TW200501285A - Flip-chip bonding process - Google Patents
Flip-chip bonding processInfo
- Publication number
- TW200501285A TW200501285A TW092116215A TW92116215A TW200501285A TW 200501285 A TW200501285 A TW 200501285A TW 092116215 A TW092116215 A TW 092116215A TW 92116215 A TW92116215 A TW 92116215A TW 200501285 A TW200501285 A TW 200501285A
- Authority
- TW
- Taiwan
- Prior art keywords
- flip
- chip
- conductive metal
- chip bonding
- metal column
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16135—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/16145—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32135—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/32145—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Wire Bonding (AREA)
Abstract
A flip-chip bonding process is provided. At first, to form a first conductive metal column on a die pad of a first chip, wherein the surface area of the end of the first conductive metal column far from the die pad is bigger than the cross-section area of the first conductive metal column to increase the contact area for flip-chip bonding. Next, to form a first surface preservation layer on the surface of the first copper column, wherein the first surface preservation layer such as a organic preservation layer or a Ni/Au layer for preventing surface oxidation. Then, to bond the first conductive metal column of the first chip to a carrier or a second chip.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW092116215A TWI224376B (en) | 2003-06-16 | 2003-06-16 | Flip-chip bonding process |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW092116215A TWI224376B (en) | 2003-06-16 | 2003-06-16 | Flip-chip bonding process |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI224376B TWI224376B (en) | 2004-11-21 |
TW200501285A true TW200501285A (en) | 2005-01-01 |
Family
ID=34568389
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092116215A TWI224376B (en) | 2003-06-16 | 2003-06-16 | Flip-chip bonding process |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI224376B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111316432A (en) * | 2017-10-05 | 2020-06-19 | 德州仪器公司 | Enlarged head post for bump bonding |
TWI704659B (en) * | 2019-10-22 | 2020-09-11 | 樂鑫材料科技股份有限公司 | Wafer backside thin film structure, power module package including the same, manufacturing method of wafer backside thin film structure, and manufacturing method of power module package |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117219526B (en) * | 2023-11-09 | 2024-02-09 | 日月新半导体(昆山)有限公司 | Integrated circuit bonding process and integrated circuit structure |
-
2003
- 2003-06-16 TW TW092116215A patent/TWI224376B/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111316432A (en) * | 2017-10-05 | 2020-06-19 | 德州仪器公司 | Enlarged head post for bump bonding |
CN111316432B (en) * | 2017-10-05 | 2024-06-07 | 德州仪器公司 | Enlarged post for bump bonding |
TWI704659B (en) * | 2019-10-22 | 2020-09-11 | 樂鑫材料科技股份有限公司 | Wafer backside thin film structure, power module package including the same, manufacturing method of wafer backside thin film structure, and manufacturing method of power module package |
Also Published As
Publication number | Publication date |
---|---|
TWI224376B (en) | 2004-11-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |