TW200411168A - Probe detection device - Google Patents

Probe detection device Download PDF

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Publication number
TW200411168A
TW200411168A TW91137444A TW91137444A TW200411168A TW 200411168 A TW200411168 A TW 200411168A TW 91137444 A TW91137444 A TW 91137444A TW 91137444 A TW91137444 A TW 91137444A TW 200411168 A TW200411168 A TW 200411168A
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Taiwan
Prior art keywords
probe
base
optical fiber
detection device
probe base
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TW91137444A
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Chinese (zh)
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TW571091B (en
Inventor
Nan-Chian Shie
Kuai-Kai Chang
Tsan-Lin Chen
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Ind Tech Res Inst
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Publication of TW200411168A publication Critical patent/TW200411168A/en

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Abstract

There is provided a probe detection device, in which light emitted from fiber is adjusted to project on the front position of the suspension arm of the probe, so as to increase the sensitivity of light detection. The probe detection device includes a fixing seat having a first position and a second position; a fiber connector arranged on the fixing seat for emitting light; a probe base sliding arranged between the first position and second position of the first fixing seat, wherein the probe base has a through hole and the fiber connector passes through the through hole; and a probe arranged on the probe base via the suspension arm.

Description

200411168 五、發明說明(1) 發明所屬之技術領域 本發明有關於一種探針檢測裝置,-特別有關一種利用 可移動式之探針基座,調整光纖射出之光線打在探針之懸 臂前端位置,以..提高光偵測之靈敏度。 先前技術 目前習用商品化掃描探針顯微鏡的探針座結構,本身 因結構及定位方法限制,只有單一機械式定位中心。’因此, 習用商品化掃描探針顯微鏡所提供不同掃瞄方法中,往往 只有一種掃猫方法可獲得最強光干涉訊號變化及較佳表面 特徵檢測影像結果。 如第1圖所示,目前習用掃描探針顯微鏡干涉儀架構, 基本上是由雷射光源1,光偵測器2及探針座3所組成;其 中,雷射光i入射光纖端面;反射光Γι以及Γ2分別為光纖端 面的反射光,以及由懸臂背面反射回光纖的反射光;光纖 與探針間隙L,光偵測器的干涉訊號強度I。 干涉訊號可由簡化之雙光束干涉模式進行訊號分析, 得出干涉訊號強度"I",如式(1)所示 /= A + +2^/¾ cosΔ〆---------------------------(1) ' A 4 moiyL! Λ ’ 其中I!, 12分別為反射光""及反射光,,r2 "訊號強 度;nair為空氣折射率,又為雷射光波長。 第2圖為干涉訊號強度變化示意圖。其顯示探針在同200411168 V. Description of the invention (1) The technical field of the invention The present invention relates to a probe detection device, in particular to a movable probe base for adjusting the position of light emitted by an optical fiber to hit the front end of a cantilever of a probe , .. to enhance the sensitivity of the photodetector. Prior art Currently, the probe base structure of a commercial scanning probe microscope is conventionally limited by a single mechanical positioning center due to the limitation of the structure and the positioning method. ’Therefore, among the different scanning methods provided by conventional commercial scanning probe microscopes, there is often only one cat scanning method to obtain the strongest light interference signal change and better surface feature detection image results. As shown in FIG. 1, the current conventional scanning probe microscope interferometer architecture, consists essentially of the laser beam source 1, the light detector 2 and the probe holder 3; wherein, i laser beam incident end face of the optical fiber; reflected light Γ2 Γι reflected light and the fiber end faces, respectively, and the light reflected by the back surface of the cantilever reflected back to the optical fiber; fiber strength of the interference signal and the probe clearance L, the photodetector I. The interference signal can be analyzed by the simplified two-beam interference mode, and the interference signal intensity " I " is obtained, as shown in formula (1) / = A + + 2 ^ / ¾ cosΔ〆 --------- ------------------ (1) 'A 4 moiyL! Λ' where I !, 12 are reflected light " " and reflected light, r2 " signal strength; Nair is the refractive index of air, and the wavelength of the laser light. Figure 2 is a schematic diagram of the interference signal intensity change. It shows that the probe is in the same

200411168 五、發明說明(2) 樣變形位移時,光點I較靠近探針懸臂前端,則光纖與探 針間隙變化區域D1較大,因此干涉訊號^強度變化程度較 明顯,而光點Π離探針尖端較遠,則光纖與探針間隙變化區 域D2較小,因此干涉訊號的強度變化較不明顯。 由式(1 )及第2圖得知探針懸臂形變所造成的干涉訊號 強度變化除了與雷射光波長有關之外,雷射光點在探針懸 臂的位置也是一個重要因素,因而探針座也將具有重要的 地位。 第3圖為習用探針座結構,為固定式,不論探針座3或 疋光纖連接器4皆不可相對移動。因不同的掃瞄方法,需採 用不同長度的掃描探針,如接觸模式(C〇nfact mode)的探 針長度為450 /zm而振動模式(Tap ping m〇(ie)的探針長度為 2 2 5 β m 〇 目前’探針座在設計時為了確保不同長度的掃瞄探針 均可產生干涉訊號,故均以最短探針長度作為設計參考依 據,並利用圓形定位孔與圓形光纖連接器,將探針以及光 ί it器位定所以傳統上,探針座由鏡面反射回光纖的 景Μ象由2粮臂皆Γ相同位置。因此若利用接觸模式掃瞄 ‘的’产斜:劈&,射回光纖的反射光h位置並非位於最 ί由ί2圖别端,置,而是位於探針懸臂中央位置。 ,光纖:Λ知探針中央位置並非最佳鏡面反射回 涉訊號變化並非最佳化。長探針在S用探針座所伴隨干200411168 V. Description of the invention (2) When the light spot I is closer to the front end of the probe cantilever, the change area D1 of the gap between the optical fiber and the probe is larger, so the intensity of the interference signal ^ is more obvious, and the light spot Π The farther the probe tip is, the smaller the change area D2 of the gap between the optical fiber and the probe is, so the intensity change of the interference signal is less obvious. It is known from equation (1) and Fig. 2 that the intensity change of the interference signal caused by the deformation of the cantilever of the probe is not only related to the wavelength of the laser light, but the position of the laser light point on the cantilever of the probe is also an important factor. Will have an important place. Fig. 3 shows the structure of a conventional probe base, which is a fixed type. No matter whether the probe base 3 or the 疋 optical fiber connector 4 cannot move relative to each other. Due to different scanning methods, scanning probes with different lengths are required. For example, the length of the probe in the contact mode is 450 / zm and the length of the probe in the vibration mode (Tap ping m〇 (ie) is 2). 2 5 β m 〇 At present, in order to ensure that scanning probes of different lengths can generate interference signals during the design of the probe base, the shortest probe length is used as the design reference, and the circular positioning hole and the circular optical fiber are used. The connector, the probe and the optical device are positioned so traditionally, the probe base is reflected back to the optical fiber by the mirror. The image is from the same position as the two arms. Therefore, if you use the contact mode to scan the 'production oblique' : Split &, the position of the reflected light h that is reflected back to the fiber is not located at the other end of the figure, but is located at the center of the probe cantilever., Fiber: The center position of the probe is not the best mirror reflection Signal changes are not optimized. Long probes are accompanied by interference in the S probe holder.

200411168 五、發明說明(3) --*—^- 發明内容 有鑑於此,本發明的目的就在於,&供一種探針檢測 裝置,可調整光纖射出之光線打在探針懸臂之前端位置, 以提高光偵測之t敏度,包括··一固定座,具有一第一位 置以及一第二位置;一光纖連接器,設置於上述固定座, 用以發出光線;一探針基座,以可滑動方式設置於上述固 定座之上述第一位置與上述第二位置之間,其中上述探針 基座具有一通孔,上述光纖連接器通過上述通孔;一探 針,以懸臂方式設置於上述探針基座❶ 根據本發明,將連接有探針之探針基座在固定座之兩位置 之間滑動,可配合使用探針之長短,將光纖連接器發射出 之光線,打在探針懸臂之尖端位置,提高光干涉訊號之強 度變化,使探針影像掃描的解析度提高。 為了讓本發明之上述和其他目的、特徵、和優點妒 明顯易懂,下文特舉一較佳實施例,並配合所附圖示, 詳細說明如下: 實施方式 第一實施例 ψ 請參閱第4圖,係本發明第一實施例之探針檢測 ,剖面圖,包括:一固定座1〇,具有一第一位置A以及—第 、位置B ’ 一光纖連接器20,設置於固定座1〇,用以發出 光線,一探針基座3〇,以可滑動方式設置於固定座1〇之上200411168 V. Description of the invention (3)-*-^-Summary of the invention In view of this, the object of the present invention is to provide a probe detection device that can adjust the position of the light emitted by the optical fiber to hit the front end of the probe cantilever. In order to improve the sensitivity of light detection, it includes: a fixed base having a first position and a second position; an optical fiber connector arranged on the fixed base to emit light; a probe base Between the first position and the second position of the fixed base in a slidable manner, wherein the probe base has a through hole through which the optical fiber connector passes through the through hole; a probe is provided in a cantilever manner On the above probe base❶ According to the present invention, the probe base to which the probe is connected is slid between two positions of the fixed base, and the length of the probe can be used to match the light emitted by the optical fiber connector to the position of the probe tip of the boom, increasing the strength of the interference signal of the light changes, the image of the probe scanning to improve resolution. In order to make the above and other objects, features, and advantages of the present invention obvious and easy to understand, a preferred embodiment is given below in conjunction with the accompanying drawings, and the detailed description is as follows: Implementation Embodiment First Embodiment ψ Please refer to Section 4 The figure is a probe detection and cross-sectional view of the first embodiment of the present invention, including: a fixed base 10, having a first position A and a first, position B '; an optical fiber connector 20, which is arranged on the fixed base 10. To emit light, a probe base 30 is slidably arranged on the fixed base 10

200411168200411168

述第一位置A與上述第二位置B之間,其 一通孔31,且光纖連接器20通過通孔3厂;一 ^座3〇具有 臂方式設置於探針基座30。 t32’以懸 如第4圖所係顯示一較短之非接 設於該探針基座3。。其中,通孔31之剖面為長T裝 餘隙4〇,可供探針基座3G滑動時,光纖連接器2 2Between the first position A and the second position B, a through-hole 31 is provided, and the optical fiber connector 20 passes through three through-hole factories; a base 30 has an arm type and is disposed on the probe base 30. t32 'shows a short non-connected to the probe base 3 as shown in Fig. 4. . Among them, the cross-section of the through hole 31 has a long T mounting clearance 40, which can be used for the optical fiber connector 2 2 when the probe base 3G slides.

