TW200632349A - Contactless wafer level burn-in - Google Patents

Contactless wafer level burn-in

Info

Publication number
TW200632349A
TW200632349A TW094145943A TW94145943A TW200632349A TW 200632349 A TW200632349 A TW 200632349A TW 094145943 A TW094145943 A TW 094145943A TW 94145943 A TW94145943 A TW 94145943A TW 200632349 A TW200632349 A TW 200632349A
Authority
TW
Taiwan
Prior art keywords
wafer level
level burn
chamber
wafer
burn
Prior art date
Application number
TW094145943A
Other languages
English (en)
Other versions
TWI280390B (en
Inventor
Jian Chen
Original Assignee
Sandisk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sandisk Corp filed Critical Sandisk Corp
Publication of TW200632349A publication Critical patent/TW200632349A/zh
Application granted granted Critical
Publication of TWI280390B publication Critical patent/TWI280390B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/3025—Wireless interface with the DUT
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/006—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation at wafer scale level, i.e. wafer scale integration [WSI]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/06—Acceleration testing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2862—Chambers or ovens; Tanks
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/1206—Location of test circuitry on chip or wafer
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Environmental & Geological Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW094145943A 2004-12-22 2005-12-22 Contactless wafer level burn-in TWI280390B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/021,688 US20060132167A1 (en) 2004-12-22 2004-12-22 Contactless wafer level burn-in

Publications (2)

Publication Number Publication Date
TW200632349A true TW200632349A (en) 2006-09-16
TWI280390B TWI280390B (en) 2007-05-01

Family

ID=36113792

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094145943A TWI280390B (en) 2004-12-22 2005-12-22 Contactless wafer level burn-in

Country Status (7)

Country Link
US (1) US20060132167A1 (zh)
EP (1) EP1828791A2 (zh)
JP (1) JP2008526031A (zh)
KR (1) KR20070110265A (zh)
CN (1) CN101160533A (zh)
TW (1) TWI280390B (zh)
WO (1) WO2006069309A2 (zh)

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* Cited by examiner, † Cited by third party
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US7904768B2 (en) * 2005-05-04 2011-03-08 National Tsing Hua University Probing system for integrated circuit devices
US7883019B2 (en) * 2005-09-02 2011-02-08 Hynix Semiconductor Inc. Integrated circuit with embedded FeRAM-based RFID
US7808253B2 (en) * 2005-12-02 2010-10-05 Semiconductor Energy Laboratory Co., Ltd. Test method of microstructure body and micromachine
ITMI20070386A1 (it) 2007-02-28 2008-09-01 St Microelectronics Srl Soppressione di interferenza in collaudo senza fili di dispositivi a semiconduttore
US7477545B2 (en) * 2007-06-14 2009-01-13 Sandisk Corporation Systems for programmable chip enable and chip address in semiconductor memory
US7715255B2 (en) * 2007-06-14 2010-05-11 Sandisk Corporation Programmable chip enable and chip address in semiconductor memory
US9146274B2 (en) * 2007-08-24 2015-09-29 Advantest Corporation Wafer boat for semiconductor testing
US7863918B2 (en) * 2007-11-13 2011-01-04 International Business Machines Corporation Disposable built-in self-test devices, systems and methods for testing three dimensional integrated circuits
WO2010101100A1 (ja) * 2009-03-04 2010-09-10 日本電気株式会社 電子回路、および試験システム
JP5448675B2 (ja) * 2009-09-25 2014-03-19 パナソニック株式会社 プローブカード及びそれを用いた半導体ウェーハの検査方法
US8977513B2 (en) * 2009-10-14 2015-03-10 Stmicroelectronics S.R.L. Reliability test with monitoring of the results
KR101384341B1 (ko) * 2010-06-10 2014-04-14 에스티에스반도체통신 주식회사 무선 전력과 무선 주파수 신호를 이용하는 스크린 프린팅 장치
FR2973562A1 (fr) * 2011-04-01 2012-10-05 St Microelectronics Rousset Communication sans contact avec une plaquette de circuits electroniques
US8446772B2 (en) 2011-08-04 2013-05-21 Sandisk Technologies Inc. Memory die self-disable if programmable element is not trusted
WO2013097213A1 (zh) * 2011-12-31 2013-07-04 北京大学深圳研究生院 一种非接触式的wl/wlp芯片高温老化测试方法及装置
CN103345166B (zh) * 2013-05-29 2015-09-30 厦门光莆电子股份有限公司 超低频电老化控制器
JP6292104B2 (ja) * 2014-11-17 2018-03-14 三菱電機株式会社 窒化物半導体装置の製造方法
TWI566251B (zh) * 2015-06-25 2017-01-11 華邦電子股份有限公司 快閃記憶體晶圓測試方法以及機台
CN106328212B (zh) * 2015-07-01 2019-09-24 华邦电子股份有限公司 快闪存储器晶片测试方法以及中测台
CN206038837U (zh) * 2015-10-02 2017-03-22 魏晓敏 Led芯片老化测试装置
TWI612316B (zh) * 2017-05-22 2018-01-21 京元電子股份有限公司 高低溫切換測試模組
CN107831391B (zh) * 2017-11-28 2019-06-07 英特尔产品（成都）有限公司 一种用于老化测试的方法、装置和设备
US10761138B2 (en) * 2018-09-18 2020-09-01 Advantest Corporation Low cost built-in-self-test centric testing
US10976361B2 (en) 2018-12-20 2021-04-13 Advantest Corporation Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
KR102380338B1 (ko) * 2020-10-29 2022-03-29 광운대학교 산학협력단 전력증폭기 칩의 웨이퍼 레벨 테스트 방법 및 장치
KR102386473B1 (ko) * 2020-11-05 2022-04-13 광운대학교 산학협력단 Rf 빔포밍 집적회로의 웨이퍼 레벨 테스트 방법 및 장치
US12007429B2 (en) * 2021-06-25 2024-06-11 Ic Analytica, Llc Apparatus and method for managing power of test circuits
CN115951141A (zh) * 2022-12-12 2023-04-11 环旭电子股份有限公司 射频装置温度相关可靠度试验系统及其方法

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US6058497A (en) * 1992-11-20 2000-05-02 Micron Technology, Inc. Testing and burn-in of IC chips using radio frequency transmission
US5764655A (en) * 1997-07-02 1998-06-09 International Business Machines Corporation Built in self test with memory
US6119255A (en) * 1998-01-21 2000-09-12 Micron Technology, Inc. Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit
US6236223B1 (en) * 1998-11-09 2001-05-22 Intermec Ip Corp. Method and apparatus for wireless radio frequency testing of RFID integrated circuits
CA2308820A1 (en) * 2000-05-15 2001-11-15 The Governors Of The University Of Alberta Wireless radio frequency technique design and method for testing of integrated circuits and wafers
CN1246932C (zh) * 2001-02-09 2006-03-22 Jsr株式会社 各向异性导电性连接器、其制造方法以及探针构件
JP2003057308A (ja) * 2001-08-16 2003-02-26 Hitachi Ltd 電子装置及び電子装置の良否の検査方法
US6747471B1 (en) * 2002-01-10 2004-06-08 Taiwan Semiconductor Manufacturing Company Method and apparatus to estimate burn-in time by measurement of scribe-line devices, with stacking devices, and with common pads
CA2404183C (en) * 2002-09-19 2008-09-02 Scanimetrics Inc. Non-contact tester for integrated circuits
US7325180B2 (en) * 2003-11-26 2008-01-29 Carnegie Mellon University System and method to test integrated circuits on a wafer

Also Published As

Publication number Publication date
WO2006069309A3 (en) 2006-09-28
TWI280390B (en) 2007-05-01
CN101160533A (zh) 2008-04-09
JP2008526031A (ja) 2008-07-17
US20060132167A1 (en) 2006-06-22
EP1828791A2 (en) 2007-09-05
WO2006069309A2 (en) 2006-06-29
KR20070110265A (ko) 2007-11-16

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees