TW200521449A - A shorten distance field patterns measurement device for reflector antenna without microwave anechoic chamber - Google Patents

A shorten distance field patterns measurement device for reflector antenna without microwave anechoic chamber Download PDF

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TW200521449A
TW200521449A TW92135670A TW92135670A TW200521449A TW 200521449 A TW200521449 A TW 200521449A TW 92135670 A TW92135670 A TW 92135670A TW 92135670 A TW92135670 A TW 92135670A TW 200521449 A TW200521449 A TW 200521449A
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antenna
field
measurement
reduced
type
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TW92135670A
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TWI233491B (en
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Dau-Chyrh Chang
Huan-Cheng Lien
zhao-xiang Liao
Zhi-Jun Wu
You-Xuan Huang
Zhi-Hong Li
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Smartant Telecom Co Ltd
Chung Dau Chyrh
Huan-Cheng Lien
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Abstract

This invention provides a shorten distance filed patterns measurement device for reflector antenna, including an antenna strut, reflector antenna, horns antenna, and signal acquisition and receiving device. The reflector antenna that used in this system is a satellite direct broadcast off-set reflector antenna without treated edge. The feed system is a ring corrugated surface-shaped antenna with frequency band between 12 to 18 G Hz. The ratio of the distance between the feed and the focus point of the reflector antenna to the diameter of the reflector disk is 0.6. And the quiet zone is one third of the reflector disc. The performance of the quiet zone is around ±0.5 dB of wave-ripple magnitude and ±5 degrees of wave-ripple phase. The signal acquisition and receiving device employs time domain measurement system to acquire main transmitting function signal, so that it is capable of removing the multi-path induced edge-diffraction field. Furthermore, since the time domain mean impulse signal is used in this invention, the ambient radio frequency interference can be reduced significantly.

Description

200521449 玖、發明說明: 【發明所屬之技術領域】 本發明係關於一種不具微波暗室之縮距反射面天線場 型量測裝置,特別是指-種結合時域脈衝“而不具微波暗 至之細距反射面天線場型量測裝置。 【先前技術】200521449 发明 Description of the invention: [Technical field to which the invention belongs] The present invention relates to a condensing reflective surface antenna field-type measuring device without a microwave darkroom, in particular, it refers to a combination of time-domain pulses "without microwave darkness" Distance Reflector Antenna Field Type Measuring Device [Prior Art]

傳統天線量測方式分為三種,分別為近場量測裝置U 「如附件一所示」、縮距場量測裝置12「如附件二所示」,及 輕量測裝置13「如附件三所示」,前述的量測方式通常都 疋屬於兩成本’因為它需要在射頻的微波暗室内,微波暗室 内有高精確性的掃描裝置及邊緣處理之高精密縮距反射面 天線及微波吸收體15’而且還需要考慮到微波暗室的大小, 若微波暗室越大(像是遠場所需要的空間)則微波吸收體π 的量就多成本也就越多了。 般天線ΐ測都需要考慮到距離、頻率及天線大小等條 件來决疋用哪一種天線量測方式,如量測一 6〇公分的衛星 直播偏焦反射面天線,其工作頻率為12呢,在—般傳統的 :測工間’長、寬、高之邊長至少需要有29公尺, 右微波暗至需要廷麼大,微波吸收體15之量也就要很多, 才1的成本也就大大的提高了,若是使用室外遠場,需要考 慮到天候/重路技的影響,和外部其他射頻干擾之影響。 傳、、先的縮距场里測方法都是使用反射面天線,因為它可 200521449 以產生近似遠場距離之平面波,一般反射面天線有三種結 構’分別為單一偏焦拋物反射面,拋物面及圓柱面雙反射 面’及雙形反射面「如附件四所示」,由於反射面天線會有 邊緣繞射’一般採用錯齒狀邊緣14 (serrated edge)、捲邊 (rol 1 edge)、電阻隔板16(R-car(j)及微波吸收體15當擔板 (microwave absorber)等方式解決邊緣繞射的問題,上述幾 種方法由於涉及精密度要求,製作相對不容易致使設置成本 提高。 傳統近場量測系統天線場型量測系統沒有很廣泛被使用 的原因是它需要很大的成本花費在很大的微波暗室空間、及 該空間内部之微波吸收體15和精確複雜的近場的掃描設備 或高精密度的縮距反射面天線,其設備及維護成本均相當驚 人’貫非一般企業或研究機構所能負擔。 再者若不採用上述近場量測系統而採用縮距場量測天線 場型’仍然需要相當大空間及微波吸收體15,同時還需需要 南精密度的縮距反射面天線,及反射面還需邊緣處理。 由此可見,上述習用天線量測裝置仍有諸多缺失,實非 一良善之設計者,而亟待加以改良。 本案發明人鑑於上述習用天線量測裝置所衍生的各項缺 點,乃亟思加以改良創新,並經多年苦心孤詣潛心研究後, 終於成功研發完成本件不需微波暗室及不需反射面邊緣處 200521449 理之縮距反射面天線場型量測裝置。 【發明目的】 本發明之目的即在於提供一種縮距反射面天線場型量測 裝置’係提供一種增益高、低成本和結構簡單的縮距場量測 方式。 本發明之次一目的係在於提供一種縮距反射面天線場型 置測裝置’採用不須作任何邊緣處理之反射面天線,結合了 時域量測系統可以移除邊緣繞射所造成的多重路徑之散射 場’相對的成本也就降低了很多。 本發明之另一目的係在於提供一種縮距反射面天線場型 量測裝置,係結合了時域量測系統,該系統可移除反射面天 線所產生之反射、散射和繞射等現象,並可在時域中截取訊 號,因此不需要微波暗室。 本發明之又一目的係在於提供一種縮距反射面天線場型 ΐ測裝置,係提供天線大小場型及相位場型量測時其使用空 間需求較小且不需微波吸收體也能量測。 【發明内容】 可達成上述發明目的之縮距反射面天線場型量測裝 置,包括有: 一天線座架,提供支撐反射面天線結構之裝置; 一反射面天線,係連結於該天線座架上緣,由一偏焦拋 200521449 物面和一饋源組成,該饋源係為一環形皺面天線其所發出的 球面波會經偏焦拋物面反射後會變換成一平面波; 一喇η八天線,係與訊號擷取接收裝置相連,以便測得離 反射面天線靜態區的大小場型及相位場型;以及 -訊號擷取接收裝置,具有一輸出端與輸入端,該輸出 端以傳輸線相連接饋源提供輸出訊號,而該輸人端以傳輸線 與喇队天線連接以接收輸入訊號,再利用時域量測系統把輸 出與輸入訊號之多重路徑所產生的邊緣繞射場移除後,再截 取時域中輸出與輸入g凡號相互比較而求得的傳遞函數。 【較佳實施例】 請參閱圖一,本發明所提供之縮距反射面天線場型量測 裝置,主要包括有:一天線座架21,提供支撐反射面天線 22結構之裝置;一反射面天線22,係連結於該天線座架21 上緣,由一偏焦拋物面和一饋源2 3組成,該饋源2 3係為一 %形皺面天線其所發出的球面波會經偏焦拋物面反射後會 變換成一平面波;一喇σ八天線24,係與訊號擷取接收裝置 25相連,以便測得離反射面天線22靜態區的大小場型及相 位場型;以及一訊號擷取接收裝置25,具有一輸出端與輸入 端,該輸出端以傳輸線相連接饋源23提供輸出訊號,而該 輸入端以傳輸線與喇^天線24連接以接收輸入訊號,再利 用時域i測系統把輸出與輸入訊號之多重路徑所產生的邊 200521449 緣繞射場移除後,再截取時域中輸出與輸入訊號相互比較而 求得的傳遞函數訊號。 本發明係使用16〇cm商業界所使用之衛星直播偏焦反射 面天線,材質是鍍鋅鋼板當作反射面天線22,選擇饋源23 的天線是環形皺面天線,當作反射面天線22的饋源23。理 論上靜態區是反射面天線22盤面大小的三分之一,所以靜 態區大小應該會約有53cm,傳統的縮距反射面測試靜態區 (quiet zone)性能約有大小(magnitude)正負〇 5dB的波紋 連漪,以及正負5度的相位波紋漣漪,將根據以上所有之特 性作參考,再係結合訊號擷取接收裝置25之時域量測系統, 其時域量測系統工作脈衝寬度為3〇ps,脈衝重覆率為 250KHZ,輸出電壓為30伏特,由於此時域量測系統可以截 取時域中主要訊號,並可以移除多重路徑所產生的邊緣繞射 場,而使用時域脈衝訊號平均值的功能也可以減少室外射頻 之干擾。 本發明使用的天線量測系統有(丨)頻域近場量測系統 及(2 )室外天線量測系統,近場之微波暗室長寬高大小分 別為9公尺χ4· 4公尺χ3· 8公尺,訊號擷取接收裝置25(spectmm awyzer)為HP8722E,軟體為ANTC〇M公司設計提供,測試頻率 範圍從50MHz到40GHz,而時域量測系統有兩個發射站,距 離刀別為115公尺及236公尺,測試頻率範圍從1〇〇MHz到 10 200521449 26GHz ’脈衝寬度為3〇pS,脈衝重覆率為ΐ25ΚΗζ,輸出電壓 為30伏特,軟體為GE0Z0NDAS公司設計提供,反射面天線 22大小為160公分,環形皺面天線頻段為12到18GHz。 本發明量測分為兩個階段,第一階段是本發明之反射面 在近場天線量測系統裡調校,調校後在近場的微波暗室内再 作靜態區的量測,並作「頻域量測」和「時域量測」的靜態 區結果比較,第二階段使用兩種形式的驗證天線來作本發 明、近場以及室外遠場的結果比較。 ※第一階段:在近場調校反射面天線22 本階段係使用大葉大學之多功能近場量測裝置1丨,其微 波暗室之長寬高大小為9公尺χ4· 4公尺X3· 6公尺,使用的 ΐ測方法為平面極形(plane p〇lar),它是屬於頻域量測的 方式,量測的頻率點為12GHz,量測此反射面天線22的靜態 區大小場型及相位場型,其量測結果如r如圖二、三所示」; 另一量測係使用導波管(WR62)當作發射源來作量測,由於此 天線之場型比較胖(6 dBi低指向性),因此邊緣繞射場會比 較明顯,所以它的波紋漣漪會比較大,而它的大小 (magnitude)及相位(phase)之波紋漣漪分別為正負5dB及正 負1 〇度,之後再使用時域量測系統作靜態區之量測,量測 的頻率點也為12GHz,量測結果「如圖四、五所示」,靜態區 大小及相位之波紋漣漪分別為正負IdB及正負1 0度,由以 200521449 上之量測結果t比較, (phase)之波紋漣漪, ’時域量測的大小(magnitude)及相位There are three types of traditional antenna measurement methods: near field measurement device U "as shown in Annex I", narrow field measurement device 12 "as shown in Annex II", and light measurement device 13 "as shown in Annex III As shown in the figure, the aforementioned measurement methods usually do not belong to the two costs. 'Because it needs to be in the microwave darkroom of the radio frequency, the microwave darkroom has a high-precision scanning device and edge-treated high-precision narrow-reflection reflector antenna and microwave absorption The body 15 'also needs to consider the size of the microwave anechoic chamber. If the microwave anechoic chamber is larger (such as the space required for a distant place), the amount of the microwave absorber π will increase and the cost will increase. In general, antenna measurement needs to consider the distance, frequency, and antenna size to determine which antenna measurement method, such as measuring a 60 cm satellite live broadcast defocused reflective surface antenna, which has a working frequency of 12, In the traditional way: the length of the measuring room should be at least 29 meters in length, width, and height. The right microwave is dark enough to be large, and the amount of microwave absorber 15 is also much. It is greatly improved. If the outdoor far field is used, it is necessary to consider the influence of weather / road technology and the impact of other external radio frequency interference. The first and second methods of measuring in the reduced field are using reflective surface antennas, because it can produce 200521449 plane waves with approximate far-field distances. Generally, reflective surface antennas have three structures. They are a single defocused parabolic reflective surface, a parabolic surface, and Cylindrical double-reflective surface "and double-shaped reflective surface" as shown in Annex IV ", because the reflective surface antenna will have edge diffraction, generally the wrong toothed edge 14 (serrated edge), curled edge (rol 1 edge), resistance The baffle 16 (R-car (j) and the microwave absorber 15 as a microwave absorber) solve the problem of edge diffraction. The above-mentioned methods are relatively difficult to manufacture due to the precision requirements, which increases the installation cost. The traditional near field measurement system antenna field measurement system is not widely used because it requires a large cost to spend in a large microwave darkroom space, and the microwave absorber 15 and the accurate and complex near field in the space. Scanning equipment or high-precision narrow-reflection surface antennas, the equipment and maintenance costs are quite amazing, which is not affordable by ordinary enterprises or research institutions. The near-field measurement system using a reduced-field measurement antenna field type still requires a considerable amount of space and a microwave absorber 15 and also requires a south-precision, reduced-reflection reflector antenna, and the reflective surface also needs edge processing. It can be seen that the conventional antenna measurement device still has many defects, and it is not a good designer, and it needs to be improved. In view of various shortcomings derived from the conventional antenna measurement device, the inventor of this case is eager to improve and innovate. After years of painstaking research, finally successfully completed the development of a measuring device with a reduced reflective surface antenna field type that does not require a microwave anechoic chamber and a reflective surface edge 200521449. [Objective of the Invention] The purpose of the present invention is to provide A reduced-reflection-surface antenna field-type measurement device 'provides a reduced-reflection-field measurement method with high gain, low cost, and simple structure. A second object of the present invention is to provide a reduced-reflection-surface antenna field-type measurement. The device 'uses a reflective antenna that does not require any edge processing, combined with a time-domain measurement system, which removes many of the effects caused by edge diffraction. The relative cost of the scattering path of the heavy path is also greatly reduced. Another object of the present invention is to provide a measuring device with a reduced reflective surface antenna field type, which is combined with a time-domain measurement system, which can be removed. The reflection, scattering, diffraction and other phenomena generated by a reflective surface antenna can intercept signals in the time domain, so a microwave darkroom is not required. Another object of the present invention is to provide a reduced-reflection surface antenna field-type detection device. It provides antenna size field type and phase field type measurement, which requires less space for use and does not need microwave absorber and energy measurement. [Summary of the invention] Achieved the above-mentioned invention can achieve the purpose of the measurement of the reflective surface antenna field type measurement The device includes: an antenna mount, which provides a device for supporting a reflective surface antenna structure; a reflective antenna, which is connected to the upper edge of the antenna mount, and is composed of a defocused throw 200521449 object surface and a feed source, the feed The source system is a circular corrugated antenna, and the spherical wave emitted by it will be reflected by a defocused parabola and converted into a plane wave. An eight antenna is connected to the signal acquisition and reception device. The magnitude field type and phase field type of the static area of the reflecting surface antenna are measured; and-the signal acquisition and receiving device has an output end and an input end, and the output end is connected to a feed source by a transmission line to provide an output signal, and the input The transmission line is connected to the antenna of the team to receive the input signal, and the time-domain measurement system is used to remove the edge diffraction field generated by the multiple paths of the output and input signals. Then, the output and input signals in the time domain are intercepted. Compare and find the transfer function. [Preferred embodiment] Please refer to FIG. 1. The reduced-reflection reflecting-surface antenna field measurement device provided by the present invention mainly includes: an antenna mount 21, a device for supporting the structure of the reflecting-surface antenna 22, and a reflecting surface. The antenna 22 is connected to the upper edge of the antenna mount 21, and is composed of a defocused parabolic surface and a feed source 23, which is a% -shaped wrinkled antenna. The spherical wave emitted by the antenna will be defocused. After the parabolic reflection, it will be transformed into a plane wave; a sigma-eight antenna 24 is connected to the signal acquisition and receiving device 25 so as to measure the size field type and phase field type of the static area of the reflective surface antenna 22; and a signal acquisition and reception The device 25 has an output end and an input end. The output end is connected to the feed source 23 by a transmission line to provide an output signal, and the input end is connected to the antenna 24 by a transmission line to receive the input signal. Edges generated by multiple paths of output and input signals 200521449 After the edge diffraction field is removed, the transfer function signals obtained by comparing the output and input signals in the time domain with each other are intercepted. The present invention uses a satellite live broadcast defocused reflective surface antenna used in the commercial field of 160 cm. The material is galvanized steel plate as the reflective surface antenna 22, and the antenna selected as the feed source 23 is a circular wrinkle antenna, which is used as the reflective surface antenna 22.的 feed source 23. Theoretically, the static area is one-third of the size of the 22 face of the reflective surface antenna, so the size of the static area should be about 53cm. The performance of the traditional constricted reflective surface test in the static zone is about ± 5dB. The ripple ripples and phase ripple ripples of plus or minus 5 degrees will be based on all the above characteristics and will be combined with the time-domain measurement system of the signal acquisition receiving device 25. The time-pulse width of the time-domain measurement system is 3 〇ps, the pulse repetition rate is 250KHZ, and the output voltage is 30 volts. At this time, the domain measurement system can intercept the main signal in the time domain, and can remove the edge diffraction field generated by multiple paths, and use the time domain pulse signal. The function of averaging can also reduce the interference of outdoor RF. The antenna measurement systems used in the present invention include (丨) a frequency-domain near-field measurement system and (2) an outdoor antenna measurement system. The length, width, and height of the microwave anechoic chamber in the near field are 9 meters × 4 · 4 meters × 3 · 8 meters, the signal acquisition and receiving device 25 (spectmm awyzer) is HP8722E, the software is provided by ANTCOM company, the test frequency range is from 50MHz to 40GHz, and the time domain measurement system has two transmitting stations, the distance is 115 meters and 236 meters, test frequency range from 100MHz to 10 200521449 26GHz 'Pulse width is 30pS, pulse repetition rate is Η25ΚΗζ, output voltage is 30 volts, software is provided by GE0Z0NDAS company, reflecting surface The size of the antenna 22 is 160 cm, and the frequency of the loop wrinkle antenna is 12 to 18 GHz. The measurement of the present invention is divided into two stages. The first stage is that the reflecting surface of the present invention is adjusted in the near-field antenna measurement system. After the adjustment, the static area measurement is performed in the near-field microwave dark room, and the measurement is performed. The comparison of the static region results of "frequency domain measurement" and "time domain measurement". In the second stage, two forms of verification antennas are used to compare the results of the present invention, the near field, and the outdoor far field. ※ The first stage: adjust the reflective surface antenna 22 in the near field. This stage uses the multi-functional near-field measuring device 1 from Daye University. The length, width, and height of the microwave anechoic chamber are 9 meters x 4 meters 4 meters X3 meters. 6 meters. The speculative method used is a plane polar, which is a frequency-domain measurement method. The measured frequency point is 12 GHz. The static field size field of the reflective surface antenna 22 is measured. Type and phase field type, the measurement results are shown in r as shown in Figures 2 and 3. "Another measurement system uses a waveguide (WR62) as the source for measurement. Because the antenna field type is relatively fat (6 dBi low directivity), so the edge diffraction field will be more obvious, so its ripple ripple will be larger, and its magnitude and phase ripple ripple are plus or minus 5dB and plus or minus 10 degrees, respectively. Then use the time domain measurement system to measure the static area. The frequency point of the measurement is also 12GHz. The measurement results are shown in “Figures 4 and 5”. The ripple and ripple of the size and phase of the static area are positive and negative IdB and Plus or minus 10 degrees, compared with the measurement result t on 200521449, (phase) Pattern ripples, 'time domain measurement of the size (Magnitude) and phase

测結果可以看出反射面之靜態區 ’它的波紋漣騎就相當很小 之靜態區的性能如下: 寬度大小:5 5公分 高度大小:5 0公分 深度大小:5 0公分 大小 taper : 1 dB 大小波紋漣漪:+ -1 dR 相位波紋漣漪:+-l〇deg ※第一階段:天線場型量測結果及增益之比較 本階段係提供兩種天線型式之驗證量測,第一種是量測 寬頻剩A低指向性天線31 (指向性約l2 5dBi),第二種是一 個12GHz的60公分高指向性衛星直播反射面天線32(指向性 約35. 5 dBi ),這兩種天線將會作本發明量測場和傳統遠場 之量測,並作一個比較。 ◎天線一:低指向性天線31 (寬頻喇队天線)量測 量測低指向性天線31主要驗證反射面天線22的邊緣繞 射場之移除功能。首先將此低指向性天線31在頻域量測的 近場微波暗室内作場型量測「如附件五所示」,此低指向性 12 200521449 天線31係使用球形近場量測方式,量測的頻率點為12GHz, 於间頻時其功率大小不夠,所以在發射端及接收端都加了放 大裔…、放大了 6〇dB,在近場内為了要減少多重路徑所以 檑牆,它是使用微波吸收體Μ及 電阻隔板16所組成,先在微波暗室採用近場球形掃描量測 方式進仃%強置測荒集量測資料,之後將此低指向性天線 31刀別使用使用本發明之反射面天線22場型量測裝置「如 附件六」與傳統遠場量測裝置13「如附件七所示」進行場強鲁 里測於附件六」中可得知本發明之量測場的深度距離只 有2公尺,而傳統遠場距離需要6·27公尺,另外將上述三 種里測方式;^出之量測場形資料加以冑納整理,#中「圖六」 為本毛月里測低指向性天線Ε-ρ丨ane場型和近場場型之比較 圖、「圖七」為本發明量測低指向性天線E —plane場型和遠 場場型之比較圖、「圖八」為本發明量測低指向性天線 H plane %型和近場場型之比較圖、而「圖九」為本發明量修 測低指向性天線H-Plane場型和遠場場型之比較圖,由以上 之量測結果可以證明本發明和近場量測裝置u及遠場量測 裝置13專測試場都相當的接近。 ◎天線二:高指向性衛星直播反射面天線量測 量測高指向性衛星直播(DBS: direct br〇adcast system) 反射面天線32,主要驗證反射面天線22之表面誤差度。首 13 200521449The measurement results show that the static area of the reflective surface 'its ripples are quite small. The performance of the static area is as follows: Width: 5 5 cm Height: 50 cm Depth: 50 cm Taper: 1 dB Large and small ripples: + -1 dR Phase ripples: + -l0deg ※ The first stage: Comparison of antenna field measurement results and gain This stage provides verification measurements of two antenna types. The first is the measurement The wide-band remaining A low directivity antenna 31 (directivity about 12 5dBi), the second is a 12GHz 60 cm high directivity satellite live reflector antenna 32 (directivity about 35.5 dBi), these two antennas will The measurement field of the present invention and the traditional far-field measurement will be made, and a comparison will be made. ◎ Antenna 1: Low-directional antenna 31 (broadband antenna) measurement The low-directional antenna 31 mainly verifies the removal function of the edge diffraction field of the reflective surface antenna 22. First, perform field measurement of this low-directional antenna 31 in a near-field microwave darkroom measured in the frequency domain "as shown in Annex V". This low-directional antenna 12 200521449 antenna 31 uses a spherical near-field measurement method. The measured frequency point is 12GHz, and its power is not enough at the inter-frequency, so the amplifier and the receiver are added with amplification, and the amplification is 60dB. In the near field, in order to reduce multiple paths, the wall is broken. It is The microwave absorber M and the resistive spacer 16 are used. The near-field spherical scanning measurement method is used in the microwave anechoic chamber to obtain the% strong measurement data. Then the low-directional antenna 31 is used. The invention's reflective surface antenna 22-field measurement device "as in Annex VI" and traditional far-field measurement device 13 "as shown in Annex 7" perform field strength lurie measurement in Annex VI. The measurement of the present invention can be found in The depth distance of the field is only 2 meters, while the traditional far-field distance requires 6.27 meters. In addition, the above three types of in-field measurement methods are summarized and summarized. # 中 「图 六」 is based on Mao Yueli low-directional antenna Ε-ρ 丨 ane field type Comparison chart of near-field type, "Figure 7" is a comparison chart of measuring low-directional antenna E-plane field type and far-field type of the invention, and "Figure 8" is measuring H-plane of low-directional antenna of the present invention Comparison chart of% and near-field type, and "Figure 9" is a comparison chart of H-Plane field type and far-field type of the low-directional antenna according to the present invention. The above measurement results can prove the present invention. It is quite close to the near-field measurement device u and the far-field measurement device 13 special test field. ◎ Antenna 2: Measurement of high directivity satellite direct broadcast reflecting surface antenna Measurement of high directivity satellite direct broadcast (DBS: direct bradcast system) reflective surface antenna 32 mainly verifies the surface error of the reflective surface antenna 22. First 13 200521449

University. August 2001.University. August 2001.

[2] Chang, D.-C. ; Yang, C.-C. ; Yang, S. -Y. ;u Dual-reflector system with a spherical main reflector and shaped subreflector for compact range” Microwaves, Antennas and Propagation, IEE Proceedings - , Volume: 144 Issue: 2 , Apr 1997 Page(s): 97 -102.[2] Chang, D.-C.; Yang, C.-C.; Yang, S. -Y.; U Dual-reflector system with a spherical main reflector and shaped subreflector for compact range ”Microwaves, Antennas and Propagation, IEE Proceedings-, Volume: 144 Issue: 2, Apr 1997 Page (s): 97 -102.

[3] Marti-Canales,J· ; Ligthart,L· P· ; Roederer,A· G· ; φ “Performance analysis of a compaci; range in the time domain" Antennas and Propagation, IEEE Transactions ON ANTENNA, Volume: 50 Issue: 4, Apr 2002 Page(s): 511 -51.[3] Marti-Canales, J ·; Ligthart, L · P ·; Roederer, A · G ·; φ "Performance analysis of a compaci; range in the time domain " Antennas and Propagation, IEEE ON ANTENNA, Volume: 50 Issue: 4, Apr 2002 Page (s): 511 -51.

[4] Geozondas, ”Antenna Test Area”Vilnius 2002 【特點及功效】 本發明所提供之縮距反射面天線場型量測裝置,不但不# 需要微波暗室及微波吸收體,而且反射面天線又沒有作任何 邊緣處理,又於量測結果巾得知本發明與傳統近場量測與遠 場量測結果都相當接近,使本發明的大大降低了成本及量測 空間。 上列詳細說明係針對本發明 明 ^ ^可仃實施例之具體說 ,惟該實施例並非用以限制本發 资5之專利範圍,凡未脫離 15 200521449 本發明技藝精神所為之等效實施或變更,均應包含於本案之 專利範圍中。 綜上所述,本案不但在技術思想上確屬創新,並能較習 用物品增進上述多項功效,應已充分符合新穎性及進步性之 法定發明專利要件,爰依法提出申請,懇請貴局核准本件 發明專利申請案’以勵發明,至感德便。 【圖式簡單說明】 請參閱以下有關本發明一較佳實施例之詳細說明及其附 _ 圖’將可進一步瞭解本發明之技術内容及其目的功效;有關 該實施例之附圖為: 圖一為該縮距反射面天線場型量測裝置之立體視圖; 圖二為反射面天線在近場内調校於1 2GHz頻域量測之大 小場型圖; 圖三為反射面天線在近場内調校於丨2GHz時域量測之相 位場型圖; φ 圖四為該縮距反射面在近場使用時域量測於12GHz時域 量測之大小場型圖; 圖五為該縮距反射面在近場使用時域量測於丨2GHz時域 量測之相位場型圖; 圖六為該反射面天線場型量測低指向性天線E_plane場 型和近場場型之比較圖; 16 200521449 圖七為該反射面天線場型量測低指向性天線E-plane場 型和遠場場型之比較圖; 圖八為該反射面天線場型量測低指向性天線H-plane場 型和近場場型之比較圖; 圖九為該反射面天線場型量測低指向性天線H-plane場 型和遠場場型之比較圖; 圖十為該反射面天線場型量測高指向性衛星直播反射面 天線H-plane場型和近場場型之比較圖; 圖十一為該反射面天線場型量測高指向性衛星直播反射 面天線H-plane場型和遠場場型之比較圖; 附件一為習用之近場量測系統實體示意圖; 附件二為習用之縮距場量測系統實體示意圖; 附件三為習用之室外遠場量測系統實體示意圖; 附件四為習用之雙縮距反射面天線量測系統實體示意 圖; 附件五為低指向性天線在頻域量測的近場微波暗室内作 場型量測示意圖; 附件六為該反射面天線場型量測低指向性天線場型圖; 附件七為傳統遠場距離量測低指向性天線場型圖; P付件八為邊咼指向性衛星直播反射面天線在近場量測場 型之示意圖; 17 200521449 附件九為該反射面天線場型量挪高指向性衛星直播反射 面天線之示意圖;以及 附件十為室外遠場量測該高指向性衛星直播反射面天線 場型之示意圖。 【主要部分代表符號】 11近場量測裝置 12縮距場量測裝置 13遠場量測裝置 14鋸齒狀邊緣 微波吸收體 16電阻隔板 21天線座架 22反射面天線 23饋源 24剩天線 25訊號擷取接收裝置 31低指向性天線 32高指向性衛星直播反射面天線[4] Geozondas, "Antenna Test Area" Vilnius 2002 [Features and Effects] The condensed reflective antenna field measurement device provided by the present invention not only requires a microwave darkroom and microwave absorber, but also the reflective antenna Doing any edge processing, and knowing from the measurement results that the present invention is quite close to the traditional near-field measurement and far-field measurement results, which greatly reduces the cost and measurement space of the present invention. The above detailed description is specific to the embodiment of the present invention ^ ^, but this embodiment is not intended to limit the scope of the patent issued by the capital 5, which does not depart from the equivalent of 15 200521449 the technical spirit of the present invention or Changes should be included in the patent scope of this case. To sum up, this case is not only technically innovative, but also enhances the above-mentioned multiple effects over conventional items. It should have fully met the requirements for novel and progressive statutory invention patents, and filed an application in accordance with the law. We ask your office to approve this. The invention patent application 'encourages invention to the highest level. [Brief description of the drawings] Please refer to the following detailed description of a preferred embodiment of the present invention and its attached drawings for further understanding of the technical content of the present invention and its effects. The drawings related to this embodiment are: One is a three-dimensional view of the reduced-reflection-surface antenna field-type measuring device; FIG. 2 is a large-field pattern of the reflective-surface antenna adjusted in the near-field measurement in the 12 GHz frequency range; and FIG. 3 is a reflective-surface antenna in the near-field measurement. Phase field diagram adjusted in the 2GHz time domain measurement; φ Figure 4 is the size field diagram of the reduced-reflection surface used in the near-field measurement in the 12GHz time-domain measurement; Figure 5 is the reduced distance The phase pattern of the reflective surface in the near field is measured in the time domain and measured in the 2GHz time domain. Figure 6 is a comparison diagram of the low-directional antenna E_plane field pattern and the near field pattern of the reflective antenna field pattern. 16 200521449 Figure 7 shows the comparison between the E-plane field type and the far-field type of the low-directional antenna field measured by the reflective antenna field type; Figure 8 shows the H-plane field of the low-directional antenna measured by the reflective surface field type Comparison chart of near-field and near-field types; Figure 9 shows the antenna field of the reflective surface Comparison chart of the measurement of the low-directional antenna H-plane field type and the far-field field type; Figure 10 shows the measurement of the high-directional satellite live broadcast reflective surface antenna H-plane field type and the near-field field type of the reflective surface antenna field type. Comparison diagram; Figure 11 is a comparison diagram of the H-plane field type and far field field type of the high directivity satellite direct-reflection surface antenna for the measurement of the high-directivity satellite direct-view satellite field type with this reflective surface antenna field type; Attachment 1 is a schematic diagram of a conventional near field measurement system; Attachment 2 is a physical diagram of a conventional narrow-field measurement system; Attachment 3 is a physical diagram of a conventional outdoor far-field measurement system; Attachment 4 is a physical diagram of a conventional dual-retracted reflective surface antenna measurement system; Attachment 5 is a low-pointing Schematic diagram of field pattern measurement in a near-field microwave darkroom for frequency antenna measurement; Annex VI is a low-directional antenna field pattern for this reflective antenna field pattern; Annex 7 is a traditional far-field distance measurement for low-point antenna Antenna field diagram; Figure P is a schematic diagram of the near-field measurement field pattern of a side-directional directional satellite live broadcast reflecting surface antenna; 17 200521449 Attachment IX is the reflection surface antenna field type moving high directivity satellite live reflecting surface The schematic line; Annex X and outdoor far-field measurement of the high directivity reflective surface schematic diagram of satellite antenna patterns of broadcast. [Representative symbols of main parts] 11 Near-field measurement device 12 Reduced-field measurement device 13 Far-field measurement device 14 Serrated edge microwave absorber 16 Resistance partition 21 Antenna mount 22 Reflective surface antenna 23 Feed source 24 Remaining antenna 25 signal acquisition and receiving device 31 low directivity antenna 32 high directivity satellite live reflection surface antenna

Claims (1)

200521449 拾、申請專利範圍 1 · 一種縮距反射面天線場型量測裝置,包括: 一天線座架,提供支撐反射面天線結構之裝置; 一反射面天線,係連結於該天線座架上緣,由一偏焦抛 物面和一饋源組成,該饋源係為一環形皺面天線其所發出的 球面波會經偏焦拋物面反射後會變換成一平面波; 一喇队天線,係與訊號擷取接收裝置相連,以便測得離 反射面天線靜態區的大小場型及相位場型;以及 一訊號擷取接收裝置,具有一輸出端與輸入端,該輸出 端以傳輸線相連接饋源提供輸出訊號,而該輸入端以傳輸線 與味卜八天線連接以接收輸入訊號。 2. 3. 4· 如申請專利範圍第1項所述之縮距反射面天線場型量測 裝置,其中該反射面天線係為一金屬反射面。 如申請專利範圍第2項所述之縮距反射面天線場型量測 裝置’其中該反射面天線係具有平滑邊緣。 ^申請專利範圍第i項所述之縮距反射面天線場型量測 裝置,其中該鎖源到反射面天線盤面的距離和反射面天 線盤面直徑大小之比為0.6。 ^申請專利範圍第i項所述之縮距反射面天線場型量測 |置’其中該訊號擷取接收裝置之時域量測系統,係能 :取時域中輸出與輸入訊號相互比較而求得的傳遞函 數。 5. 200521449 6. 如申請專利範圍第6項所述之縮距反射面天線場型量測 裝置,其中該時域量測系統可移除反射面天線多重路徑 所產生的邊緣繞射場。200521449 Scope of application and patent application 1 · A measuring device with a reduced reflective surface antenna field type, comprising: an antenna mount, providing a device for supporting a reflective plane antenna structure; a reflective plane antenna connected to the upper edge of the antenna mount , Consisting of a defocused parabolic surface and a feed source, which is a circular corrugated antenna whose spherical wave is reflected by the defocused parabolic surface and transformed into a plane wave; a squad antenna is used for signal acquisition The receiving device is connected in order to measure the size field type and phase field type of the static area of the reflective surface antenna; and a signal acquisition receiving device having an output end and an input end, the output end is connected to the feed source by a transmission line to provide an output signal , And the input end is connected to the Weibu Ba antenna by a transmission line to receive the input signal. 2. 3. 4 The reduced-reflection surface antenna field-type measuring device as described in item 1 of the scope of patent application, wherein the reflection surface antenna is a metal reflection surface. The reduced-reflection-surface-antenna-field-type measuring device according to item 2 of the scope of the patent application, wherein the reflective-surface antenna has a smooth edge. ^ The reduced-reflection reflecting-surface antenna field-type measuring device described in item i of the patent application range, wherein the ratio between the distance from the lock source to the reflecting-surface antenna disk surface and the reflecting-surface antenna disk surface diameter is 0.6. ^ The reduced-reflection surface antenna field measurement described in item i of the patent application | settings' where the time-domain measurement system of the signal acquisition and receiving device is capable of: comparing the output and input signals in the time domain with each other and The obtained transfer function. 5. 200521449 6. The reduced-reflection surface antenna field-type measurement device as described in item 6 of the scope of patent application, wherein the time-domain measurement system can remove the edge diffraction field generated by the multiple paths of the reflection surface antenna. 2020
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CN113030597B (en) * 2019-12-24 2024-05-17 川升股份有限公司 Antenna measuring system integrating far field and distance-reducing field
CN113161714A (en) * 2020-01-22 2021-07-23 扬博科技股份有限公司 Shrinkage distance field system for automatic measurement of packaged antenna
CN115276836A (en) * 2022-07-18 2022-11-01 深圳市通用测试系统有限公司 Compact range testing system

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CN111044801A (en) * 2018-10-12 2020-04-21 安立股份有限公司 Antenna device and measuring method
CN111044801B (en) * 2018-10-12 2022-06-21 安立股份有限公司 Antenna device and measuring method

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