TW200539358A - Method for preventing short-circuit caused by soldering pin of semiconductor component - Google Patents

Method for preventing short-circuit caused by soldering pin of semiconductor component Download PDF

Info

Publication number
TW200539358A
TW200539358A TW093115244A TW93115244A TW200539358A TW 200539358 A TW200539358 A TW 200539358A TW 093115244 A TW093115244 A TW 093115244A TW 93115244 A TW93115244 A TW 93115244A TW 200539358 A TW200539358 A TW 200539358A
Authority
TW
Taiwan
Prior art keywords
pin
soldering
scope
item
semiconductor element
Prior art date
Application number
TW093115244A
Other languages
Chinese (zh)
Other versions
TWI234828B (en
Inventor
Spring Liu
Ticky Tsai
Original Assignee
Inventec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inventec Corp filed Critical Inventec Corp
Priority to TW093115244A priority Critical patent/TWI234828B/en
Application granted granted Critical
Publication of TWI234828B publication Critical patent/TWI234828B/en
Publication of TW200539358A publication Critical patent/TW200539358A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation

Landscapes

  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

A kind of method for preventing short-circuit caused by soldering a pin of semiconductor component, in which the pin is soldered on a circuit board; the disclosed method can selectively forms a solder resistant area on the circuit board or on the pin so as to form a solder resist coating thereon. Therefore, when the pin is soldered, the solder is blocked by the solder resist existing in the solder resistant area, thereby preventing the short-circuit arising from the solder residue while soldering the pin.

Description

200539358 五、發明說明(1) 【發明所屬之技術領城】 本發明係關於/種銲接方法,尤指一種防止半導體元 件接腳銲接短路之方法。 【先前技術】 隨著科學技術快速發展,半導體元件之功能日益強 大,而體積卻不斷滅小,從而使得半導體元件之接腳數量 大大增加,接腳間之間距越來越小,而密度越來越大。 然而,在習知技術中,將半導體元件之接腳銲接於一 電路板上時,並未採取適當之保護措施,以防止該等接腳 之間因在銲錫過程中發生溢錫從而導致接腳之間電性導 通;進而使該半導體元件發生短路,更嚴重者會造成該電 路板之燒毁。200539358 V. Description of the invention (1) [Technical collar city to which the invention belongs] The present invention relates to a soldering method, and more particularly, to a method for preventing short-circuiting of the pins of semiconductor components. [Previous technology] With the rapid development of science and technology, the functions of semiconductor devices have become increasingly powerful, but the volume has continued to decrease. As a result, the number of pins of semiconductor devices has increased greatly, the distance between pins has become smaller and smaller, and the density has increased Bigger. However, in the conventional technology, when soldering the pins of a semiconductor component to a circuit board, appropriate protective measures have not been taken to prevent the pins from being leaked between the pins and causing the pins. Electrical conduction between the two; further short-circuiting of the semiconductor element, and even worse, burnout of the circuit board.

請參閱第1圖,一針通孔式(Pin Through Hole; PTH )封裝半導體元件1 〇 〇包括複數接腳1 〇 〇,其中所述之針通 孔式封裝半導體元件可包括雙列式封裝(Duan I n~ 1 i ne Package; DIP)元件,緊縮雙列式封裝(Shrink DIp; SDIP)元件,薄膜雙列式封裝(Sltinny DIP; SK-DIP)元 件’單列式封裝(Single In-line Package; SIP)元 件,父叉引腳封裝(Zig - Zag In - iine package; ZIP)元 件,以及針柵式陣列(Pin Grid Array; pGA)封裝元 件。該半導體元件1 〇〇係藉由其複數接腳丨2〇插接於一電路 nn:插?孔13°内’再進行銲錫而安裝於該電路 ΐ 扭_接之過程中’輝錫140極容易沿著圖 中Μ方向自⑦插接孔13吐升至該電路板 面Please refer to FIG. 1. A pin through hole (PTH) package semiconductor device 100 includes a plurality of pins 100, wherein the pin through hole package semiconductor device may include a dual-row package ( Duan I n ~ 1 i ne Package (DIP) components, Shrink DIp (SDIP) components, Thin Film DIP (SK-DIP) components' Single In-line Package SIP) components, Zig-Zag In-iine package (ZIP) components, and Pin Grid Array (pGA) package components. The semiconductor device 100 is connected to a circuit through its plural pins 丨 20: plug? Within 13 ° of the hole ’, soldering is then used to install the circuit. 辉 During the twisting process, the 'Hui Tin 140 is extremely easy to lift from the insertion hole 13 to the circuit board surface in the direction of M in the figure.

179]6英業達.Ptd 第4頁 200539358179] 6 Inventec. Ptd Page 4 200539358

生溢錫現象。相鄰接腳1 2 0溢出來之辉錫一旦互相導通, 則會造成該半導體元件1 0 0之短路。 清參閱弟2圖及弟3圖’ 一表面黏著式(Surface Mount Technology ; SMT)封裝半導體元件2 0 0包括複數接 腳2 2 0,其中所述之表面黏著式封裝半導體元件可包括小 型化封裝(Small Out-line Package; S0P)元件,四邊 扁平封裝(Quad Flat Package; QFP)元件,導腳晶片載 體封裝(Leadless Chip carrier; LCC)元件,塑膠有引 線晶片載體封裝(Plastic Leadless Chip Carrier; PLCC)元件,導腳晶片載體封裝(Leadless Chip carrier; LCC)元件,小輪廓j導腳封裝(smallThe phenomenon of tin overflow. As soon as the glow tins overflowing from the adjacent pins 120 are turned on to each other, a short circuit of the semiconductor device 100 will be caused. Please refer to Figure 2 and Figure 3 'for a surface mount technology (SMT) package semiconductor device 2 0 0 including a plurality of pins 2 2 0, wherein the surface mount package semiconductor device may include a miniaturized package (Small Out-line Package; S0P) components, Quad Flat Package (QFP) components, Leadless Chip carrier (LCC) components, Plastic Leadless Chip Carrier (PLCC) ) Components, Leadless Chip carrier (LCC) components, small outline j lead package (small

Out - Line J-Lead ; SOJ)元件,錫球陣列封裝(Ball Grid Array ; BGA)元件,卷帶自動接合封裝(Tape Automated Bonding; TAB)元件,以及晶粒大小封裝 (Chip Scale Package ; CSP)元件。該半導體元件2 0 0係 藉由複數辉錫2 4 0將該半導體元件2 0 0之複數接腳2 2 0録接 至一電路板2 1 0上。然而,由於該等複數接腳2 2 〇之間距較 小,故極容易使得相鄰接腳2 2 0之間發生溢錫,從而造成 該相鄰接腳2 2 0互相導通而短路。請參閱第4圖,圖中銲接 於一電路板3 1 0上之錫球陣列封裝半導體元件3 〇 〇之錫球 3 4 0亦極容易發生溢錫現象;即使如第5圖中所示,於該電 路板3 1 0上設置複數銲墊3 1 0亦無法有效避免溢錫現象之發 生。 因此,發明人有鑑於此而提出一種可有效防止半導體Out-Line J-Lead (SOJ) components, Ball Grid Array (BGA) components, Tape Automated Bonding (TAB) components, and Chip Scale Package (CSP) element. The semiconductor device 2 0 0 is connected to a circuit board 2 1 0 by a plurality of pins 2 2 0 of the semiconductor device 2 0 through a plurality of glow tin 2 4 0. However, since the distance between the plural pins 2 2 0 is relatively small, it is extremely easy for tin overflow to occur between adjacent pins 2 2 0, thereby causing the adjacent pins 2 2 0 to be turned on and short-circuited. Please refer to FIG. 4. In the figure, a solder ball array packaged on a circuit board 3 1 0 and a semiconductor ball 3 400 is also extremely prone to solder overflow; even as shown in FIG. 5, Setting a plurality of solder pads 3 1 0 on the circuit board 3 10 cannot effectively prevent the occurrence of tin overflow. Therefore, the inventors have proposed a method for effectively preventing semiconductors in view of this.

17916英業達.ptd 第5頁 200539358 五、發明說明(3) 元件接腳纟f接短路之方、丰 、 【發明内容】 以克服上述缺失。 本發明之目的係提供一 > 半導體元件接腳銲接短路之方貝知方法簡單之可有效防止 本發明係一種防止半導雕^二 所述之接腳係銲接於一雷败f兀件接腳銲接短路之方法, 樣為包括:設置一接觸£ j上,該方法之其中一較佳態 Γ iL:匕:輝接區係位於該接觸區外圍,以提 ;一;枓?所述之接腳銲接於該接觸^以及』置一阻Ϊ 於其上。#中,該:縮t ”外圍’以提供-阻銲劑覆蓋 ^ ^ 人蜀區、鋅接區、以及阻銲區分別為圓 形、矩形之成何圖形或其他不同之幾何圖形。該銲料係 錫,该阻銲劑係白漆或綠漆。該阻銲劑係藉由選自噴塗, 塗覆,印刷中任意一種方式覆蓋於該銲錫區上。該半導體 元件係針通孔式(Pin Through Hole; PTH)封裝半導體 元件’可為雙列式封裝(Duan In-line Package; DIP) 元件,緊縮雙列式封裝(Shrink DIP; SDIP)元件,薄膜 雙列式封裝(Skinny DIP; SK-DIP)元件,單列式封裝 (Single In-line Package; SIP)元件,交叉引腳封裝 (Zig-Zag In-line Package; ZIP)元件,以及針栅式陣 列(P i n G r i d A r r ay ; PG A)封裝元件中之任意一者。該 半導體元件亦可以係表面黏著式(Surface Mount Technology; SMT)封裝半導體元件,可為小型化封裝 (Small Out-line Package; S0P)元件’四邊扁平封裝17916 Yingyeda.ptd Page 5 200539358 V. Description of the invention (3) The component pin 纟 f is connected to a short circuit. [Abstract] In order to overcome the above defects. The purpose of the present invention is to provide a method for semiconductor device pin soldering short circuit, which is simple and can effectively prevent the present invention from preventing semiconducting engraving. The two pins described above are soldered to a thunderbolt f element. A method for short-to-foot soldering includes the following: setting a contact £ j, one of the preferred states of the method Γ iL: dagger: the splice area is located at the periphery of the contact area to improve; a; 枓? The pin is soldered to the contact and a resistance is placed on it. # 中 , 此: Shrink the "peripheral" to provide-solder resist coverage ^ ^ The human area, zinc area, and solder resist area are circular, rectangular, or other different geometric shapes. The solder system Tin, the solder resist is white paint or green paint. The solder resist is covered on the solder area by any method selected from spray coating, coating, and printing. The semiconductor element is a pin through hole type (Pin Through Hole; PTH) packaged semiconductor components can be Duan In-line Package (DIP) components, Shrink DIP (SDIP) components, Skinny DIP (SK-DIP) components , Single In-line Package (SIP) components, Zig-Zag In-line Package (ZIP) components, and Pin-in-Grid Array (P in G rid A rr ay; PG A) packages Any one of the components. The semiconductor device can also be a surface mount technology (SMT) packaged semiconductor device, which can be a Small Out-line Package (S0P) device.

17916英業達.ptd 第6頁 20053935817916 Inventec.ptd Page 6 200539358

五、發明說明(4) (Quad Flat Package; QFP)元件,導腳晶片載體封裝 (Leadless Chip carrier; LCC)元件,塑膠有引線晶片 載體封裝(Plastic Leadless Chip Carrier; PLCC)元 件,導腳晶片載體封裝(Lead less Chip carrier; LCC) 元件,小輪廓J導腳封裝(Small Out-Line J-Lead; SOJ )元件 卷帶自 件,以 件中之 當 導體元 接腳銲 態樣達 上,該 體元件 覆蓋於 之插接 面上方 之每一 局部之 插接孔 齊;或 本 方法簡 封裝(Ball Grid Array; BGA)元件, (Tape Automated Bonding; TAB)元 及晶粒大小封裝(Chip Scale Package; CSP)元 任意一者。 ,錫球陣列 動接合封裝 本發明防止 件係針通孔 接短路之功 成,該方法 電路板上設 至少局部之 其上;以及 孔内,使得 。其中,該 接腳上;或 接腳上。將 内,使得該 使得該阻銲 發明防止半 單、實施成 半導體 式封裝 效可以 包括: 有與該 接腳上 將該半 至少有 阻銲劑 以間隔 該半導 阻銲區 區之下 導體元 本低廉 元件接 半導體 透過以 所述之 等接腳 設置一 導體元 部分阻 係設置 之方式 體元件 之下邊 邊緣稍 件接腳 、以及 腳銲接 元件時 下本發 接腳係 對應之 阻銲區 件之接 焊區位 於該半 設置於 之接腳 緣與該 低於電 銲接短 適合大 短路之方法中該半 ,防止半導體元件 明之另一較佳實施 銲接於一電路板 插接孔; ,以提供 腳插接於 元於該電 導體元件 該半導體 插接於該 電路板之 路板之表 路之方法 規模生產 於該半導 一阻銲劑 該電路板 路板之表 至少局部 元件至少 電路板之 表面平 面。 具有實施 之優點。V. Description of the invention (4) (Quad Flat Package; QFP) components, Leadless Chip carrier (LCC) components, Plastic Leadless Chip Carrier (PLCC) components, Leading Chip Carrier Package (Lead less Chip carrier; LCC) components, small outline J-lead package (Small Out-Line J-Lead; SOJ) component reels self-contained, with the conductor element pins soldered in the pieces up to the state, the Body parts cover all the plug holes above the plug-in surface; or Ball Grid Array (BGA) components, Tape Automated Bonding (TAB), and Chip Scale Package CSP) element. The solder ball array is dynamically bonded and packaged. The present invention prevents the pin through hole from being short-circuited. In this method, at least a part of the circuit board is provided thereon; and inside the hole, such that. Among them, on the pin; or on the pin. In this way, making the solder resist invention prevent semi-single and implement semiconductor packaging effect may include: having at least the solder resist on the pin to space the conductor element below the semi-conductive solder resist area is cheap The component connection semiconductor is provided with a conductor element and a partial resistance system in the same way as described above. The lower edge of the body component has a pin, and the pin is connected to the corresponding solder mask area when the component is soldered. The soldering area is located in the half of the pin edge provided in the half of the method suitable for a large short circuit below the electrical welding short to prevent another preferred implementation of the semiconductor component from being soldered to a circuit board plug hole; to provide a pin plug The method of connecting to the electrical conductor element, the semiconductor plug to the circuit board, and the surface of the circuit board is to produce a semiconductor mask on the surface of the circuit board at least in part and at least the surface of the circuit board. Has the advantage of implementation.

17916英業達.ptd 第7頁 200539358 五、發明說明(5) ~ --—------ 【實施方式】 以下係藉由特定的具體實例說明本發明之每 熟悉此技藝之人士可由本說明書所揭示之内容二^ =式, 本發明之其他優點與功效。本發明亦可藉由直^ 瞭解 體實例加以施行或應用,本說明書中的各項細 =t具 不同觀點與應用,在不悖離本發明之精神下進^:基於 與變更。 τ谷種修飾 特別地,為簡單且清楚地顯示本發明半導 構之特徵所在,本案所附圖式僅顯示其中重要元衣件: 圖;於實際應用中,該等元件之形狀及連接方式勢^ = 複雜,相關元件之數量亦可隨不同型號之封裝件而有所217916 Yingyeda.ptd Page 7 200539358 V. Description of the invention (5) ~ ----------- [Embodiment] The following is a description of specific examples of the present invention. What is disclosed in this specification is ^ =, which is another advantage and effect of the present invention. The present invention can also be implemented or applied through direct understanding of specific examples. The details in this specification have different perspectives and applications, without departing from the spirit of the present invention: based on and changed. In particular, in order to show the characteristics of the semiconducting structure of the present invention simply and clearly, the drawings in this case only show the important components: drawings; in actual applications, the shape and connection of these elements Potential ^ = complex, the number of related components can also vary with different types of packages 2

請參閱第6圖,本發明防止半導體元件接腳銲接短路 之方法之第一實施例包括於一電路板丨〇上欲銲接半導體) 件接腳(圖未示)之位置自内而外設置一接觸區丨2,二j 接區14’以及一阻銲區16。上述之半導體元件可為針通夺 式(Pin Through Hole; PTH)封裝半導體元件,包括i雙 列式封裝(Duan In-line Package; DIP)元件,緊縮 ^ 列式封裝(Shrink DIP; SDIP)元件,薄膜雙列式封& (Skinny DIP; SK-DIP)元件,單列式封裝(Single"Please refer to FIG. 6. The first embodiment of the method for preventing soldering shorting of the pins of the semiconductor element according to the present invention includes a semiconductor board to be soldered on a circuit board. The contact area 2, the two j contact area 14 ′, and a solder resist area 16. The above semiconductor components can be pin through hole (PTH) packaged semiconductor components, including i Dual In-line Package (DIP) components, and Shrink DIP (SDIP) components. , Thin film in-line package & (Skinny DIP; SK-DIP) components, single-line package (Single "

In-line Package; SIP)元件,交叉引腳封襄(Zig一Zag In-line Package; ZIP)元件,以及針柵式陣列(pin Grid Array; PGA)封裝元件;亦可為表面黏著式 (Surface Mount Technology; SMT)封裝半導體元件In-line Package (SIP) components, Zig-Zag In-line Package (ZIP) components, and pin Grid Array (PGA) package components; also surface-mountable (Surface Mount Technology; SMT)

17916英業達.ptd 第8頁 200539358 五、發明說明(6) 包括小型化封裝(Small Out-line Package; SOP)元 件,四邊扁平封裝(Quad Flat Package; QFP)元件,導 腳晶片載體封裝(Leadless Chip carrier; LCC)元件, 塑膠有引線晶片載體封裝(Plastic Leadless Chip Carr ier ; PLCC)元件,導腳晶片載體封裝(Leadless17916 Yingyeda.ptd Page 8 200539358 V. Description of the Invention (6) Includes Small Out-line Package (SOP) components, Quad Flat Package (QFP) components, and lead chip carrier package ( Leadless Chip carrier (LCC) components, Plastic Leadless Chip Carrier (PLCC) components, Leadless Chip carrier packaging (Leadless

Chip carrier; LCC)元件,小輪廓j導腳封裝(Small Out-Line J-Lead; SOJ)元件,錫球陣列封裝(Ball Grid Array; BGA)元件,卷帶自動接合封裝(Tape Automated Bonding; TAB)元件,以及晶粒大小封裝 (Chip Scale Package; CSP)元件。該接觸區12係用以 接合所述之半導體元件接腳,即係該半導體元件接腳與該 電路板1 0直接接觸之區域。在第6圖中,該接觸區丨2係一Chip carrier (LCC) components, Small Outline-Line J-Lead (SOJ) components, Ball Grid Array (BGA) components, Tape Automated Bonding; TAB ) Components, and Chip Scale Package (CSP) components. The contact area 12 is used for bonding the semiconductor element pins, that is, an area where the semiconductor element pins are in direct contact with the circuit board 10. In Figure 6, the contact area 2 is a

諸如圓形之幾何圖案的區域。 區1 2外部,以供一銲料(一般 穩固鲜接於該電路板1 〇上。在 諸如圓形之幾何圖案的區域。 區14外部,以喷塗、塗覆、或 漆或綠漆)於其上,從而防止 腳於該電路板上時,該等接腳 相互連接導通導致該等接腳短 元件甚至該電路板10。在第 圓形之幾何圖案的區域。 該銲接區1 4係設置於該接觸 為錫)將該半導體元件接腳 第6圖中,該銲接區1 4係一 該阻銲區1 6係設置於該銲接 印刷一層阻銲劑(一般為白 於銲接上述之半導體元件接 之間之銲料發生溢料,進而 路’更嚴重者燒毁該半導體 3中,該阻銲區1 6係一諸如An area such as a circular geometric pattern. Zone 12 is external to a solder (generally firmly attached to the circuit board 10. In areas such as a circular geometric pattern. Zone 14 is externally sprayed, coated, or painted or green-lacquered) on Thereby, when the pins are on the circuit board, the pins are connected and connected to each other, which causes the pin short components and even the circuit board 10. In the area of the circular geometric pattern. The soldering area 14 is arranged on the contact as tin) The semiconductor component pin is shown in FIG. 6, the soldering area 14 is a solder resisting area 16 is disposed on the soldering and printing a layer of solder resist (generally white) The solder between the above-mentioned semiconductor components is flashed, and the semiconductor 3 is more severely burned. The solder resist 16 is a component such as

3以理解 ,可肢7L 1千係針 元件時,所述之接觸區1 2可為一插接孔3 To understand that when contacting a 7L 1-series needle element, the contact area 12 may be a plug hole.

17916英業達.Ptd17916 Inventec. Ptd

200539358 五、發明說明(7) 請參閱第7圖,作為本發明 短路之方法之第二實施例,於—止半導體元件接腳銲接 體元件接腳(圖未示)之位 二路板10 ’上欲銲接半導 12’,一銲接區14,,以及一阻銲而外設置一」妾觸區 第一實施例不同之處在於:該‘二f 6 °與本實施例與該 以及一阻銲區16’係設置為諸如 區丨2’,一銲接區14,, 何圖案的區域。 > (包括正方形)之幾 同樣可以理解地,當該丰邋 導體元件時,戶斤述之接觸區i ^ #係針通孔式封裝半 ^ ^ ^為一插接槽。 # 忒弟一、弟二實施例之接觸區ι 2、 1 4 ’,以及阻銲區1 6、i 6,祐 鋅接區1 4、 何圖案的區域;亦可依據該半‘體=::形,矩形等幾 除了圓形或矩形外之幾何圖案 P $ =狀设置成 接觸區12、12,,鲜接區“、Μ,,以= 所述=Η形、矩形之幾何圖案或其他不同形狀之圖、、 之二合。以上所述之形⑻(幾何圖案)或其 : 該寻接觸區12、12,,銲接區14、14,,以及阻銲/區f滿足 1 6係自内而外設置之條件,即可達成本案防止°導 件接腳銲接短路之功效。 干等肢兀 半導8圖㈣其广示當半導體元件係針通孔式封裝 丰V體凡件打,依據本發明防止半導體元 之:法之概念所作之第三實施例。一針通孔式封:以 兀件20包括複數接腳22,於每一接腳22之適 ^执 阻輝區24’以噴塗、塗覆、或印刷一層阻輝劑(=白200539358 V. Description of the invention (7) Please refer to FIG. 7. As a second embodiment of the short-circuiting method of the present invention, a two-way board 10 ′ is used to stop the semiconductor element pins and to solder the body element pins (not shown). The above-mentioned welding semiconductor 12 ', a welding area 14, and a solder resist are provided outside the "contact area". The first embodiment differs from the following: the two "f 6 °" and this embodiment are different from this and a resistance The pad 16 'is provided as a region such as a pad 2', a pad 14, and a pattern. > Several (including square) It can also be understood that when the bumper conductor element, the contact area i ^ # is a pin through-hole package half ^ ^ ^ is a plug slot. # The contact area ι 2, 1 4 ′, and the solder resist area 16, i 6, the zinc bonding area 1 4, and the pattern area of the embodiment of the second and third embodiments; also based on the half body: : Shapes, rectangles, and other geometric patterns other than circles or rectangles P $ = Shapes are set to contact areas 12, 12, and fresh areas ", M," = said = Η, rectangular geometric patterns or other Figures of different shapes,, and the combination of the two. The above-mentioned shape (geometric pattern) or: The contact-seeking areas 12, 12, welding areas 14, 14, and solder resist / area f satisfy 16 The conditions set inside and outside can achieve the effect of preventing the shorting of the soldering of the lead pins of the lead. Figure 8 shows the semi-conductor, which is widely shown when the semiconductor component is a pin through-hole package. A third embodiment made according to the present invention to prevent the semiconductor element: the concept of the law. A pin through-hole seal: The element 20 includes a plurality of pins 22, and the glow region 24 'is held at each pin 22. To spray, coat, or print a layer of light-blocking agent (= white

179]6英業達.坑(3 第10頁 200539358 五、發明說明(8) 漆或綠漆)於其上。嗜夹笼,a 一雷路軛30之扦杻口月,閱弟9圖备插接該等接腳22於 包路板之插接孔32時,使得該等阻銲區24之 該電路板之表面對齊,式如筮】^円所- 、’、彖人 24之下、真竣雜柄认 戍如弟1 0圖所不,使得該等阻銲區 24之下达、、、彖稍低於該電路板3〇之表面。如此即可 該半導體元件接腳銲接短路,即使於銲接過程中,^ / (一般為錫)沿該電路板30之插接孔32上升至嗜ϋ、40 之表面發生溢錫現象,該等接腳22亦因為受= ,30 之阻銲劑之=護而不至於電性導通而使得該等接/腳24 路’進而燒毀該半導體元件2 〇或該電路板3 〇。 丑 請參閱第11圖,於本發明防止半導體元 路之方法之第四實施例中,該等阻銲區24亦可=卩t接短 式設置於該等接腳2 2上之適當位置,同樣可以二PffiJ之方 等接腳22不至於電性導通而短路,進而燒毁該f保護該 2 0或該電路板3 0之功效。 Λ千¥體元件 可以理解地,當半導體元件係針通孔式封 件時,本發明防止半導體元件接腳銲接短路之= V體元 三、第四實施例亦可分別應用於該第一、第法之第 以達成更佳之效果。 —貫施例中, 上述實施例僅例示性說明本發明之原理及复 非用於限制本發明。任何熟習此項技蓺之人士 ^功效,而 背本發明之精神及範嘴下,對上述實; 不違 Ϊ。因此,本發明之權利保護範圍,應如後述: 範圍所列。 申明專利179] 6 Yingye Da. Pit (3 Page 10 200539358 V. Description of Invention (8) Lacquer or green paint) on it. Cage addiction, a yoke of the thunderbolt yoke 30, when you read the figure 9 to plug these pins 22 into the plug holes 32 of the circuit board, so that the circuit board of the solder mask area 24 The surface alignment is like 筮】 ^ 円 所-, ', below the person 24, the real end is identified as shown in the figure 10, which makes these solder resist areas 24 ,,, and 彖 slightly lower. On the surface of the circuit board 30. In this way, the semiconductor component pin can be short-circuited. Even during the soldering process, ^ / (generally tin) rises along the insertion hole 32 of the circuit board 30 to the surface of the addiction, and a tin overflow occurs on the surface. Pin 22 is also protected by the solder resist of 30, 30, and does not lead to electrical continuity, so that these pins / pins are 24 way, and then the semiconductor element 20 or the circuit board 3 is burned. Please refer to FIG. 11. In the fourth embodiment of the method for preventing a semiconductor element according to the present invention, the solder resist regions 24 can also be set in a proper position on the pins 22. Similarly, the two pins of PffiJ and other pins 22 may not be electrically turned on and short-circuited, and then the function of f to protect the 20 or the circuit board 30 is burned. It can be understood that when the semiconductor element is a pin-through-hole type seal, the present invention prevents the soldering of the semiconductor element pin from being short-circuited. = V body element 3. The fourth embodiment can also be applied to the first, Act No. 1 to achieve better results. -In the embodiments, the above-mentioned embodiments only exemplify the principle of the present invention and are not intended to limit the present invention. Anyone who is familiar with this technique ^ effects, but does not violate the spirit and scope of the present invention. Therefore, the scope of protection of the rights of the present invention should be as follows: The scope is listed. Claim patent

179]6英業達.ptd179] 6 Inventec.ptd

200539358 圖式簡單說明 【圖式fs〗单說明】 第1至第5圖係習知半導體元件接腳銲接示意圖; 第6圖係本發明防止半導體元件接腳銲接短路之方法 之第一實施例之示意圖; 第7圖係本發明防止半導體元件接腳銲接短路之方法 之弟二貫施例之不意圖, 第8至第1 0圖係本發明防止半導體元件接腳銲接短路 之方法之第三實施例之示意圖;以及 第1 1圖係本發明防止半導體元件接腳銲接短路之方法 之第四實施例之示意圖。 (元件符號說明) 10' 10,、 30^ 110、 210、 310電 路 板 12^ W 接 觸 區 14、 14’ 銲 接 區 16、 16,、 24 阻 鲜 20、 100> 2 0 0 > 300 半 導 體元件 11、 120 ^ 220 接 腳 32> 130 插 接 孔 40 銲 料 140 、240 銲 錫 312 銲 墊 340 鮮 球200539358 Brief description of the drawings [Schematic fs] single description] Figures 1 to 5 are conventional schematic diagrams of soldering of semiconductor component pins; Figure 6 is a first embodiment of the method for preventing shorting of semiconductor component pin soldering according to the present invention. Schematic diagram; FIG. 7 is an unintended example of the second embodiment of the method for preventing short-circuiting of semiconductor component pin soldering according to the present invention, and FIGS. 8 to 10 are the third implementation of the method for preventing short-circuiting of semiconductor component pin soldering according to the present invention; The schematic diagram of the example; and FIG. 11 are schematic diagrams of the fourth embodiment of the method for preventing the short circuit of the soldering of the pin of the semiconductor element according to the present invention. (Description of component symbols) 10 '10, 30 ^ 110, 210, 310 Circuit board 12 ^ W Contact area 14, 14' Solder area 16, 16, 24 Block resistance 20, 100 > 2 0 0 > 300 Semiconductor component 11, 120 ^ 220 pin 32 > 130 plug hole 40 solder 140, 240 solder 312 solder pad 340 fresh ball

17916英業達.ptd 第12頁17916 Inventec.ptd Page 12

Claims (1)

200539358 六、申請專利範圍 1 · 一種防止半導體元件接腳銲接短路 銲接於一電路板上,該方法包括·<万法,該接腳係 設置一接觸區,該接腳 設置一位於該接觸區外圍二接觸區; 料於該銲接區而將該接腳銲 I區,以提供一銲 設置-位於該鲜接區外圍之“,區;以及 銲劑覆蓋於其上。 鮮£,以提供一阻 2·如申請專利範圍第丨項所述之防 短路之方法,其中,該接觸區、+導體凡件接腳銲接 分別為幾何圖形。 于獲區、以及阻銲區 3. 如申請專利範圍帛2項所述之防 短路之方法,其中,該幾何圖形導體凡件接腳銲接 4. 如申請專利範圍第2項所述之防止 )° 一 短路之方法,其中,該幾何圖 V體凡件接腳銲接 5. 如申請專利範圍第i項所述之防:‘半巨導形體。 0 短路之方法,其中,該接觸區、產/ 接腳銲接 分別為不同之幾何圖形。 ^ 區、以及阻銲區 6. 如申請專利範圍第丨項所述之防止 — 短路之方法,其中,該銲料传 等肢凡件接腳銲接 7. 如申請專利範圍第㈣所述之W半 短路之方法,其中,該阻鲜劑係導體几件接腳銲接 塗、塗覆、及印刷之方式所組成‘,自包括由噴 覆蓋於該銲錫區上。 群組之其中一者而 8. 如申請專利範圍第丨項所述之防止半 肢7C件接腳銲接200539358 6. Scope of patent application1. A method for preventing soldering of semiconductor component pins to a circuit board by short-circuit welding. The method includes: < wanfa, the pin is provided with a contact area, and the pin is provided in the contact area. Peripheral two contact area; the pin is welded in the soldering area to provide a soldering arrangement-the "," located on the periphery of the fresh soldering area; and the solder is covered thereon. Fresh to provide a resistance 2. The method for preventing short circuit as described in item 丨 of the scope of patent application, wherein the contact area and the pins of the + conductor are welded with geometric figures respectively. In the acquisition area and solder resist area 3. If the scope of patent application is 帛The method for preventing short circuit as described in item 2, wherein the pins of the geometrical figure conductor are welded. 4. The prevention as described in item 2 of the scope of patent application) ° A method for short circuit, where the geometric figure is the body of V Pin Welding 5. Prevention as described in item i of the scope of patent application: 'Semi-conducting body. 0 Short circuit method, where the contact area, production / pin welding are different geometries. ^ Area, and Solder mask 6 The method of preventing short-circuits as described in item 丨 of the scope of patent application, wherein the solder is used to weld the pins of all limbs. 7. The method of semi-short-circuit W as described in the scope of patent application, where the resistance is The freshener is composed of several pins of the conductor by soldering, coating, and printing. It is self-contained and covered by spraying on the soldering area. One of the group 8. As the scope of the patent application Prevents welding of 7C pins on half limbs 17916英業達.ptd 20053935817916 Inventec.ptd 200539358 六、申請專利範圍 短路之方 9.如申請專 短路之方 1 0 .如申請專 短路之方 Through 1 1.如申請專 接短路之 選自包括 )元件, 件,薄膜 單列式封 交叉引腳 件,以及 件所組成 法 琢阻銲劑係白漆。 利範圍第1項所# + R 述之防止半導體元件接腳銲接 八τ δ亥阻銲劑係綠漆。 利範圍第1項m、+、> 豆 ' 迷之防止半導體元件接腳銲接 ',、中该半導體元件係針通孔式(pin PTH)封裝半導體元件。 利範圍第10項所述之防止半導體元件接腳銲 方法’其中,該針通孔式封裝半導體元件係 由雙列式封裝(Duan In—line Package; Dlp 緊縮雙列式封裝(Shrink DIP; SD IP)元 雙列式封裝(Skinny DIP; SK-DIP)元件, 裝(Single in—line Package; SIp)元件, 封衣(Zig-Zag In-line Package; ZIP)元 針柵式陣列(Pin Grid Array; PGA)封裝元 之群組之其中一者。 1 2 ·如申請專利範圍第1項所述之防止半導體元件接腳銲接 短路之方法,其中,該半導體元件係表面黏著式 (Surface Mount Technology; SMT)封裝半導體元 件。 1 3 .如申請專利範圍第丨2項所述之防止半導體元件接腳銲 接短路之方法’其中,表面黏著式封裝半導體元件係 遥自包括由小型化封裝(Small Out-line Package; SOP)元件’四邊扁平封裝(Quacj Flat Package; QFP) 元件,導腳晶片载體封裝(Lead less Chip carrier;6. The party applying for a patent short circuit 9. The party applying for a short circuit 10. The party applying for a short circuit Through 1 1. The party applying for a short circuit is selected from the group consisting of) components, pieces, and thin film in-line sealed cross pins Pieces, and the method of forming the solder resist is white paint. The scope of the first item # + R described above is to prevent the soldering of the pins of the semiconductor components. 8 τ δ solder resist is a green paint. The scope of the first item is m, +, > Beans to prevent the soldering of semiconductor device pins, and the semiconductor device is a pin through hole (pin PTH) packaged semiconductor device. The method for preventing pin soldering of semiconductor elements according to the tenth item of the scope of interest, wherein the pin-through-hole package semiconductor element is a dual inline package (Duan In-line Package; Dlp Shrink DIP; SD IP) Skinny DIP (SK-DIP) element, Single in-line Package (SIp) element, Zig-Zag In-line Package (ZIP) element pin grid array Array; PGA) One of the group of package elements. 1 2 · The method for preventing soldering short circuit of a semiconductor element pin as described in item 1 of the scope of patent application, wherein the semiconductor element is a surface mount type (Surface Mount Technology) SMT) package semiconductor components. 1 3. The method for preventing soldering short circuit of the semiconductor component pins as described in item No. 2 of the patent application scope, wherein the surface-adhesive packaged semiconductor components are included in the miniaturized package (Small Out -line Package; SOP) components' Quacj Flat Package (QFP) components, Lead less Chip carrier; 200539358 六、申請專利範圍 LCC)元件,塑膠有引線晶片載體封裝(Plastic Leadless Chip Carrier; PLCC)元件,導腳晶片载體 封裝(Leadless Chip carrier; LCC)元件,小輪靡 導腳封裝(Small Out-Line J-Lead; S0J)元件,锡 球陣列封裝(Ball Grid Array; BGA)元件,卷帶自 動接合封裝(Tape Automated Bonding; TAB)元件, 以及晶粒大小封裝(Chip Scale Package; CSP)元件 所組成之群組之其中一者。 1 4 .如申請專利範圍第1項所述之防止半導體元件接腳銲接 短路之方法,其中,該接觸區係插接孔。 1 5 .如申請專利範圍第1項所述之防止半導體元件接腳銲接 短路之方法,復包括於該半導體元件至少局部之接腳 上設置第二阻銲區之步驊,以提供一阻銲劑覆蓋於其 上。 ' 1 6 ·如申請專利範圍第丨5項所述之防止半導體元件接腳銲 接短路之方法,其中,該卩且銲劑係設置於該半導體元 件至少局部之每一接腳上。 1 7 ·如申請專利範圍第丨5項所述之防止半導體元件接腳銲 接短路之方法,其中,該陴銲劑係以間隔之方式設置 於該半導體元件至少局部之接腳上。 1 8 ·如申請專利範圍第丨5項所述之防止半導體元件接腳銲 接短路之方法,其中,'係將該半導體元件之接腳插接 至該電路板内,使得該第二阻銲區之下邊緣與該電路 板之表面平齊。200539358 VI. Application scope of patent (LCC) components, Plastic Leadless Chip Carrier (PLCC) components, Leadless Chip carrier (LCC) components, Small Outer Guide Foot Package (Small Out -Line J-Lead (S0J) components, Ball Grid Array (BGA) components, Tape Automated Bonding (TAB) components, and Chip Scale Package (CSP) components One of the formed groups. 14. The method for preventing short circuit of the soldering of the pin of a semiconductor element as described in item 1 of the scope of the patent application, wherein the contact area is a plug hole. 15. The method for preventing short circuit of the soldering of the pin of a semiconductor element as described in item 1 of the scope of the patent application, further comprising the step of providing a second solder resist area on at least a part of the pins of the semiconductor element to provide a solder resist. Cover it. '1 6 · The method for preventing short circuit of the soldering of the pin of a semiconductor element as described in item 5 of the scope of the patent application, wherein the solder is disposed on at least a part of each pin of the semiconductor element. 17 · The method for preventing short circuit of the soldering of the pin of a semiconductor element as described in item 5 of the scope of the patent application, wherein the soldering flux is disposed on at least part of the pins of the semiconductor element in a spaced manner. 1 8 · The method for preventing short circuit of the soldering of the pin of the semiconductor element as described in item 5 of the scope of the patent application, wherein, 'the pin of the semiconductor element is inserted into the circuit board, so that the second solder resist area The lower edge is flush with the surface of the circuit board. 200539358 六、申請專利範圍 1 9 .如申請專利範圍第1 5項所述之防止半導體元件接腳銲 接短路之方法,其中,係將該半導體元件之接腳插接 至該電路板内,使得該第二阻銲區之下邊緣稍低於該 電路板之表面。 2 0 .如申請專利範圍第1 6或第1 7項所述之防止半導體元件 接腳銲接短路之方法,其中,該阻銲劑係藉由選自喷 塗、塗覆、及印刷之方式所組成之群組之其中一者而 覆蓋於該第二銲錫區上。 2 1.如申請專利範圍第2 0項所述之防止半導體元件接腳銲 接短路之方法,其中,該阻銲劑係白漆。 2 2 .如申請專利範圍第2 0項所述之防止半導體元件接腳銲 接短路之方法,其中,該阻銲劑係綠漆。 2 3. —種防止半導體元件接腳銲接短路之方法,該接腳係 銲接於一電路板上,該電路板上設有與該等接腳對應 之插接孔,該方法包括: 於該半導體元件至少局部之接腳上設置一阻銲 區,以提供一阻銲劑覆蓋於其上;以及 將該半導體元件之接腳插接於該電路板之插接孔 内,使得至少有部分阻銲區位元於該電路板之表面上 方。 2 4 .如申請專利範圍第2 3項所述之防止半導體元件接腳銲 接短路之方法,其中,該半導體元件係針通孔式(P i η Through Hole; ΡΤΗ)封裝半導體元件。 2 5 .如申請專利範圍第2 4項所述之防止半導體元件接腳銲200539358 VI. Application scope of patent 19. The method for preventing soldering short circuit of the pin of a semiconductor element as described in item 15 of the scope of patent application, wherein the pin of the semiconductor element is inserted into the circuit board, so that The lower edge of the second solder mask area is slightly lower than the surface of the circuit board. 20. The method for preventing short circuit of the soldering of the pin of a semiconductor element according to item 16 or item 17 of the scope of patent application, wherein the solder resist is composed of a method selected from spray coating, coating, and printing. One of the groups covers the second solder region. 2 1. The method for preventing the short circuit of the soldering of the pin of a semiconductor element as described in item 20 of the scope of patent application, wherein the solder resist is white paint. 2 2. The method for preventing a short circuit in the soldering of a pin of a semiconductor element as described in item 20 of the scope of patent application, wherein the solder resist is a green paint. 2 3. A method for preventing soldering short circuit of the pins of semiconductor components, the pins are soldered on a circuit board, and the circuit board is provided with plug holes corresponding to the pins, and the method includes: A solder mask is provided on at least part of the pins of the component to provide a solder resist to cover it; and the pins of the semiconductor component are inserted into the plug holes of the circuit board so that at least part of the solder mask is located The element is above the surface of the circuit board. 24. The method for preventing short circuit of the soldering of the pin of a semiconductor element as described in item 23 of the scope of the patent application, wherein the semiconductor element is a pin-through-hole (PTT) packaged semiconductor element. 2 5. Prevent semiconductor component pin soldering as described in item 24 of the scope of patent application 17916英業達.ptd 第16頁 200539358 六、申請專利範圍 接短路之方法,其中,該針通孔式封裝半導體元件係 選自包括由雙列式封裝(Duan In一1ine Package; DIP )元件,緊縮雙列式封裝(Shrink DIP; SDIP)元 件,薄膜雙列式封裝(skinny DIP; SK-DIP)元件, 單列式封裝(Single In_line Package; SIP)元件, 交叉引腳封裝(Zig-Zag In-line Package; ZIP)元 件,以及針栅式陣列(Pin Grid Array; PGA)封裝元 件所組成之群組之其中一者。 2 6 ·如申請專利範圍第2 3項所述之防止半導體元件接腳銲 接短路之方法,其中,該阻銲劑係設置於該半導體元馨 件至少局部之每一接腳上。 2 7 ·如申請專利範圍第2 3項所述之防止半導體元件接腳銲 接短路之方法,其中,該阻銲劑係以間隔之方式設置 於該半導體元件至少局部之接腳上。 2 8 ·如申請專利範圍第2 3項所述之防止半導體元件接腳銲 接短路之方法,其中,係將該半導體元件之接腳插接 於該電路板之插接孔内,使得該阻銲區之下邊緣與該 電路板之表面平齊。 2 9·如申請專利範圍第23項所述之防止半導體元件接腳鲜 接短路之方法,其中,係將該半導體元件之接腳插^ 於該電路板之插接孔内,使得該阻銲區之下邊 於該電路板之表面。 、% m 3 0 ·如申請專利範圍第2 3項所述之防止半導體元件接腳銲 接短路之方法,其中,該阻銲劑係藉由選自包括由=17916 英 业 达 .ptd page 16 200539358 VI. Patent application method for short circuit connection, wherein the pin-through-hole package semiconductor component is selected from the group consisting of a dual inline package (Duan In-1ine Package; DIP) component, Shrink DIP (SDIP) components, thin film DIP (SK-DIP) components, Single In_line Package (SIP) components, Zig-Zag In- One of the groups consisting of line package (ZIP) components and pin grid array (PGA) package components. 26. The method for preventing short circuit of the soldering of the pin of the semiconductor element according to item 23 of the scope of the patent application, wherein the solder resist is provided on each pin of at least a part of the semiconductor element. 27. The method for preventing short circuit of the soldering of the pin of a semiconductor element as described in item 23 of the scope of the patent application, wherein the solder resist is disposed on at least part of the pins of the semiconductor element in a spaced manner. 2 8 · The method for preventing short circuit of the soldering of a pin of a semiconductor element as described in item 23 of the scope of the patent application, wherein the pin of the semiconductor element is inserted into the insertion hole of the circuit board, so that the solder resist The lower edge of the area is flush with the surface of the circuit board. 29. The method for preventing fresh short-circuiting of the pins of the semiconductor element as described in item 23 of the scope of the patent application, wherein the pins of the semiconductor element are inserted into the insertion holes of the circuit board so that the solder resist The area is below the surface of the circuit board. % M 3 0 · The method for preventing short circuit of the soldering of the pin of a semiconductor element as described in item 23 of the scope of the patent application, wherein the solder resist is selected from 17916英業達.Ptd 第17頁 200539358 六、申請專利範圍 塗、塗覆、及印刷之方式所組成之群組之其中一者覆 蓋於該銲錫區上。 3 1 .如申請專利範圍第3 0項所述之防止半導體元件接腳銲 接短路之方法,其中,該阻銲劑係白漆。 3 2 .如申請專利範圍第3 0項所述之防止半導體元件接腳銲 接短路之方法,其中,該阻銲劑係綠漆。17916 Inventec. Ptd Page 17 200539358 VI. Scope of Patent Application One of the groups consisting of coating, coating, and printing is covered on the solder area. 31. The method for preventing the short circuit of the soldering of the pin of the semiconductor element as described in item 30 of the scope of patent application, wherein the solder resist is white paint. 32. The method for preventing the short circuit of the soldering of the pin of the semiconductor element as described in item 30 of the scope of patent application, wherein the solder resist is a green paint. 17916英業達.ptd 第18頁17916 Inventec.ptd Page 18
TW093115244A 2004-05-28 2004-05-28 Method for preventing short-circuit caused by soldering pin of semiconductor component TWI234828B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW093115244A TWI234828B (en) 2004-05-28 2004-05-28 Method for preventing short-circuit caused by soldering pin of semiconductor component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW093115244A TWI234828B (en) 2004-05-28 2004-05-28 Method for preventing short-circuit caused by soldering pin of semiconductor component

Publications (2)

Publication Number Publication Date
TWI234828B TWI234828B (en) 2005-06-21
TW200539358A true TW200539358A (en) 2005-12-01

Family

ID=36597953

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093115244A TWI234828B (en) 2004-05-28 2004-05-28 Method for preventing short-circuit caused by soldering pin of semiconductor component

Country Status (1)

Country Link
TW (1) TWI234828B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102029452B (en) * 2009-09-25 2012-11-14 恒昌行精密工业有限公司 Method for preventing tin overflow in welding operation

Also Published As

Publication number Publication date
TWI234828B (en) 2005-06-21

Similar Documents

Publication Publication Date Title
US8420437B1 (en) Method for forming an EMI shielding layer on all surfaces of a semiconductor package
US7183652B2 (en) Electronic component and electronic configuration
TWI404175B (en) Semiconductor package having electrical connecting structures and fabrication method thereof
KR101046250B1 (en) Electromagnetic Shielding Device of Semiconductor Package
JPH08172143A (en) Printed wiring board and electronic device using it
US20050011672A1 (en) Overmolded MCM with increased surface mount component reliability
US20080093748A1 (en) Semiconductor package and fabrication process thereof
US6750084B2 (en) Method of mounting a leadless package and structure therefor
US8212349B2 (en) Semiconductor package having chip using copper process
US6414246B1 (en) Printed circuit board (PCB)
TW200539358A (en) Method for preventing short-circuit caused by soldering pin of semiconductor component
TWI283918B (en) Electronic carrier board and package structure thereof
US20120049359A1 (en) Ball grid array package
CN100362640C (en) Method for preventing semiconductor assembly pin welding from shorting circuit
TWI416694B (en) Chip package having fully covering shield connected to gnd ball
JPH07283336A (en) Chip carrier
KR960035997A (en) Semiconductor package and manufacturing method
JP4114488B2 (en) Semiconductor package mounting structure
JP3499392B2 (en) Semiconductor device
TWI685066B (en) Semiconductor package without substrate and manufacturing method thereof
TWI420645B (en) Method for forming an emi shielding layer on all surfaces of semiconductor package
JP2005347547A (en) Method of preventing short circuiting in soldering connection lead of semiconductor device
KR19990065599A (en) Semiconductor package, manufacturing method thereof and lamination method
JP2023031952A (en) Substrate and mounting substrate
TWI234302B (en) Package for IC and LED

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees