TW200413550A - Improvement for vapor deposition method - Google Patents

Improvement for vapor deposition method Download PDF

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Publication number
TW200413550A
TW200413550A TW92101755A TW92101755A TW200413550A TW 200413550 A TW200413550 A TW 200413550A TW 92101755 A TW92101755 A TW 92101755A TW 92101755 A TW92101755 A TW 92101755A TW 200413550 A TW200413550 A TW 200413550A
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Taiwan
Prior art keywords
vapor deposition
evaporation
patent application
scope
vapor
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TW92101755A
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Chinese (zh)
Inventor
Shu-Wen Jang
Guo-Sen Lin
Chi-Min Chen
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Windell Corp
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Priority to TW92101755A priority Critical patent/TW200413550A/en
Publication of TW200413550A publication Critical patent/TW200413550A/en

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Abstract

A kind of improvement for vapor deposition method is achieved by pressing powdery vapor deposition material into dense pellets or tablets at a predetermined pressure, temperature and time. Because the pressed vapor deposition material is denser compared with powder vapor deposition material, there is more vapor deposition material in terms of mass per unit volume. Furthermore, because the pressed vapor deposition material is more homogeneous and denser and its crystalline property is identical, heat transfer efficiency is increased and heating power is more stable.

Description

(1) 【發明所屬之技術領域J 本發明係一種蒸鍍 料用於蒸鍍時之製程'改良,主要針對粉末狀的蒸鍍 【先前技術】 方法改良。 在機械工業、電子 、 使用的材料賦與某種特性^或半導體工業領域,為了對所 膜(一層薄膜),而加以^材料表面上以各種方法形成被 過程所形成時,一般將2,假如此薄膜經由原子層的 蒸鍍處理時,以原子=專溥膜沈積稱為蒸鍍處理。採用 被膜,因此可以得到以埶0層人控制蒸鍍粒子使其形成 造及功森的被膜。 、衡狀態無法得到的具有特殊構 薄膜沈積是目前最流 裝飾品、餐具、刀具、的表面處理法之-,可應用於 處理,泛指在各種金屬材、模具、半導體元件等之表面 基板的表面上,成長:二ί硬合金、陶究材料及晶圓 期獲得美觀耐磨、耐熱:耐材料薄膜的製程’以 ,可:Γ過程中,是否含有化學反應的機制 了 刀為物理氣相沈積(Physicai 邛 制 ⑽’讀:)通常稱為物理蒸鑛及化學氣相沈 =r:r:sition ’簡稱CVD)通常稱為化學蒸鍍。 薄,的成長疋一連串複雜的過程所構成的首先 基板的蒸鍍材料之單原子必須將縱向動量發散,單原 能『吸附』在基板上,這些單原子會在基板表面發生形 薄膜所須要的化學反應’所形成的薄膜構成單原子會在5 200413550 五、發明說明(2) 板表面作擴散運動,這個現象稱為吸附單原子的『表面遷 徙』,當原子彼此相互碰撞時會結合而形成原子團過程, 稱為『成核』,原子團必須達到一定的大小之後,才能持 續不斷穩定成長。因此小原子團會傾向彼此聚合以形成一 較大的原子團,以調降整體能量,原子團的不斷成長會形 成『核島』,核島之間的縫隙須要填補原子才能使核島彼 此接合而形成整個連續的薄膜,而無法與基板鍵結的原子 則會由基板表面脫離而成為自由原子,這個步驟稱為原子 的吸解』。物理氣相沈積(P V D )與化學氣相沈積(c v d )的差別在於·物理氣相沈積(P V D )的吸附與吸解是物 理性的焱附與吸解作用,而化學氣相沈積(CVD )的吸附 與吸解則是化學性的吸附與吸解反應。 沈積技 晶』、 在積體 圓基板 積過程 的『摻 方法主 供蒸鑛 態的沉 且這個 接。當 產生的 術及沈 『多晶 電路製 ,遙晶 中直接 質分佈 要是由 所需真 積材料 由導電 適當的 熱,置 r逍者 能是『單 膜的沈積 相較於晶 可以在沈 制薄膜中 蒸鍍 組用以提 室内,固 掛瑪内, 流電源相 阻效應所 積參數差 』、或『 程中特別 成長的半 摻雜施體 』,而且 一個用以 空度之真 ’稱為蒸 材料所組 電流通往 於掛蜗内 非結晶』 重要,稱 導體薄膜 或受體, 不包含氧 執行蒸鍍 空系統所 鍍材料, 成的3#蜗 坩堝之後 的蒸鍍材 的結構, 為是『磊 的優點主 因此可以 與破等雜 的蒸鍍室 組成的, 將被放置 ,將與外 ’藉著坩 料將被加 結構可 單晶薄 晶』, 要有: 精確控 質。 ’及一 在蒸鍍 在一只 界的直 堝因電 ,—(1) [Technical field to which the invention belongs] The present invention is a process improvement of a vapor deposition material used for vapor deposition, and is mainly directed to powdery vapor deposition. [Prior art] Method improvement. In the mechanical industry, electronics, and materials used to impart certain characteristics to the semiconductor industry, in order to apply the film (a thin film) to the material, the surface of the material is formed by various methods in the process, generally 2, When this film is subjected to an atomic layer vapor deposition process, the deposition of an atom = specific film is called a vapor deposition process. Since the coating film is used, it is possible to obtain a coating film in which the