TW200512943A - Device of detecting nanoparticle and method of the same - Google Patents

Device of detecting nanoparticle and method of the same

Info

Publication number
TW200512943A
TW200512943A TW092125852A TW92125852A TW200512943A TW 200512943 A TW200512943 A TW 200512943A TW 092125852 A TW092125852 A TW 092125852A TW 92125852 A TW92125852 A TW 92125852A TW 200512943 A TW200512943 A TW 200512943A
Authority
TW
Taiwan
Prior art keywords
ion trap
particles
mass
same
charged particles
Prior art date
Application number
TW092125852A
Other languages
Chinese (zh)
Other versions
TWI257705B (en
Inventor
Huan-Cheng Chang
Wen-Ping Peng
Yong Cai
Original Assignee
Academia Sinica
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Academia Sinica filed Critical Academia Sinica
Priority to TW92125852A priority Critical patent/TWI257705B/en
Priority to US10/726,071 priority patent/US7119331B2/en
Publication of TW200512943A publication Critical patent/TW200512943A/en
Application granted granted Critical
Publication of TWI257705B publication Critical patent/TWI257705B/en

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  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

A mass spectrometry system includes a first ion trap that selectively ejects charged particles based on their mass-to-charge ratios. A second ion trap receives the particles ejected from the first ion trap, causing the particles to gather near the center of the second ion trap. A laser beam is directed towards the particles in the second ion trap to induce fluorescence, which is detected by the photon detector. Particles are periodically dumped from the second ion trap. A mass spectrum of the charged particles can be obtained by comparing the photon count with the particle ejection characteristics of the first ion trap.
TW92125852A 2003-08-07 2003-09-19 Device of detecting nanoparticle and method of the same TWI257705B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW92125852A TWI257705B (en) 2003-09-19 2003-09-19 Device of detecting nanoparticle and method of the same
US10/726,071 US7119331B2 (en) 2003-08-07 2003-12-01 Nanoparticle ion detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW92125852A TWI257705B (en) 2003-09-19 2003-09-19 Device of detecting nanoparticle and method of the same

Publications (2)

Publication Number Publication Date
TW200512943A true TW200512943A (en) 2005-04-01
TWI257705B TWI257705B (en) 2006-07-01

Family

ID=37764239

Family Applications (1)

Application Number Title Priority Date Filing Date
TW92125852A TWI257705B (en) 2003-08-07 2003-09-19 Device of detecting nanoparticle and method of the same

Country Status (1)

Country Link
TW (1) TWI257705B (en)

Also Published As

Publication number Publication date
TWI257705B (en) 2006-07-01

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees