司 自我檢測系統及其方法

Also Published As

Publication number Publication date
US20060265632A1 (en) 2006-11-23
TWI266065B (en) 2006-11-11

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