TW200604542A - Test board for high-frequency system level test - Google Patents

Test board for high-frequency system level test

Info

Publication number
TW200604542A
TW200604542A TW094112751A TW94112751A TW200604542A TW 200604542 A TW200604542 A TW 200604542A TW 094112751 A TW094112751 A TW 094112751A TW 94112751 A TW94112751 A TW 94112751A TW 200604542 A TW200604542 A TW 200604542A
Authority
TW
Taiwan
Prior art keywords
test
board
smd
pads
interface board
Prior art date
Application number
TW094112751A
Other languages
English (en)
Other versions
TWI281035B (en
Inventor
Jung-Kuk Lee
Young-Man Ahn
Seung-Man Shin
Jong-Cheol Seo
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of TW200604542A publication Critical patent/TW200604542A/zh
Application granted granted Critical
Publication of TWI281035B publication Critical patent/TWI281035B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW094112751A 2004-05-18 2005-04-21 Test board for high-frequency system level test TWI281035B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020040035091A KR100546410B1 (ko) 2004-05-18 2004-05-18 고속 시스템 레벨 테스트에 사용되는 테스트 보드

Publications (2)

Publication Number Publication Date
TW200604542A true TW200604542A (en) 2006-02-01
TWI281035B TWI281035B (en) 2007-05-11

Family

ID=35374605

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094112751A TWI281035B (en) 2004-05-18 2005-04-21 Test board for high-frequency system level test

Country Status (4)

Country Link
US (1) US7233157B2 (zh)
KR (1) KR100546410B1 (zh)
CN (1) CN100474545C (zh)
TW (1) TWI281035B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8604820B2 (en) * 2009-02-18 2013-12-10 Teradyne, Inc. Test access component for automatic testing of circuit assemblies
KR102029035B1 (ko) * 2018-07-26 2019-10-07 주식회사 우리비전 메인 보드 리버스 인터커넥션을 통한 메모리 모듈의 실장 테스트에 사용되는 메모리 모듈을 수납하는 메인 보드
US11069420B2 (en) * 2019-07-25 2021-07-20 Micron Technology, Inc. In-system test of a memory device
CN116821045B (zh) * 2023-08-28 2023-11-14 悦芯科技股份有限公司 一种用于512dut存储器器件测试的板卡结构

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5136238A (en) * 1990-11-26 1992-08-04 Electro-Fix, Inc. Test fixture with diaphragm board with one or more internal grounded layers
DE4406538A1 (de) * 1994-02-28 1995-08-31 Mania Gmbh Leiterplatten-Prüfeinrichtung mit Prüfadapter und Verfahren zum Einstellen desselben
JP3996986B2 (ja) * 1997-12-25 2007-10-24 松下電器産業株式会社 回路基板形成方法

Also Published As

Publication number Publication date
US20050258846A1 (en) 2005-11-24
CN100474545C (zh) 2009-04-01
TWI281035B (en) 2007-05-11
CN1700437A (zh) 2005-11-23
KR100546410B1 (ko) 2006-01-26
KR20050040687A (ko) 2005-05-03
US7233157B2 (en) 2007-06-19

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