TW200625725A - Anisotropic conductive connector for inspecting wafer, manufacturing method thereof, waver inspection probe card, manufacturing method thereof, and wafer inspection device - Google Patents
Anisotropic conductive connector for inspecting wafer, manufacturing method thereof, waver inspection probe card, manufacturing method thereof, and wafer inspection deviceInfo
- Publication number
- TW200625725A TW200625725A TW094136933A TW94136933A TW200625725A TW 200625725 A TW200625725 A TW 200625725A TW 094136933 A TW094136933 A TW 094136933A TW 94136933 A TW94136933 A TW 94136933A TW 200625725 A TW200625725 A TW 200625725A
- Authority
- TW
- Taiwan
- Prior art keywords
- manufacturing
- wafer
- anisotropic conductive
- material layer
- conductive connector
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
- H01R4/04—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation using electrically conductive adhesives
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
There is disclosed an anisotropic conductive connector capable of surely achieving a preferable electric connection state even when electrodes to be inspected on a wafer have an extremely small pitch. There are also disclosed a manufacturing method of the anisotropic conductive connector, a probe card, a manufacturing method thereof, and a wafer inspection device. The anisotropic conductive connector manufacturing method includes: a step for arranging contact members formed by magnetic metal and arranged on the surface of conductive elastomer material layer formed on a detachable support plate; a step for applying a magnetic field to the conductive elastomer material layer in its thickness direction; a step for performing a hardening process to form a conductive elastomer layer; a step of machining the conductive elastomer layer by using laser; a step or removing portions other than the portion where the contact members are arranged, thereby forming connection conductive parts having the contact members; a step for introducing each of the connection conductive parts into the insulation part material layer formed so as to close the opening of the frame plate; and a step for hardening the insulation part material layer so as to form an insulation part.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004308963 | 2004-10-22 | ||
JP2005148067 | 2005-05-20 | ||
JP2005250764 | 2005-08-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200625725A true TW200625725A (en) | 2006-07-16 |
Family
ID=36203047
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094136933A TW200625725A (en) | 2004-10-22 | 2005-10-21 | Anisotropic conductive connector for inspecting wafer, manufacturing method thereof, waver inspection probe card, manufacturing method thereof, and wafer inspection device |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW200625725A (en) |
WO (1) | WO2006043631A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102680301B (en) * | 2012-06-07 | 2014-01-01 | 北京航空航天大学 | Device for preparing magnetosensitive elastomers in which millimeter-sized particles are uniformly distributed and arranged in chain-like mode |
KR101339166B1 (en) | 2012-06-18 | 2013-12-09 | 주식회사 아이에스시 | Test socket with conductive powder having through-hole and fabrication method thereof |
CN105762580B (en) * | 2016-04-19 | 2018-06-22 | 深圳市长盈精密技术股份有限公司 | Kato and its manufacturing method |
JP7308660B2 (en) * | 2019-05-27 | 2023-07-14 | 東京エレクトロン株式会社 | Intermediate connection member and inspection device |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5193393A (en) * | 1975-02-12 | 1976-08-16 | Erasuteitsuku kontakutoshiitonoseizohoho | |
JPS6032285B2 (en) * | 1977-05-31 | 1985-07-27 | ジェイエスアール株式会社 | Method for manufacturing pressurized conductive elastomer |
JPS61250906A (en) * | 1985-04-26 | 1986-11-08 | ジェイエスアール株式会社 | Conductive elastomer sheet |
JP2001050983A (en) * | 1999-08-09 | 2001-02-23 | Jsr Corp | Probe card |
WO2002065588A1 (en) * | 2001-02-09 | 2002-08-22 | Jsr Corporation | Anisotropic conductive connector, its manufacture method and probe member |
KR20050115297A (en) * | 2003-03-26 | 2005-12-07 | 제이에스알 가부시끼가이샤 | Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resistance for circuit board |
-
2005
- 2005-10-20 WO PCT/JP2005/019309 patent/WO2006043631A1/en active Application Filing
- 2005-10-21 TW TW094136933A patent/TW200625725A/en unknown
Also Published As
Publication number | Publication date |
---|---|
WO2006043631A1 (en) | 2006-04-27 |
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