阻礙。因…一般常使用的接觸式探針 針為例分別為450 ,以及225 „長度之探針,兩 度相差22 5/zm,因此,探針基座3〇的可移動範圍至少 225 /ζιη,則通孔31在移動方向至少保留225 之餘隙。 此外,在本實施例中,使用較短之非接觸式探針32 , 則探針基座30位於第一位置a,再利用一固定部,將該探 針基座30定位,防止探針基座3〇在操作過程中滑動;/其 中’該固定部可為本實施例所採用之螺絲3 3。 第5圖係本實施例中探針基座之上視圖。此探針基座 30兩邊均設置有一螺絲33,用以頂住光纖連接器2〇以幫助 探針基座定位。 如第6圖所示,為本實施例之使用短探針狀態之上視 圖’顯示光纖連接器20與通孔31之關係。在使用較短的探 針32時’探針基座30移到第一位置a,,則餘隙產生在左 痛· 邊’因此,螺綠3 3由左邊將探針基座3 〇與光纖連接器2 〇鎖 ,固。 再如第7圖所示,在本實施例中,使用較長之接觸式 探針3 2,則探針基座3 0位於第二位置b,再利用一固定Hinder. Because ... the contact probe needles that are commonly used are 450 and 225 length probes, for example, the difference between the two degrees is 22 5 / zm, so the movable range of the probe base 30 is at least 225 / ζιη, Then, the through hole 31 has a clearance of at least 225 in the moving direction. In addition, in this embodiment, when a short non-contact probe 32 is used, the probe base 30 is located at the first position a, and then a fixing portion is used. , Positioning the probe base 30 to prevent the probe base 30 from sliding during operation; / Among them, the fixing portion may be the screw 33 used in this embodiment. Fig. 5 is a probe in this embodiment. A top view of the needle base. Screws 33 are provided on both sides of the probe base 30 to support the optical fiber connector 20 to help the probe base be positioned. As shown in FIG. 6, it is used in this embodiment. The top view of the short probe state 'shows the relationship between the optical fiber connector 20 and the through-hole 31. When a shorter probe 32 is used,' the probe base 30 moves to the first position a, and the clearance is generated in the left pain · Side ', therefore, the screw green 3 3 locks the probe base 3 〇 and the fiber connector 2 〇 from the left. As shown, in this embodiment, using a longer contact probe 32, the probe base 30 is located at the second position b, and a fixed

200411168200411168

部,將該探針基座30定位,防止探針基座3〇在操作過程中 滑動;其中,該固定部可為本實施例所-採用之螺絲33 ^ 如第8圖所示,為本實施例之上視圖,顯示光纖連接 器2 0與通孔3 1之關係。在使用較長的探針3 2時,探針基座 30移到第二位置B ,則餘隙產生在右邊,因此,螺絲33由 右邊將探針基座30與光纖連接器20鎖固。 第二實施例 如第9圖所示,為本發明之第二實施例剖面圖。在此 實施例中,探針基座之位置,為可調整式,並不限於兩個 位置,而是可以隨時調整探針位置,適用於頻繁替換多種 類探針的使用者·’此種探針檢測裝置與前一實施例類似, 亦包括·一固定座1〇,具有一第一位置A以及一第二位置 B ; —光纖連接器20,設置於固定座1〇,用以發出光線; 一探針基座30,以可滑動方式設置於固定座1〇之上述第’一 位置A與上述第二位置b之間,其中探針基座3〇具有一通孔 31,且光纖連接器20通過通孔31 ; —探針32,以懸臂方式 設置於探針基座30 〇唯,其固定部,係一調整螺絲33,^ 合一滑軌34,帶動探針基座30移動,使得螺絲33可將探針 基座30調整至適當位置,使光纖連接器2〇之光線打在探針 32懸臂尖端,並利用螺絲33以及彈簧35,固定探針基座 再如第1 0圖所示,為本實施例之上視圖。顯示光纖連 接器2 0與通孔31之關係。在此實施例中,通孔3 1呈方形Positioning the probe base 30 to prevent the probe base 30 from sliding during operation; among them, the fixing part can be the screw 33 used in this embodiment-as shown in Fig. 8, this The top view of the embodiment shows the relationship between the optical fiber connector 20 and the through hole 31. When a longer probe 32 is used, the probe base 30 is moved to the second position B, and a clearance is generated on the right side. Therefore, the screw 33 locks the probe base 30 and the optical fiber connector 20 from the right side. , The second embodiment of the present invention a cross-sectional view of an embodiment of the second embodiment as shown in FIG. 9. Embodiment, the base of the position of the probe, is adjustable, the position is not limited to two, but may be any time to adjust the probe position, for frequent replacement of the user-types of probes' in this embodiment such probe The needle detection device is similar to the previous embodiment, and also includes a fixed base 10 having a first position A and a second position B; an optical fiber connector 20 disposed on the fixed base 10 for emitting light; a probe base 30, slidably disposed between the first fixing base 'a 1〇 of a position and the second position b, where a probe having a base 3〇 through hole 31, and the optical fiber connector 20 Through the through hole 31;-the probe 32, cantilevered on the probe base 30. The fixing part of the probe base 30 is connected with an adjusting screw 33 and a slide rail 34, which drives the probe base 30 to move the screw 33 The probe base 30 can be adjusted to an appropriate position, so that the light of the optical fiber connector 20 hits the cantilever tip of the probe 32, and the probe base is fixed by using the screw 33 and the spring 35, as shown in FIG. 10 , the present embodiment over the embodiments view. The relationship between the optical fiber connector 20 and the through hole 31 is shown. In this embodiment, the through hole 31 in a square

200411168 五、發明說明(6) ϊ mm同樣以最長探針以及最短探針之長度 Si移= 最短的探針32時'探針基座3。在滑 ’則餘隙產生在左邊,因此,螺 固定住,防止其晋動Z反方向之推力,將探針基座30 3 ί二Ϊ 同時調整螺絲33之背隙問題;因 此,在此第二實施例中,批 ^ 口 且以螺絲33以及彈針基座3G可於滑軌35上移動’ 適用於兩種以上長而不僅限於兩個位置’故 雖然本發明已以知彳土也 限定本發明,任何心:二:例揭露如上,然其並非用以 和範圍内,當可作藝者’在不脫離本發明之精神 範圍當視後附之申動與潤飾’因此本發明之保護 Τ明專利範圍所界定者為準。200411168 V. Description of the invention (6) ϊ mm is also the length of the longest probe and the shortest probe. Si shift = when the shortest probe is 32 'probe base 3. When slipping, the clearance is generated on the left. Therefore, the screw is fixed to prevent it from pushing the thrust in the opposite direction of Z. At the same time, the probe base 30 3 ί 2Ϊ is adjusted at the same time as the backlash of the screw 33. Therefore, here In the second embodiment, the screw port 33 and the spring pin base 3G can be moved on the slide rail 35. 'Applicable to two or more lengths and not limited to two positions'. Therefore, although the present invention has been limited to the present invention, any heart: two: the above disclosed embodiment, they are not used and the range, when the arts may be protected by the present invention therefore 'without departing from the spirit and scope of the present invention when attached to the movable rear-view application and alterations' the patentable scope defined Τ out their equivalents.

第10頁 200411168 圖式簡單說明 -------- 第1圖係習用持描探針顯微鏡干涉儀架構; 第2圖係干涉訊號強度變化示意圖f . 第3圖係習用探針檢測裝置結構剖面圖; 第4圖係本發明第一實施例探針檢測裝置使用短探 狀態下之剖面圖; 第5圖係本發明第一實施例探針基座之上視圖; 第6圖係本發明第一實施例探針檢測裝置使用短探針 狀態下之上視圖; 第7圖係本發明第一實施例探針檢測裝置使用長探針 狀態下之剖面圖; 第8圖係本發明第一實施例探針檢測裝置使用長探針 狀態下之上視圖; 第9圖係本發明第二實施例探針檢測裝置使用最短探 針狀態下之剖面圖; 第1 〇圖係本發明第二實施例探針檢測裝置使用最短探 針狀態下之上視圖。 符號說明 1〜光源; 2〜光偵測器; 3〜探針檢測裝置; 4、20〜光纖連接器; 1 0〜固定座; 30〜探針基座;Page 10 200411168 Brief description of the diagram -------- Figure 1 shows the structure of a conventional probe microscope interferometer; Figure 2 shows the intensity change of the interference signal f. Figure 3 shows the conventional probe detection device. Sectional view of the structure; FIG. 4 is a cross-sectional view of the probe detection device of the first embodiment of the present invention in a short detection state; FIG. 5 is a top view of the probe base of the first embodiment of the present invention; Top view of the first embodiment of the invention when the probe detection device uses a short probe; FIG. 7 is a cross-sectional view of the first embodiment of the invention when the probe detection device uses a long probe; FIG. 8 is the first embodiment of the invention Top view of a probe detection device in an embodiment using a long probe; FIG. 9 is a cross-sectional view of a probe detection device in a second embodiment of the present invention using a shortest probe; FIG. 10 is a second view of the present invention shortest probe above the lower view of a probe state detection apparatus embodiment. Explanation of symbols 1 ~ light source; 2 ~ light detector; 3 ~ probe detection device; 4,20 ~ optical fiber connector; 10 ~ fixed base; 30 ~ probe base;

第11頁 200411168Page 11 200411168

Claims (1)

200411168200411168 1 •一種探針檢測裝置,包括: 一固定座,具有一第一位置以及一始二位置; 一探針基座,以可滑動方式設置於該第一位置與該第 二位置之間,其中該探針基座具有一通孔; 、 、一光纖連接器,設置於該固定座,通過該探針基座之 該通孔;以及 时一探針’以懸臂方式設置於該探針基座,且該光纖連 接器射出之光線投射在該探針上。 2·如申請專利範圍第1項所述之探針檢測裝置,其中 該光纖連接器通過該通孔並且留有一餘隙。 3·如申請專利範圍第2項所述之探針檢測裝置,其中 該餘隙大於或等於該探針基座由該第一位置移動到該第二 位置之距離。 4·如申請專利範圍第1項所述之探針檢測裝置,其更 包括一固定部設置於該探針基座,用以固定該探針基座之 位置。 5 ·如申请專利範圍第4項所述之探針檢測裝置,豆 中,該固定部包括一螺絲,設置於該探針基座,以銷 該探針基座於該第一位置或第二位置。座用以鎖固 6·如申請專利範圍第4項所述之,探針檢測裝置,其 中,該固定部包括: 、 一螺絲;設置於該探針基座; 一滑軌,該探針基座於該滑軌上移動;以及 一彈簧’設置於該滑軌上,該探針基座與該光纖連接1 • A probe detection device comprising: a fixed base having a first position and a first two position; a probe base slidably disposed between the first position and the second position, wherein The probe base has a through hole;,, and an optical fiber connector, which are disposed in the fixing base and pass through the through hole of the probe base; and a probe is provided in the probe base in a cantilever manner, And the light emitted from the optical fiber connector is projected on the probe. 2. The application of the probe detecting means patentable scope of item 1, wherein the fiber optic connector through the through hole and a clearance is left. 3. The probe detection device according to item 2 of the scope of patent application, wherein the clearance is greater than or equal to the distance that the probe base moves from the first position to the second position. 4. The probe detection device according to item 1 of the scope of patent application, further comprising a fixing portion provided on the probe base for fixing the position of the probe base. 5. The probe detection apparatus according to item 4 of the patent application range, beans, the fixing part includes a screw disposed in the probe base to the base of the probe pin to the first position or the second position. The base is used for locking 6. As described in item 4 of the patent application scope, a probe detection device, wherein the fixing portion includes: a screw; provided on the probe base; a slide rail, the probe base mobile seat on the slide; and a spring 'disposed on the rail, the base is connected to the optical fiber probe 〇729-9339TlV(Nl);07910031; ri ta.ptd 第 13 頁 200411168 六、申請專利範圍 器之間,其中,該螺絲係用以將該探針基座自該第一位置 推移到該第一位置與該第二位置之間,k得該光纖連接器 射出之光線投射在該探針之尖端,且利用該彈簧將該探針 基座壓向該第一位置,防止該探針基座滑動。〇729-9339TlV (Nl); 07910031; ri ta.ptd page 13 200411168 6. Between patent application scope, wherein the screw is used to move the probe base from the first position to the first Between the position and the second position, the light emitted by the optical fiber connector is projected on the tip of the probe, and the spring is used to press the probe base to the first position to prevent the probe base from sliding . 0729-9339TW(Nl);07910031;rita.ptd 第 14 頁0729-9339TW (Nl); 07910031; rita.ptd page 14
TW91137444A 2002-12-26 2002-12-26 Probe detection apparatus TW571091B (en)

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