TW200622230A - System and method for inspecting a light-management film and method of making the light-management film - Google Patents

System and method for inspecting a light-management film and method of making the light-management film

Info

Publication number
TW200622230A
TW200622230A TW094133544A TW94133544A TW200622230A TW 200622230 A TW200622230 A TW 200622230A TW 094133544 A TW094133544 A TW 094133544A TW 94133544 A TW94133544 A TW 94133544A TW 200622230 A TW200622230 A TW 200622230A
Authority
TW
Taiwan
Prior art keywords
light
management film
defects
inspecting
management
Prior art date
Application number
TW094133544A
Other languages
English (en)
Inventor
Kevin Patrick Capaldo
Yu Hu
Chung-Hei Yeung
Yan Zhang
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of TW200622230A publication Critical patent/TW200622230A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G01N2021/8967—Discriminating defects on opposite sides or at different depths of sheet or rod

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW094133544A 2004-09-29 2005-09-27 System and method for inspecting a light-management film and method of making the light-management film TW200622230A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/952,651 US7339664B2 (en) 2004-09-29 2004-09-29 System and method for inspecting a light-management film and method of making the light-management film

Publications (1)

Publication Number Publication Date
TW200622230A true TW200622230A (en) 2006-07-01

Family

ID=35457725

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094133544A TW200622230A (en) 2004-09-29 2005-09-27 System and method for inspecting a light-management film and method of making the light-management film

Country Status (10)

Country Link
US (1) US7339664B2 (zh)
EP (1) EP1797415A1 (zh)
JP (1) JP2008514922A (zh)
KR (1) KR20070072547A (zh)
CN (1) CN101065657A (zh)
AU (1) AU2005292463A1 (zh)
BR (1) BRPI0515843A (zh)
CA (1) CA2581873A1 (zh)
TW (1) TW200622230A (zh)
WO (1) WO2006039143A1 (zh)

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US7371590B2 (en) * 2005-11-21 2008-05-13 General Electric Company Integrated inspection system and defect correction method
US20070116350A1 (en) * 2005-11-21 2007-05-24 Cheverton Mark A Method for detecting the alignment of films for automated defect detection
US7310136B2 (en) * 2005-11-23 2007-12-18 General Electric Company Method and apparatus for measuring prism characteristics
JP2007304065A (ja) * 2006-05-15 2007-11-22 Omron Corp 異物検出装置、異物検出方法、異物検出プログラム、および該プログラムが記録された記録媒体
WO2008085156A1 (en) * 2007-01-08 2008-07-17 General Electric Company Integrated inspection system and defect correction method
WO2008085163A1 (en) * 2007-01-09 2008-07-17 General Electric Company Method for detecting the alignment of films for automated defect detection
CN102944563B (zh) * 2012-09-28 2016-02-24 肇庆中导光电设备有限公司 具有透射及反射光源的照明装置、检测系统及其检测方法
CN103743757A (zh) * 2014-01-21 2014-04-23 清华大学 一种玻璃瓶内壁异物的检测装置及方法
KR101697071B1 (ko) * 2014-04-18 2017-01-17 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
CN104777172B (zh) * 2015-04-30 2018-10-09 重庆理工大学 一种光学镜头次品快速智能检测装置及方法
CN112666168B (zh) * 2020-12-29 2022-08-05 尚越光电科技股份有限公司 一种cigs电池片不锈钢基底卷对卷表面快速检测系统

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US2343891A (en) * 1942-02-02 1944-03-14 Dieffenbach Ferd Device for analyzing surface defects
US3782836A (en) * 1971-11-11 1974-01-01 Texas Instruments Inc Surface irregularity analyzing method
US4310242A (en) * 1980-04-01 1982-01-12 The United States Of America As Represented By The Secretary Of The Air Force Field test unit for windscreen optical evaluation
US4595289A (en) * 1984-01-25 1986-06-17 At&T Bell Laboratories Inspection system utilizing dark-field illumination
EP0228671A1 (en) * 1985-12-23 1987-07-15 General Electric Company Method for the production of a coated substrate with controlled surface characteristics
US5183597A (en) * 1989-02-10 1993-02-02 Minnesota Mining And Manufacturing Company Method of molding microstructure bearing composite plastic articles
US5175030A (en) * 1989-02-10 1992-12-29 Minnesota Mining And Manufacturing Company Microstructure-bearing composite plastic articles and method of making
US5271968A (en) * 1990-02-20 1993-12-21 General Electric Company Method for production of an acrylic coated polycarbonate article
FR2663744B1 (fr) * 1990-06-25 1993-05-28 Saint Gobain Vitrage Int Procede et dispositif de mesure de la qualite optique d'un vitrage.
JPH06317532A (ja) * 1993-04-30 1994-11-15 Kazumi Haga 検査装置
FR2720831B3 (fr) * 1994-06-02 1996-07-12 Saint Gobain Vitrage Procédé de mesure de la qualité optique d'un vitrage.
US5626800A (en) * 1995-02-03 1997-05-06 Minnesota Mining And Manufacturing Company Prevention of groove tip deformation in brightness enhancement film
US5635278A (en) * 1995-02-03 1997-06-03 Minnesota Mining And Manufacturing Company Scratch resistant optical films and method for producing same
JP3178644B2 (ja) * 1995-02-10 2001-06-25 セントラル硝子株式会社 透明板状体の欠点検出方法
JPH0933395A (ja) * 1995-07-14 1997-02-07 Dainippon Printing Co Ltd ビューファインダー用カラーフイルターの検査出荷装置
US5812260A (en) 1995-10-16 1998-09-22 Corning Incorporated Method and system for measuring optical distortion
US5726749A (en) * 1996-09-20 1998-03-10 Libbey-Owens-Ford Co. Method and apparatus for inspection and evaluation of angular deviation and distortion defects for transparent sheets
US6280063B1 (en) 1997-05-09 2001-08-28 3M Innovative Properties Company Brightness enhancement article
US5880843A (en) 1997-09-03 1999-03-09 Vitro Flotado, S.A. De C.V. Apparatus and method for determining the optical distortion of a transparent substrate
JPH11153515A (ja) * 1997-11-20 1999-06-08 Canon Inc カラーフィルタの検査装置及び検査方法
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US6011620A (en) 1998-04-06 2000-01-04 Northrop Grumman Corporation Method and apparatus for the automatic inspection of optically transmissive planar objects
US6618136B1 (en) * 1998-09-07 2003-09-09 Minolta Co., Ltd. Method and apparatus for visually inspecting transparent body and translucent body
JP3330089B2 (ja) * 1998-09-30 2002-09-30 株式会社大協精工 ゴム製品の検査方法及び装置
JP4484177B2 (ja) 1999-02-19 2010-06-16 大日本印刷株式会社 面ぎらの定量的評価方法及び防眩性フィルムの製造方法
US6208412B1 (en) 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
TW571089B (en) * 2000-04-21 2004-01-11 Nikon Corp Defect testing apparatus and defect testing method
US6903446B2 (en) * 2001-10-23 2005-06-07 Cree, Inc. Pattern for improved visual inspection of semiconductor devices
US20030108710A1 (en) 2001-12-07 2003-06-12 General Electric Company Articles bearing patterned microstructures and method of making

Also Published As

Publication number Publication date
WO2006039143A1 (en) 2006-04-13
EP1797415A1 (en) 2007-06-20
CN101065657A (zh) 2007-10-31
US20060066845A1 (en) 2006-03-30
KR20070072547A (ko) 2007-07-04
CA2581873A1 (en) 2006-04-13
BRPI0515843A (pt) 2008-08-12
US7339664B2 (en) 2008-03-04
AU2005292463A1 (en) 2006-04-13
JP2008514922A (ja) 2008-05-08

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