TW200619749A - Apparatuses and methods for testing lighting in test part of flat panel display test unit - Google Patents

Apparatuses and methods for testing lighting in test part of flat panel display test unit

Info

Publication number
TW200619749A
TW200619749A TW094133677A TW94133677A TW200619749A TW 200619749 A TW200619749 A TW 200619749A TW 094133677 A TW094133677 A TW 094133677A TW 94133677 A TW94133677 A TW 94133677A TW 200619749 A TW200619749 A TW 200619749A
Authority
TW
Taiwan
Prior art keywords
plate
lighting test
lighting
test body
opening
Prior art date
Application number
TW094133677A
Other languages
Chinese (zh)
Other versions
TWI320860B (en
Inventor
Tae-Soo Kim
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of TW200619749A publication Critical patent/TW200619749A/en
Application granted granted Critical
Publication of TWI320860B publication Critical patent/TWI320860B/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42—Measurement or testing during manufacture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/24—Testing of discharge tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J11/00—Gas-filled discharge tubes with alternating current induction of the discharge, e.g. alternating current plasma display panels [AC-PDP]; Gas-filled discharge tubes without any main electrode inside the vessel; Gas-filled discharge tubes with at least one main electrode outside the vessel
    • H01J11/20—Constructional details
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing

Abstract

The present invention provides lighting test apparatus and method of a test part of a flat panel display test unit for testing a lighting state of a flat display panel transferred from a panel supply part on a worktable. The lighting test apparatus includes a lighting test body being a square-shaped plate in which an opening is formed; a first plate installed at one side of the lighting test body; a second plate movably installed at a side of the lighting test body adjacent to the first plate; one or more sub-plates attachably/removably coupled with the first and second plates and successively coupled toward the center of the opening of the lighting test body according to a size of the flat display panel; a probe plate attachably/removably coupled with the first plate, the second plate or a subplate which is nearest from the center of the opening of the lighting test body, wherein a plurality of probes are installed at the probe plate; and position setting means for aligning an align mark on the flat display panel with a virtual reference mark to set a reference coordinate value of the worktable.
TW094133677A 2004-12-04 2005-09-28 Lighting test apparatuses and lighting test methods for testing lighting in test part of flat panel display test unit TWI320860B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020040101520A KR100576947B1 (en) 2004-12-04 2004-12-04 Apparatus for testing lighting in testing part of flat panel display testing unit and method thereby

Publications (2)

Publication Number Publication Date
TW200619749A true TW200619749A (en) 2006-06-16
TWI320860B TWI320860B (en) 2010-02-21

Family

ID=36773151

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094133677A TWI320860B (en) 2004-12-04 2005-09-28 Lighting test apparatuses and lighting test methods for testing lighting in test part of flat panel display test unit

Country Status (3)

Country Link
KR (1) KR100576947B1 (en)
CN (1) CN100492030C (en)
TW (1) TWI320860B (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101303737B1 (en) * 2006-12-05 2013-09-04 엘지디스플레이 주식회사 Auto probe inspection appratus for inspecting LCD panel
KR101742506B1 (en) * 2010-08-05 2017-06-02 주식회사 탑 엔지니어링 Array Test Device And Array Test Method
KR101035570B1 (en) 2011-04-19 2011-05-19 (주)유비프리시젼 Apparatus for changing automatic probe unit for lcd checking device
US9176004B2 (en) * 2012-03-16 2015-11-03 Apple Inc. Imaging sensor array testing equipment
CN103713205B (en) * 2012-09-28 2016-10-26 名硕电脑(苏州)有限公司 Capacitance touch screen automatic test approach
CN105527464B (en) * 2014-09-28 2018-10-30 深圳市诚信佳美科技有限公司 Method, the system of a kind of panel test independent positioning method, device and test panel
CN104715705B (en) * 2015-03-30 2017-04-19 深圳市华星光电技术有限公司 Detection device for liquid crystal display panels
CN105277750B (en) * 2015-11-30 2018-03-27 惠州市德赛自动化技术有限公司 A kind of display screen detection device
CN105589275B (en) * 2016-03-11 2018-11-23 武汉华星光电技术有限公司 Electric characteristic detecting apparatus and its electric test method for TFT-LCD display panel

Also Published As

Publication number Publication date
CN100492030C (en) 2009-05-27
TWI320860B (en) 2010-02-21
KR100576947B1 (en) 2006-05-10
CN1782725A (en) 2006-06-07

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees