TW200619647A - Device and method for inspection of circuit board - Google Patents

Device and method for inspection of circuit board

Info

Publication number
TW200619647A
TW200619647A TW094124149A TW94124149A TW200619647A TW 200619647 A TW200619647 A TW 200619647A TW 094124149 A TW094124149 A TW 094124149A TW 94124149 A TW94124149 A TW 94124149A TW 200619647 A TW200619647 A TW 200619647A
Authority
TW
Taiwan
Prior art keywords
intermediate retaining
retaining plate
inspection
circuit board
pin
Prior art date
Application number
TW094124149A
Other languages
Chinese (zh)
Inventor
Kiyoshi Kimura
Sugiro Shimoda
Satoshi Suzuki
Fujio Hara
Original Assignee
Jsr Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jsr Corp filed Critical Jsr Corp
Publication of TW200619647A publication Critical patent/TW200619647A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Abstract

The present invention provides a device and method for inspection of a circuit board capable of performing a highly reliable inspection even for the objective circuit board having electrodes with minute pitch. The inspection device is constituted as follows: a relay pin unit 31 is provided with an intermediate retaining plate 36, a first support pin 33 arranged between a first insulation plate 34 and the intermediate retaining pin 36, and a second support pin 37 arranged between a second insulation plate 35 and the intermediate retaining plate 36; a first abutting support position of the first support pin 33 to the intermediate retaining plate 36, and the second abutting support position of the second support pin 37 to the intermediate retaining plate 36 are projected in a thickness direction of the intermediate retaining plate 36 on the projection surface of the intermediate retaining plate and arranged at the different positions; and the relay board 29 is provided for relaying the electric connection of the pitch conversion board 23 and the inspection circuit board 1.
TW094124149A 2004-07-16 2005-07-15 Device and method for inspection of circuit board TW200619647A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004210606 2004-07-16
JP2004210608 2004-07-16

Publications (1)

Publication Number Publication Date
TW200619647A true TW200619647A (en) 2006-06-16

Family

ID=35785215

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094124149A TW200619647A (en) 2004-07-16 2005-07-15 Device and method for inspection of circuit board

Country Status (2)

Country Link
TW (1) TW200619647A (en)
WO (1) WO2006009104A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021188947A (en) * 2020-05-27 2021-12-13 株式会社日本マイクロニクス Optical connector protection structure and connecting device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11344521A (en) * 1998-06-01 1999-12-14 Jsr Corp Stacked connector device, and inspection device of circuit substrate

Also Published As

Publication number Publication date
WO2006009104A1 (en) 2006-01-26

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