TW200622274A - Methods and apparatus for programming and operating automated test equipment - Google Patents
Methods and apparatus for programming and operating automated test equipmentInfo
- Publication number
- TW200622274A TW200622274A TW094111826A TW94111826A TW200622274A TW 200622274 A TW200622274 A TW 200622274A TW 094111826 A TW094111826 A TW 094111826A TW 94111826 A TW94111826 A TW 94111826A TW 200622274 A TW200622274 A TW 200622274A
- Authority
- TW
- Taiwan
- Prior art keywords
- test equipment
- automated test
- scan
- programming
- methods
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/318547—Data generators or compressors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/959,857 US7321999B2 (en) | 2004-10-05 | 2004-10-05 | Methods and apparatus for programming and operating automated test equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200622274A true TW200622274A (en) | 2006-07-01 |
TWI365997B TWI365997B (en) | 2012-06-11 |
Family
ID=36088979
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094111826A TWI365997B (en) | 2004-10-05 | 2005-04-14 | Methods and apparatus for programming and operating automated test equipment |
Country Status (4)
Country | Link |
---|---|
US (1) | US7321999B2 (zh) |
JP (1) | JP2006105996A (zh) |
DE (1) | DE102005026402A1 (zh) |
TW (1) | TWI365997B (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7254760B2 (en) * | 2004-10-05 | 2007-08-07 | Verigy (Singapore) Pte. Ltd. | Methods and apparatus for providing scan patterns to an electronic device |
US7555690B1 (en) * | 2004-12-23 | 2009-06-30 | Xilinx, Inc. | Device for and method of coupling test signals to a device under test |
US20080077834A1 (en) * | 2006-09-27 | 2008-03-27 | Ajay Khoche | Deterministic Diagnostic Information Capture from Memory Devices with Built-in Self Test |
US20080077835A1 (en) * | 2006-09-27 | 2008-03-27 | Khoche A Jay | Automatic Test Equipment Receiving Diagnostic Information from Devices with Built-in Self Test |
US8234255B1 (en) * | 2008-08-20 | 2012-07-31 | Juniper Networks, Inc. | Reducing data transfer for matching patterns |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62175838A (ja) * | 1986-01-29 | 1987-08-01 | Nec Corp | シフトアウト・デ−タの収集方式 |
JPH03105633A (ja) * | 1989-09-20 | 1991-05-02 | Fujitsu Ltd | マイクロプログラム制御方式 |
US5157781A (en) * | 1990-01-02 | 1992-10-20 | Motorola, Inc. | Data processor test architecture |
US5243603A (en) * | 1991-03-26 | 1993-09-07 | Hewlett-Packard Company | Method for online modification of compressed digital test vectors |
US5323108A (en) * | 1992-01-23 | 1994-06-21 | Hewlett-Packard Company | Method for generating functional tests for printed circuit boards based on pattern matching of models |
US5270642A (en) * | 1992-05-15 | 1993-12-14 | Hewlett-Packard Company | Partitioned boundary-scan testing for the reduction of testing-induced damage |
US5475815A (en) * | 1994-04-11 | 1995-12-12 | Unisys Corporation | Built-in-self-test scheme for testing multiple memory elements |
US5983380A (en) * | 1997-09-16 | 1999-11-09 | International Business Machines Corporation | Weighted random pattern built-in self-test |
US5995731A (en) * | 1997-12-29 | 1999-11-30 | Motorola, Inc. | Multiple BIST controllers for testing multiple embedded memory arrays |
US6393594B1 (en) * | 1999-08-11 | 2002-05-21 | International Business Machines Corporation | Method and system for performing pseudo-random testing of an integrated circuit |
US6591211B1 (en) * | 1999-08-27 | 2003-07-08 | Intel Corporation | Testing unit and self-evaluating device |
US6392910B1 (en) * | 1999-09-10 | 2002-05-21 | Sibercore Technologies, Inc. | Priority encoder with multiple match function for content addressable memories and methods for implementing the same |
US6407567B1 (en) * | 2000-06-29 | 2002-06-18 | Advanced Micro Devices | IC Device burn-in method and apparatus |
CA2321346A1 (en) * | 2000-09-28 | 2002-03-28 | Stephen K. Sunter | Method, system and program product for testing and/or diagnosing circuits using embedded test controller access data |
US7159145B2 (en) * | 2003-05-12 | 2007-01-02 | Infineon Technologies Ag | Built-in self test system and method |
-
2004
- 2004-10-05 US US10/959,857 patent/US7321999B2/en active Active
-
2005
- 2005-04-14 TW TW094111826A patent/TWI365997B/zh active
- 2005-06-08 DE DE102005026402A patent/DE102005026402A1/de not_active Withdrawn
- 2005-10-05 JP JP2005291911A patent/JP2006105996A/ja not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
TWI365997B (en) | 2012-06-11 |
DE102005026402A1 (de) | 2006-04-13 |
US7321999B2 (en) | 2008-01-22 |
US20060075317A1 (en) | 2006-04-06 |
JP2006105996A (ja) | 2006-04-20 |
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