TW200603062A - Circuit architecture with a testing function for use in a display panel and method of making the same - Google Patents

Circuit architecture with a testing function for use in a display panel and method of making the same

Info

Publication number
TW200603062A
TW200603062A TW093120321A TW93120321A TW200603062A TW 200603062 A TW200603062 A TW 200603062A TW 093120321 A TW093120321 A TW 093120321A TW 93120321 A TW93120321 A TW 93120321A TW 200603062 A TW200603062 A TW 200603062A
Authority
TW
Taiwan
Prior art keywords
display panel
making
same
circuit architecture
testing function
Prior art date
Application number
TW093120321A
Other languages
Chinese (zh)
Other versions
TWI299849B (en
Inventor
Chin-Cheng Chien
Tzong-Yau Ku
Original Assignee
Chi Mei Optoelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chi Mei Optoelectronics Corp filed Critical Chi Mei Optoelectronics Corp
Priority to TW93120321A priority Critical patent/TWI299849B/en
Publication of TW200603062A publication Critical patent/TW200603062A/en
Application granted granted Critical
Publication of TWI299849B publication Critical patent/TWI299849B/en

Links

Landscapes

  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

A circuit architecture with a testing function for use in a display panel includes a plurality of parallel first conductive wires, a plurality of parallel second conductive wires perpendicular to the first conductive wires, and at least a testing circuit. The testing circuit further includes a plurality of one-way switching elements respectively connected to a first testing end of each first conductive wire.
TW93120321A 2004-07-07 2004-07-07 Circuit architecture with a testing function for use in a display panel and method of making the same TWI299849B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW93120321A TWI299849B (en) 2004-07-07 2004-07-07 Circuit architecture with a testing function for use in a display panel and method of making the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW93120321A TWI299849B (en) 2004-07-07 2004-07-07 Circuit architecture with a testing function for use in a display panel and method of making the same

Publications (2)

Publication Number Publication Date
TW200603062A true TW200603062A (en) 2006-01-16
TWI299849B TWI299849B (en) 2008-08-11

Family

ID=45069809

Family Applications (1)

Application Number Title Priority Date Filing Date
TW93120321A TWI299849B (en) 2004-07-07 2004-07-07 Circuit architecture with a testing function for use in a display panel and method of making the same

Country Status (1)

Country Link
TW (1) TWI299849B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111613158A (en) * 2019-02-26 2020-09-01 瑞鼎科技股份有限公司 Detection device and detection method for light-emitting diode display panel

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI406241B (en) * 2008-10-30 2013-08-21 Chunghwa Picture Tubes Ltd Inspection circuit and display device thereof
TWI399734B (en) * 2008-11-07 2013-06-21 Au Optronics Corp Liquid crystal display panel
TWI552126B (en) 2014-10-08 2016-10-01 友達光電股份有限公司 Defect detecting method and display panel

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111613158A (en) * 2019-02-26 2020-09-01 瑞鼎科技股份有限公司 Detection device and detection method for light-emitting diode display panel

Also Published As

Publication number Publication date
TWI299849B (en) 2008-08-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees