TW200638050A - Machine modifying procedure for IC testing machine - Google Patents

Machine modifying procedure for IC testing machine

Info

Publication number
TW200638050A
TW200638050A TW094113468A TW94113468A TW200638050A TW 200638050 A TW200638050 A TW 200638050A TW 094113468 A TW094113468 A TW 094113468A TW 94113468 A TW94113468 A TW 94113468A TW 200638050 A TW200638050 A TW 200638050A
Authority
TW
Taiwan
Prior art keywords
testing
machine
modifying procedure
identification code
code
Prior art date
Application number
TW094113468A
Other languages
Chinese (zh)
Other versions
TWI271531B (en
Inventor
Hung-Ching Hung
Original Assignee
Advanced Semiconductor Eng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Semiconductor Eng filed Critical Advanced Semiconductor Eng
Priority to TW94113468A priority Critical patent/TWI271531B/en
Publication of TW200638050A publication Critical patent/TW200638050A/en
Application granted granted Critical
Publication of TWI271531B publication Critical patent/TWI271531B/en

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

A machine modifying procedure for an IC testing machine, in which its testing modules are required to be replaced for testing different type of IC chips, wherein the machine modifying procedure comprises the following steps: installing at least one of the testing modules having an identification code in the machine body of the IC testing machine; inputting a serial number or code representative of an IC to be tested into the machine body; receiving the identification code from the installed testing module; and determining whether the installed testing module can be used for testing the IC according to the inputted serial number or code and the received identification code, whereby resolving the IC damage problem caused by installing an improper testing module in the machine body.
TW94113468A 2005-04-27 2005-04-27 Machine modifying method for IC testing machine TWI271531B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94113468A TWI271531B (en) 2005-04-27 2005-04-27 Machine modifying method for IC testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94113468A TWI271531B (en) 2005-04-27 2005-04-27 Machine modifying method for IC testing machine

Publications (2)

Publication Number Publication Date
TW200638050A true TW200638050A (en) 2006-11-01
TWI271531B TWI271531B (en) 2007-01-21

Family

ID=38435224

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94113468A TWI271531B (en) 2005-04-27 2005-04-27 Machine modifying method for IC testing machine

Country Status (1)

Country Link
TW (1) TWI271531B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI616247B (en) * 2015-04-29 2018-03-01 Towa Corp Article manufacturing device and manufacturing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI616247B (en) * 2015-04-29 2018-03-01 Towa Corp Article manufacturing device and manufacturing method

Also Published As

Publication number Publication date
TWI271531B (en) 2007-01-21

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