TW200600775A - Inspection unit - Google Patents

Inspection unit

Info

Publication number
TW200600775A
TW200600775A TW094111794A TW94111794A TW200600775A TW 200600775 A TW200600775 A TW 200600775A TW 094111794 A TW094111794 A TW 094111794A TW 94111794 A TW94111794 A TW 94111794A TW 200600775 A TW200600775 A TW 200600775A
Authority
TW
Taiwan
Prior art keywords
block
inspection
probe block
probe
screw
Prior art date
Application number
TW094111794A
Other languages
Chinese (zh)
Other versions
TWI330712B (en
Inventor
Toshio Kazama
Yoichi Ueda
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200600775A publication Critical patent/TW200600775A/en
Application granted granted Critical
Publication of TWI330712B publication Critical patent/TWI330712B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

This invention provides an inspection unit 1 having a probe block 3 to be electrically connected to an object article 7 to be inspected and an inspection block 2 for detachably mounting the inspection block 3 thereon. The inspection block 2 is provided with mounting screws 12 inserted from an opposite side of an interface of the inspection block 2 and the probe block 3 for fixing the probe block 3, and the probe block 3 is provided with female screws or embedded nuts at a part of the interface corresponding with the mounting screws 12 for the mounting screws 12 to form a screw thread engagement therewith. The probe block 3 is further provided with a fall-proof screw 10 with a removing screw 11 which is adapted for pushing out the fall-proof screw 10 by rotating the removing screw 11 in order to accurately separate the probe block 3 and the inspection block 2. With this arrangement an exchanging of the probe block and a fine adjustment can be easily and safely performed.
TW94111794A 2004-04-14 2005-04-14 Inspection unit TWI330712B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004119015A JP2005300409A (en) 2004-04-14 2004-04-14 Inspection unit

Publications (2)

Publication Number Publication Date
TW200600775A true TW200600775A (en) 2006-01-01
TWI330712B TWI330712B (en) 2010-09-21

Family

ID=35150131

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94111794A TWI330712B (en) 2004-04-14 2005-04-14 Inspection unit

Country Status (4)

Country Link
JP (1) JP2005300409A (en)
CN (1) CN100559199C (en)
TW (1) TWI330712B (en)
WO (1) WO2005101039A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6184301B2 (en) * 2013-11-14 2017-08-23 株式会社日本マイクロニクス Inspection device
KR101572588B1 (en) * 2014-07-08 2015-11-30 주식회사 코디에스 Device and method for testing display panel
JP2017096949A (en) * 2015-11-24 2017-06-01 フォトン・ダイナミクス・インコーポレーテッド System and method for electrical inspection of flat panel display device using cell contact probing pads
US10302598B2 (en) 2016-10-24 2019-05-28 General Electric Company Corrosion and crack detection for fastener nuts
CN107909951A (en) * 2017-11-14 2018-04-13 合肥鑫晟光电科技有限公司 A kind of panel tester
CN109343279A (en) * 2018-10-23 2019-02-15 惠科股份有限公司 A kind of power-up bogey and orientation ultraviolet light liquid crystal irradiation apparatus
CN112462111B (en) * 2020-11-30 2022-04-12 强一半导体（苏州）有限公司 Wedge block amplitude modulation probe card amplitude modulation structure
CN112462112B (en) * 2020-11-30 2022-04-08 强一半导体（苏州）有限公司 Probe card wedge amplitude modulation method
CN112462110B (en) * 2020-11-30 2022-04-12 强一半导体（苏州）有限公司 Wedge block amplitude modulation probe card amplitude modulation piece and butt joint structure thereof
CN112526179B (en) * 2020-11-30 2022-01-21 强一半导体（苏州）有限公司 Wedge block amplitude modulation probe card and main body thereof
TWI771085B (en) * 2021-06-29 2022-07-11 美科樂電子股份有限公司 Probe base structure
TWI829074B (en) * 2021-06-29 2024-01-11 美科樂電子股份有限公司 Probe holder structure

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0441342Y2 (en) * 1987-07-30 1992-09-29
JPH09281459A (en) * 1996-04-18 1997-10-31 Tokyo Electron Ltd Probe card for liquid crystal display body
JP2000314746A (en) * 1999-04-30 2000-11-14 Micronics Japan Co Ltd Probe device
JP4171148B2 (en) * 1999-11-12 2008-10-22 株式会社日本マイクロニクス Probe device

Also Published As

Publication number Publication date
TWI330712B (en) 2010-09-21
JP2005300409A (en) 2005-10-27
CN100559199C (en) 2009-11-11
CN1942773A (en) 2007-04-04
WO2005101039A1 (en) 2005-10-27

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees