TW200603235A - Semiconductor structure processing using multiple laser beam spots - Google Patents
Semiconductor structure processing using multiple laser beam spotsInfo
- Publication number
- TW200603235A TW200603235A TW094120172A TW94120172A TW200603235A TW 200603235 A TW200603235 A TW 200603235A TW 094120172 A TW094120172 A TW 094120172A TW 94120172 A TW94120172 A TW 94120172A TW 200603235 A TW200603235 A TW 200603235A
- Authority
- TW
- Taiwan
- Prior art keywords
- links
- rows
- lengthwise direction
- multiple laser
- laser beam
- Prior art date
Links
Abstract
Methods and systems process electrically conductive links on or within a semiconductor substrate (740) using multiple laser beams. For example, a method utilizes N series of laser pulses to obtain a throughput benefit, wherein N ≥ 2. The links are arranged in a plurality of substantially parallel rows extending in a generally lengthwise direction. The N series of laser pulses propagate along N respective beam axes until incident upon selected links. The pattern of resulting laser spots may be on links in N distinct rows, on distinct links in the same row, or on the same link, either partially or completely overlapping. The resulting laser spots may be offset from one another in the lengthwise direction of the rows or offset from one another in a direction perpendicular to the lengthwise direction of the rows, or both.
Applications Claiming Priority (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US58091704P | 2004-06-18 | 2004-06-18 | |
US11/051,958 US7425471B2 (en) | 2004-06-18 | 2005-02-04 | Semiconductor structure processing using multiple laser beam spots spaced on-axis with cross-axis offset |
US11/052,014 US7629234B2 (en) | 2004-06-18 | 2005-02-04 | Semiconductor structure processing using multiple laterally spaced laser beam spots with joint velocity profiling |
US11/051,261 US7633034B2 (en) | 2004-06-18 | 2005-02-04 | Semiconductor structure processing using multiple laser beam spots overlapping lengthwise on a structure |
US11/051,500 US8148211B2 (en) | 2004-06-18 | 2005-02-04 | Semiconductor structure processing using multiple laser beam spots spaced on-axis delivered simultaneously |
US11/052,000 US7923306B2 (en) | 2004-06-18 | 2005-02-04 | Semiconductor structure processing using multiple laser beam spots |
US11/051,262 US7687740B2 (en) | 2004-06-18 | 2005-02-04 | Semiconductor structure processing using multiple laterally spaced laser beam spots delivering multiple blows |
US11/051,263 US7935941B2 (en) | 2004-06-18 | 2005-02-04 | Semiconductor structure processing using multiple laser beam spots spaced on-axis on non-adjacent structures |
US11/051,265 US7435927B2 (en) | 2004-06-18 | 2005-02-04 | Semiconductor link processing using multiple laterally spaced laser beam spots with on-axis offset |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200603235A true TW200603235A (en) | 2006-01-16 |
TWI366216B TWI366216B (en) | 2012-06-11 |
Family
ID=46675739
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094120172A TWI366216B (en) | 2004-06-18 | 2005-06-17 | Semiconductor structure processing using multiple laser beam spots |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2012138597A (en) |
TW (1) | TWI366216B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI447955B (en) * | 2011-11-23 | 2014-08-01 | Ind Tech Res Inst | Light-emitting diode element, manufacturing method of light guide structure thereof and equipment of forming the same |
US10290467B2 (en) | 2014-03-10 | 2019-05-14 | D2S, Inc. | Method and system for forming a pattern on a surface using multi-beam charged particle beam lithography |
US11264206B2 (en) | 2014-03-10 | 2022-03-01 | D2S, Inc. | Methods and systems for forming a pattern on a surface using multi-beam charged particle beam lithography |
Families Citing this family (4)
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CN111992545B (en) * | 2020-08-28 | 2023-09-08 | 格力电器(武汉)有限公司 | Cleaning device and cleaning method for lower circular seam oxide skin of water heater liner |
CN115041814A (en) * | 2021-02-26 | 2022-09-13 | 深圳市大族半导体装备科技有限公司 | Laser processing device and method for brittle material |
CN113843499A (en) * | 2021-09-10 | 2021-12-28 | 深圳市海目星激光智能装备股份有限公司 | Laser film opening method and device |
CN115939011B (en) * | 2023-03-09 | 2023-07-21 | 长鑫存储技术有限公司 | Auxiliary calibration device, semiconductor conveying system and calibration method thereof |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02137682A (en) * | 1988-11-16 | 1990-05-25 | Nec Kyushu Ltd | Laser repair device for semiconductor integrated circuit |
JP3299627B2 (en) * | 1994-04-22 | 2002-07-08 | ローム株式会社 | Method for cutting fuse structure and apparatus for cutting fuse structure |
TW279229B (en) * | 1994-12-29 | 1996-06-21 | Siemens Ag | Double density fuse bank for the laser break-link programming of an integrated-circuit |
JP3353520B2 (en) * | 1995-02-27 | 2002-12-03 | ソニー株式会社 | Semiconductor device |
JPH10328873A (en) * | 1997-06-04 | 1998-12-15 | Nikon Corp | Laser beam machining device |
JPH11245073A (en) * | 1998-03-04 | 1999-09-14 | Nikon Corp | Laser processing device |
CN1219319C (en) * | 2000-07-12 | 2005-09-14 | 电子科学工业公司 | UV laser system and method for single pulse servering of IC fuses |
JP4202077B2 (en) * | 2002-09-11 | 2008-12-24 | パナソニック株式会社 | Fuse cutting method |
-
2005
- 2005-06-17 TW TW094120172A patent/TWI366216B/en not_active IP Right Cessation
-
2012
- 2012-02-21 JP JP2012035216A patent/JP2012138597A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI447955B (en) * | 2011-11-23 | 2014-08-01 | Ind Tech Res Inst | Light-emitting diode element, manufacturing method of light guide structure thereof and equipment of forming the same |
US8823032B2 (en) | 2011-11-23 | 2014-09-02 | Industrial Technology Research Institute | Light-emitting diode element, method for manufacturing light guide structure thereof and equipment for forming the same |
US10290467B2 (en) | 2014-03-10 | 2019-05-14 | D2S, Inc. | Method and system for forming a pattern on a surface using multi-beam charged particle beam lithography |
TWI661265B (en) * | 2014-03-10 | 2019-06-01 | 美商D2S公司 | Method for forming a pattern on a surface using multi-beam charged particle beam lithography |
US11264206B2 (en) | 2014-03-10 | 2022-03-01 | D2S, Inc. | Methods and systems for forming a pattern on a surface using multi-beam charged particle beam lithography |
Also Published As
Publication number | Publication date |
---|---|
TWI366216B (en) | 2012-06-11 |
JP2012138597A (en) | 2012-07-19 |
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Legal Events
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MM4A | Annulment or lapse of patent due to non-payment of fees |