thickness of the deposited particles is controlled by a person in a layer of 0 to form a structure and a function. The deposition of special thin films that can not be obtained in the balance state is currently the most popular surface treatment method for decorations, tableware, knives, and can be used for processing. It refers to the surface substrate of various metal materials, molds, semiconductor components, etc. On the surface, growth: two hard alloys, ceramic materials, and wafer stage to obtain beautiful wear-resistant, heat-resistant: the process of material-resistant film 'to, can: Γ process, whether there is a mechanism of chemical reaction, the knife is a physical vapor phase Deposition (Physicai): commonly known as physical vapor deposition and chemical vapor deposition = r: r: sition 'abbreviated CVD' is often called chemical vapor deposition. First, the single atoms of the evaporation material of the substrate formed by a series of complicated processes must dissipate the vertical momentum. The single atoms can be "adsorbed" on the substrate. These single atoms will form a thin film on the substrate surface. The single atom formed by the thin film formed by the chemical reaction will be diffused on the surface of the plate. 5 200413550 5. Description of the invention (2) The surface of the plate undergoes a diffusion movement. This phenomenon is called the "surface migration" of adsorption of single atoms. The process of atomic clusters is called "nucleation". After the atomic clusters have reached a certain size, they can continue to grow steadily. Therefore, small atomic groups will tend to aggregate with each other to form a larger atomic group to reduce the overall energy. The continuous growth of atomic groups will form "nuclear islands". The gaps between nuclear islands need to fill the atoms in order for the nuclear islands to join with each other to form a whole. A continuous film, but the atoms that cannot be bonded to the substrate will be detached from the substrate surface and become free atoms. This step is called atomic desorption. " The difference between physical vapor deposition (PVD) and chemical vapor deposition (cvd) is that the adsorption and desorption of physical vapor deposition (PVD) is physical attachment and desorption, while chemical vapor deposition (CVD) Adsorption and desorption are chemical adsorption and desorption reactions. "Deposition technology crystal", "doping method in the integrated round substrate deposition process, the main supply of steam ore state and this connection. When the operation is performed and the system is made of polycrystalline silicon, if the direct mass distribution in the remote crystal is made of the required true product material and the appropriate heat is conductive, the device can be deposited in a single film. The evaporation group in the film is used to raise the difference between the parameters of the phase resistance effect of the current source in the indoor, fixed-mount, or "semi-doped donors specially grown in the process", and one is called the trueness of vacancy. It is important that the current set by the steaming material leads to the non-crystal in the hanging snail. It is called the conductor film or the receiver, and does not contain oxygen. In order to be "the advantages of Lei, it can be composed of broken vapor deposition chambers, will be placed, will be with the outside, and the structure can be single crystal thin crystals by the crucible", it must have: precise quality control. ’And a straight pot that is being vaporized in a circle due to electricity, —

第6頁 200413550 五、發明說明(3) 直到接近蒸鍍材料的熔點 鍍源的蒸發能力將非常強 料原子,我們可以在離蒸 進行薄膜的沉積。 除了上述之真空蒸鍍 常疋以所謂的電子束蒸鑛 on,簡稱EBE )來進行的 法完全一樣,主要的不同 )是利用電子 限在蒸鍍材料 熱,以使進行 目前蒸鍍 低壓環境下加 材料卻因為呈 間有空隙,因 的真空狀態下 因為蒸鍍 位體積内的質 鍍時如果遇到 束來執行蒸 表面極小, 進行薄膜的 方式皆已粉 熱昇華蒸鍍 粉末狀所以 為此空隙造 ’導熱效果 材料呈粉末 量有限,造 需替換蒸鑛 開一次蒸鍍室的門就必須 完蒸鍍材料後又必須一次 不但浪費時間 【發明内容】 本發明之 ’也增加了 附近’此時,原本處於固態的蒸 ’利用這些被蒸發出來的蒸鍍材 鍵源上方不遠處的基板表面上, 法外’在高溫材料的蒸鍍上,通 法(Electron Beam Evaporati 。其基本原理與上述之真空蒸鍍 處,是在於電子束蒸鍍法(ebe 鍍材料加熱,且加熱的範圍可局 以免前者必須對整個蒸鍍 沉積。 τ 末狀之蒸鍍材料裝填至坩鍋,在 材料達到蒸鍍的目的。 亨 =i i 玫,各個蒸錢材料之 成導熱效果不佳,尤其於 不佳的情況更加明顯。“、、鍍時 狀所以其組織較鬆散,所以复m 成替換蒸鍍材料次數增加,一早 材料就必須開蒸鍍室的門,而蒸 做一次降溫與加壓的動而要 抽真空與加溫,如此的動作::與 製程不良的機率。 乍⑽裎 主要目的,在於解決上述之缺失, 避免缺失 200413550 五、發明說明(4) ' ------ 的2在本發明利用係透過一預定壓力、預定溫度與所需 ^ B、間’先將粉末狀的蒸鍍材料壓製成緻密狀,完成壓製 4的蒸,材=於蒸鍍時,由於壓製後的蒸鍍材料較粉末狀 更為緻φ +單位體積可容納更多質量的蒸鑛材料,所以可 =少替換蒸鍍材料的次數,於作業時間上的節省與減少製 程不良率增加的機會皆很有幫助;且由於壓製後的蒸鍍材 料均勾緻密,各個蒸鍍材料之間沒有空隙,因為此空隙造 成導熱效果不佳的情況不存在,即使用壓製後緻密狀的蒸 鍍材料可使各個蒸鍍材料之間的熱傳導效率提高,因為熱 傳^效率的提高使得傳熱速度更快,使得用於加熱上的能 源節省痕有幫助,並由於壓製後緻密狀的蒸鍍材料可於壓 製時控制其結晶性質,因為蒸鍍材料的結晶性質一致使得 加熱功率可以更穩定,於蒸鍍時沉積之薄膜厚度的控制上 可以更加精確。 【實施方式】 有關本發明之詳細說明及技術内容,現就配合圖式說 明如下: 請參閱『第1圖所示』,係本發明之製造流程示意圖 ,如圖所示:本發明係一種蒸鍍方法改良,係透過一預定 壓力、預定溫度與所需之時間,先將粉末狀的蒸鍍材料i 0 壓製成緻密狀,完成壓製後的蒸鍍材料1 〇於蒸鍍時,由於 壓製後的蒸鑛材料1 〇較粉末狀更為敏密,所以蒸鍛室2 〇内 的坩鍋2 1之單位體積可容納更多質量的蒸鍍材料丨〇,且 由於壓製後的蒸鍍材料1 0均勻緻密,可使熱傳導效率提高Page 6 200413550 V. Description of the invention (3) Until the melting point of the vapor deposition material is approached, the evaporation ability of the plating source will be very strong, and we can deposit the film in off-evaporation. Except for the above-mentioned vacuum evaporation, the method is often the same as the so-called electron beam evaporation on (EBE), the main difference is that the electron is limited to the heat of the evaporation material, so that the current evaporation under low pressure environment However, the material is filled with gaps. Therefore, in the vacuum state, if a beam is used to perform the evaporation on the surface of the evaporation layer, the surface of the film is extremely small. The void-making effect material has a limited amount of powder, and it is necessary to replace the ore deposit and open the door of the evaporation chamber once. After the evaporation material has to be finished, it must be time-consuming. [Content of the invention] The present invention also increases the vicinity of this. At the time, the solid-state vapor deposition 'on the surface of the substrate not far above the key source of these evaporated vapor deposition materials was used outside the law' for vapor deposition of high-temperature materials. The basic principle is the same as that of Electron Beam Evaporati. The above-mentioned vacuum evaporation is based on the electron beam evaporation method (ebe plating material is heated, and the heating range can be limited so that the former must not be deposited on the entire vapor deposition). τ Fill the crucible with the final vapor deposition material to achieve the purpose of vapor deposition. Heng = ii Mei, the effect of the thermal conductivity of each steamed material is not good, especially when it is not good. ", when plating The structure is relatively loose, so the number of times to replace the evaporation material is increased. In the early morning, the door of the evaporation chamber must be opened, and the vacuum is heated and vacuumed, and the vacuum is heated. ::: The probability of poor production process. The main purpose of Zha is to solve the above-mentioned shortcomings and avoid them. 200413550 V. Description of the invention (4) '------ The 2 in the present invention uses a predetermined pressure and reservation The temperature and the required ^ B, between the first, the powdery evaporation material is compacted into a dense shape, and the evaporation of the pressing 4 is completed. Material = At the time of evaporation, the pressed evaporation material is more φ + than the powdery material. Unit volume can hold more quality of vapor deposition material, so = less replacement of vapor deposition material is very helpful in saving operating time and reducing the chance of increasing process defect rate; and because of the evaporation material after pressing All dense There is no gap between the evaporation materials, because the gap does not have a good thermal conductivity effect. Even if the compact evaporation material is used after pressing, the heat conduction efficiency between the evaporation materials can be improved because of heat transfer ^ The increased efficiency makes the heat transfer faster, which helps to save energy on the heating traces, and because the compacted vapor-deposited material after pressing can control its crystalline properties during pressing, because the crystallized properties of the vapor-deposited material are consistent The heating power can be more stable, and the thickness of the film deposited during evaporation can be controlled more accurately. [Embodiment] The detailed description and technical content of the present invention will now be described in conjunction with the drawings: Please refer to the "Figure 1" Shown "is a schematic diagram of the manufacturing process of the present invention, as shown in the figure: The present invention is an improvement of a vapor deposition method. The powdered vapor deposition material i 0 is first pressed through a predetermined pressure, a predetermined temperature, and a required time. It becomes dense, and the vapor-deposited material 10 after the pressing is completed. During the vapor deposition, the vapor-deposited material 10 after the pressing is more dense than the powder, so 2 billion in the crucible chamber forging unit 21 can accommodate more of the volume of the mass of the vapor deposition material Shu square, and since the vapor deposition material 10 uniformly pressed compact, can improve the heat transfer efficiency

第8頁 200413550 五、發明說明(5) ,加熱功率更穩定,該蒸鍍方法改良後之蒸鍍詳細步驟包 括有·· a) 取原為粉末狀之蒸鍍材料1〇,透過預定屢力、預定 ’里度與所需時間將粉末狀之蒸鍵材料1 〇壓製 中,該預定壓力為5_⑷平方英寸 寸)、溫度為攝氏20度至120度與時間為2〇分鐘至6〇分鐘, 依所需蒸鍍材料1 0之晶袼形式與緻密程度及不影響蒸鍍材 料1 0性質進行調整,該緻密狀樣態可為顆粒狀或錠^又 b) 請參閱『第2圖所示』,係本發明之蒸鍍示意圖’, 如圖所示:將經過步驟a製程壓製成緻密狀之蒸鍍材料1〇 裝填於惠鍍室20内的坩鍋2 1内,且蒸鍍室2〇内包含一需 蒸鑛方式形成薄膜於其上之基板3〇 ; 而 # 利用一真空系統4〇抽氣使蒸鍍室20内成真空狀態, =:空狀態之真空度依蒸鍍材料! 〇性質與基材性質進行調 d) 利用一加熱裝置50加熱步驟b之蒸鍍材料1〇,使坩 1内之蒸鍍材料1〇昇華成單原子到達基板3〇,單原子 板30表面移動或從基板3〇表面再蒸發,單原子在基 T ^與結合形成沉積物,該沉積物成長與凝 連續之薄膜; ^队 e) 完成蒸鍍程序,基板3〇上形成所需之薄膜。 料所步::iff材料10係為一金屬、有機或無機材 料。1成’而邊基板30為一矽晶圓、金屬、有機或無機材Page 8 200413550 V. Description of the invention (5), the heating power is more stable. The detailed steps of the improved evaporation method include: a) Take the original powdered evaporation material 10, and repeat it through a predetermined force. 1. Predetermine the degree and time required to press the powdered steam-bonded material 10, the predetermined pressure is 5 square inches), the temperature is 20 degrees Celsius to 120 degrees Celsius, and the time is 20 minutes to 60 minutes. Adjust according to the crystal form and compactness of the desired evaporation material 10 and the density of the evaporation material 10, and the compacted state can be granular or ingot ^ and b) Please refer to "Figure 2" "It is a schematic diagram of the evaporation of the present invention ', as shown in the figure: the compacted evaporation material 10 pressed into the crucible 21 in the benefit plating chamber 20 is packed in the step a, and the evaporation chamber 2 〇 includes a substrate 3 on which a thin film is formed by a vapor deposition method; and # uses a vacuum system 40 to draw air to make the evaporation chamber 20 into a vacuum state, =: the degree of vacuum in the empty state depends on the evaporation material! 〇Properties are adjusted with the properties of the substrate d) The evaporation material 1 in step b is heated by a heating device 50 10, the evaporation material in the crucible 10 is sublimated into single atoms to reach the substrate 30, the surface of the single atom plate 30 is moved or re-evaporated from the surface of the substrate 30, and the single atom is combined with the base T ^ to form a deposit. The deposit Grow and condense the thin film; ^ Team e) Complete the evaporation process and form the required thin film on the substrate 30. Material steps: iff material 10 is a metal, organic or inorganic material. 10% 'and the side substrate 30 is a silicon wafer, metal, organic or inorganic material

第9頁 200413550 五、發明說明(6) 惟以上所述者,僅為本發明之較佳實施例,當不能以 之限定本發明實施之範圍,即大凡依本創作申請專利範圍 所作之均等變化與修飾,皆應仍屬本創作專利涵蓋之範圍 200413550 圖式簡單說明 【圖式之簡單說明】 第1圖,係本發明之製造流程示意圖 第2圖,係本發明之蒸鍍示意圖 【圖號說明】 壓製蒸鍍材料成緻密狀.............a 裝填蒸鍍材料至坩鍋.............. b 真空抽氣·..................e 加熱蒸鍵材料.................d 完成蒸鑛·..................ePage 9 200413550 V. Description of the invention (6) However, the above are only the preferred embodiments of the present invention. When the scope of the implementation of the present invention cannot be limited, that is, the equal changes made in accordance with the scope of the patent application for this creation And modification should still fall within the scope of this creation patent. 200413550 Brief description of the drawings [Simplified description of the drawings] Figure 1 is a schematic diagram of the manufacturing process of the present invention. Figure 2 is a schematic diagram of the evaporation of the present invention. [Figure No. Explanation] Press the vapor deposition material to make it dense ......... a Fill the vapor deposition material to the crucible .............. b Vacuum extraction ... ....... e Heating the steam bond material ............................................................................................................................ ......... e

蒸鍍材料...................10 蒸鍍室·>...................20 i# m.............:........2i 基板.....................3 0 真空系統· · .................40 加熱裝置...................50Evaporation material ... 10 Evaporation chamber ... > 20 i # m .............: ........ 2i Substrate .............. 3 0 Vacuum System ... 50 Heating unit ... 50

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Claims (1)

200413550 六、申請專利範圍 【專利申請範圍】 1 · 一種蒸鍍方法改良,係透過一預定壓力、溫度與時 間’先將粉末狀的蒸鍍材料壓製成緻密狀,完成壓製後的 蒸鍵材料於蒸鍍時,由於壓製後的蒸鍍材料較粉末狀更為 緻密,單位體積可容納更多質量的蒸鍍材料,且由於壓製 後的蒸鍍材料均勻緻密,可使熱傳導效率提高,加熱功率 更穩定,該蒸鍍方法改良後蒸鍍步驟包括有: a) 取原為粉末狀之蒸鍍材料,透過預定壓力、溫度與 時間將粉末狀之蒸鍍材料壓製成緻密狀; b) 將經過步驟a製程之蒸鍵材料裝填於蒸鍍室内之財 銷,且惠鍍室内包含一需蒸鍍形成薄膜之基板; c) 利用一真空系統抽氣使蒸鍍室内成真空狀熊,· d) —加熱裝置加熱步驟b之蒸鍍材料,使蒸鍛^材料昇 華成單原子到達基板; "八…、奴 /土、人丄7丨夕w m高&溽腰。 2·如申請專利範圍第丄項所述之一種蒸鍍方法改良 /、中,該蒸鍍材料為一金屬、有機或無機材 3·如申請專利範圍第i項所述之一種蒸链=良 该預^壓力為MOM碌/平方英寸)至500 0 0(崎/平 ^、,依所需蒸鍍材料之晶格形式與緻密程度及 蒸鍍材料性質進行調整。 T度及不影響 4·如申請專利範圍第丄項所述之一種蒸鍍方 ’、,該預定溫度為攝氏20度至120度,依所需$ _ I 之晶格形式與緻密程度及不影響蒸鍵材料性質進二材: 200413550 六、申請專利範圍 5. 如申請專利範圍第1項所述之一種蒸鍍方法改良, 其中,該預定時間為2 0分鐘至6 0分鐘,依所需蒸鍍材料之 晶格形式與緻密程度及不影響蒸鍍材料性質進行調整。 6. 如申請專利範圍第1項所述之一種蒸鍍方法改良, 其中,該敏密狀樣態可為顆粒狀或鍵狀。 7. 如申請專利範圍第1項所述之一種蒸鍍方法改良, 其中,該基板為一矽晶圓、金屬、有機或無機材料。200413550 VI. Scope of patent application [Scope of patent application] 1 · An improved vapor deposition method is to first compact the powdered vapor deposition material into a compact shape through a predetermined pressure, temperature and time, and then complete the pressing of the vapor bonding material. During vapor deposition, since the vapor-deposited material after pressing is denser than powder, more mass of vapor-deposited material can be accommodated per unit volume, and because the vapor-deposited material after pressing is uniform and dense, the heat conduction efficiency can be improved and the heating power can be more It is stable, and the evaporation step after the improvement of the evaporation method includes: a) taking the powdery vapor deposition material and pressing the powdery vapor deposition material into a dense shape through a predetermined pressure, temperature and time; b) going through the steps a. The vapor-bonding material of the manufacturing process is filled in the evaporation room, and the benefit room contains a substrate that needs to be evaporated to form a thin film; c) using a vacuum system to pump down the evaporation room into a vacuum bear, · d) — The heating device heats the vapor deposition material in step b, so that the vapor-forged material is sublimated into a single atom and reaches the substrate; " Eighth, slave / earth, person, 7 wm high & waist. 2 · Improvement of a vapor deposition method as described in item 申请 of the scope of patent application /, the vapor deposition material is a metal, organic or inorganic material 3. · A vaporization chain as described in item i of the scope of patent application = good The pre-pressing pressure is from MOM / square inch) to 50000 (Saki / flat), and it is adjusted according to the lattice form and density of the desired evaporation material and the properties of the evaporation material. T degree and does not affect 4 · According to a type of vapor deposition method described in item (1) of the scope of patent application, the predetermined temperature is 20 degrees Celsius to 120 degrees Celsius, which is further increased according to the required lattice form and compactness of $ _I and does not affect the properties of the vapor-bonding material. Material: 200413550 6. Scope of patent application 5. An evaporation method improvement as described in item 1 of the scope of patent application, wherein the predetermined time is 20 minutes to 60 minutes, depending on the lattice form of the desired evaporation material It can be adjusted to the degree of compactness and not affect the properties of the vapor deposition material. 6. An improvement of a vapor deposition method as described in item 1 of the scope of patent application, wherein the dense state can be granular or bonded. 7. Such as An improvement of a vapor deposition method described in the first patent application scope, The substrate is a silicon wafer, metal, organic or inorganic material. 8. 如申請專利範圍第1項所述之一種蒸鍍方法改良, 其中,該真空狀態之真空度依蒸鍍材料性質與基材性質進 行調整。8. An evaporation method improvement as described in item 1 of the scope of patent application, wherein the degree of vacuum in the vacuum state is adjusted according to the properties of the evaporation material and the properties of the substrate. 第13頁Page 13
TW92101755A 2003-01-28 2003-01-28 Improvement for vapor deposition method TW200413550A (en)

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