TW200403788A - Carrier head with flexible membrane - Google Patents

Carrier head with flexible membrane Download PDF

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Publication number
TW200403788A
TW200403788A TW92107941A TW92107941A TW200403788A TW 200403788 A TW200403788 A TW 200403788A TW 92107941 A TW92107941 A TW 92107941A TW 92107941 A TW92107941 A TW 92107941A TW 200403788 A TW200403788 A TW 200403788A
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Taiwan
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elastic film
substrate
patent application
item
scope
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TW92107941A
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Chinese (zh)
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TWI314763B (en
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Hung-Chih Chen
Steven M Zuniga
Ramakrishna Cheboli
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Applied Materials Inc
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  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

A carrier head for chemical mechanical polishing of a substrate has a flexible membrane extending beneath a base to define a chamber. The flexible membrane provides a substrate receiving surface, and can be configured so that a pressure profile applied to a substrate is substantially insensitive to retaining ring wear.

Description

200403788 玖、發明說明 【發明所屬之技術領域】 薄膜之化學機械研磨承戴 本發明係關於一種包含彈性 頭,以及相關方法。 【先前技術】 典型的積體電路藉由導電層、200403788 发明. Description of the invention [Technical field to which the invention belongs] Chemical mechanical polishing support of thin films The present invention relates to a method including an elastic head and related methods. [Prior art] A typical integrated circuit uses a conductive layer,

序沉積而成形於基材,尤其是矽曰冑曰或絕緣層的食 之後,接著進行…產生電:二之當每-層⑼ 依序經過沉積和餘刻,該基材的曝光面遂… 層1 +疋面逐漸便得不平扭, 此一不平坦表面將於該積體電 一 表程的光微影步驟中產4 問題,因此有需要定期將該基材平垣化。 一種眾所接受的平坦化方 疋化學機械研磨(CMP), 此平坦化方法通常要求將該基材安裂在承載器或者研磨, 上,而該基材的曝光面則面對-個活動研磨表面,嬖如孩 ㈣磨些片,該研磨墊片可以是具傷耐久粗糙表面的,,稍Sequentially deposited and formed on the substrate, especially after the silicon layer or the insulating layer is eaten, and then proceeded to ... Generate electricity: Erzhi, when each layer of the layer is sequentially deposited and etched, the exposed surface of the substrate is then ... The layer 1 + surface gradually becomes uneven. This uneven surface will produce 4 problems in the photolithography step of the integrated electric meter, so it is necessary to periodically flatten the substrate. An accepted planarization chemical mechanical polishing (CMP) method. This planarization method usually requires the substrate to be cracked on a carrier or abrasive, and the exposed surface of the substrate faces a movable abrasive. The surface, such as rubbing some pieces, the abrasive pad can have a durable and rough surface.

準”研磨墊片或是具備内含研磨顆粒的,,固定磨料,,研磨雙 片,該承載頭施加該基材一種可控制的負載而將其推向 研磨墊片,至少包含一種化學活性成分的研磨漿(p〇Hshin slurry) ’以及當使用標準研磨墊片時,研磨顆粒則供應結 該研磨墊片的表面。 有些承栽頭包含一種彈性薄膜,該彈性薄膜具備一個 接收基材的安裝表面,該彈性薄膜後面的艙室受壓導致該 薄膜向外擴張,因而施加負載於該基材,許多承載頭同時 3 200403788 包含一種護圈(retaining ring)圍繞該基材,譬如用以固定 該承載頭内的基材於該彈性薄膜下方。 【發明内容】 就某一樣態來說’本發明係針對一種用於基材化學機 械研磨之承載頭,該承載頭包含一個基部以及一個彈性薄 膜’該彈性薄膜延伸於該基部下方而形成一個艙室而且提 供一個基材接受表面。 通常就某一樣態來說’本發明的特徵是一種用於基材 化學機械研磨之承載頭’該承載頭包含一個基部、一個圍 繞基材接受表面上基材之護圈以及一個彈性薄膜,該彈性 薄膜延伸於該基部下方而形成一個艙室並提供該基材接受 表面,而且該彈性薄膜可加以規劃配置而使得施加於基材 的壓力剖面能大致上不受護圈磨耗影響。 特殊的實施例可包含下列一或數個特徵,該彈性薄膜 可包含一個具備基材接受面的中心部分,以及一個具備第 一端點(first end)的彎曲部分’該第一端點與該基部結合 使有效負載面積得以隨著該彎曲部的第一端點和該中心部 之間距離縮減而減小。 通常就另一樣態來§兒’本發明的特徵是一種用於基材 化學機械研磨之承載頭,該承載頭包含一個基部以及一個 彈性薄膜’該彈性薄膜延伸於該基部下方而形成一個艙室 並提供該基材接受表面,該彈性薄膜可包含一個具備基材 接受面的中心部分’以及一個具備第一端點的彎曲部分, 4 200403788 該苐一端點則連接該基部。 本發明的特殊實施例可包含下列一或數個特徵,該彎 曲部可直接或間接連接該基部,該第一端點與該基部結合 使有效負载面積得以隨著該彎曲部的第一端點和該中心部 之間距離縮減而減小,該彈性薄膜亦可包含該中心部邊緣 的一個週邊部分(perimeter portion),該週邊部分比該中 心部較不受制於變形,同時該週邊部分亦可連接一個内部 薄膜夾持及/或支撐元件。 該彈性薄膜可進一步包含一個延伸(extensi〇n)部分, 該延伸部連接該週邊部和該彎曲部的第二端點,該彎曲部 的第一端點可以成輻射狀在該彎曲部的第二端點内側,同 時該延伸部可向内拉引。 該承載頭可包含一個圍繞該基材接受表面上基材之護 圈,該延伸部可以移動而使施加於基材的壓力剖面能大致 上不受護圈磨耗影響,該延伸部亦可旋轉而導致施加於該 週邊部的有效負载面積減小,同時使至少一部分護圈磨耗 引起的該薄膜邊緣所增加之負載得以抵銷(〇ffset)。 該承載頭可包含兩個彎曲部,其中每一個都有一第一 端點連接該基部,該彈性薄膜亦可包含一個連接内部薄膜 夾持的週邊部分,該内部薄膜夾持緊鄰該二彎曲部當中較 低者,並且容許該二f曲部當中較低者可以自由活動,該 二彎曲部亦可定義該承載頭内兩個壓力艙(chamber pressure) ° 通常就另一樣態來說,本發明的特徵是一種配合基材 5 200403788 化學機械研磨裝置之承載頭使用的彈性薄膜,該彈性薄膜 可包含一個具備基材接受面的中心部分,以及一個具備第 一端點的彎曲部分,該第一端點則連接該承载頭之基部, 該彎曲部則經規劃而使該中心部施加於基材的壓力剖面能 大致上不受制於該中心部垂直位置相對於該彎曲部第一端 點之垂直運動。 本發明的特殊實施例可包含下列一或數個特徵,該彈 性薄膜亦可包含一個週邊部分,該週邊部分使該彎曲部之 第二端點連接該中心部,該週邊部分比該中心部較不受制 於變形,同時該週邊部分亦可連接一個内部薄膜炎持。 該彈性薄膜亦可包含一個延伸部分,該延伸部使該週 邊部連接該彎曲部之第一端點,該延伸部受到該彎曲部拉 引時可以轉動,該彎曲部可包含兩個彎曲部,該彈性薄膜 亦可包含一個週邊部分,該週邊部連接一個内部薄膜夾 持,同時使每一彎曲部的第二端點連接至該中心部,該内 部薄膜夾持緊鄰該二彎曲部當中較低者,並且容許該二蠻 曲部當中較低者可以自由活動。 通常就另一樣態來說,本發明的特徵是一種研磨基材 的方法,該方法包含安裝基材於一個化學機械研磨裝置的 承載頭上,使得該基材的一個第一面鄰接該承載頭,該承 載頭包含一個基部、一個護圈和一個彈性薄膜,該彈性薄 膜包含一個中心部以提供該基材一個安裝面,並且使用一 個研磨墊片研磨該基材,其中該研磨墊片與該基材的一個 第一面接觸,而該基材的第二面則與該基材的第一面相 6 200403788 對。研磨時,該彈性薄膜可以移動而使施加於基材的壓力 剖面能大致上不受護圈磨耗影響。The "quasi" grinding pad or a grinding pad containing abrasive particles, a fixed abrasive, and a grinding pad, the carrier head applies a controlled load of the substrate and pushes it towards the grinding pad, which contains at least one chemically active ingredient Pohshin slurry 'and when standard abrasive pads are used, abrasive particles are supplied to the surface of the abrasive pads. Some carriers include an elastic film with a mount that receives the substrate On the surface, the chamber behind the elastic film is compressed to cause the film to expand outwards, so that a load is applied to the substrate. Many carrier heads 3 200403788 include a retaining ring around the substrate at the same time, for example, to fix the load. The substrate in the head is below the elastic film. [Summary of the Invention] In a certain aspect, the present invention is directed to a carrier head for chemical mechanical polishing of a substrate. The carrier head includes a base and an elastic film. An elastic film extends below the base to form a compartment and provides a substrate-receiving surface. Usually for a certain state ' The invention features a carrier head for chemical mechanical polishing of a substrate. The carrier head includes a base, a retaining ring surrounding the substrate on the receiving surface of the substrate, and an elastic film which is formed below the base. A compartment provides the substrate receiving surface, and the elastic film can be configured so that the pressure profile applied to the substrate can be substantially unaffected by the wear of the retainer. Special embodiments may include one or more of the following features, The elastic film may include a central portion having a substrate receiving surface, and a curved portion having a first end. The first end is combined with the base portion so that a payload area can follow the curved portion. The distance between the first end point and the center portion is reduced and reduced. Generally, in another aspect, the invention is characterized by a carrier head for chemical mechanical polishing of a substrate, the carrier head comprising a base portion and a Elastic film 'The elastic film extends below the base to form a compartment and provides the substrate receiving surface. The elastic film can It includes a central portion with a substrate receiving surface 'and a curved portion with a first end point. The first end point is connected to the base portion. A particular embodiment of the present invention may include one or more of the following features, the curved portion The base portion can be directly or indirectly connected to the base portion. The combination of the first end point and the base portion allows the payload area to decrease as the distance between the first end point of the curved portion and the center portion decreases. The elastic film can also be A peripheral portion including the edge of the central portion is less subject to deformation than the central portion, and the peripheral portion may also be connected with an internal film holding and / or supporting element. The elastic film may further Including an extension (extension), the extension connecting the peripheral portion and the second end of the curved portion, the first end of the curved portion may be radially inside the second end of the curved portion, At the same time, the extension can be pulled in. The carrier head may include a retaining ring surrounding the substrate on the receiving surface of the substrate. The extension can be moved so that the pressure profile applied to the substrate can be substantially not affected by the wearing of the retaining ring. The extension can also be rotated and As a result, the area of the payload applied to the peripheral portion is reduced, and at the same time, the increased load on the edge of the film caused by at least a part of the abrasion of the retainer can be offset. The carrier head may include two curved portions, each of which has a first end point connected to the base portion, and the elastic film may also include a peripheral portion connected to an internal film clamp, which is adjacent to the two curved portions. The lower one, and allows the lower one of the two f-curved parts to move freely. The two curved parts can also define two chamber pressures in the bearing head. Generally speaking, in another aspect, the It is characterized in that it is an elastic film used with a carrier head of a chemical mechanical polishing device 5 200403788. The elastic film may include a central portion having a receiving surface of the substrate, and a curved portion having a first end point. The first end The point is connected to the base of the load head, and the curved portion is planned so that the pressure profile of the central portion applied to the substrate can be substantially unaffected by the vertical movement of the vertical position of the central portion relative to the first end of the curved portion. . A special embodiment of the present invention may include one or more of the following features. The elastic film may also include a peripheral portion that connects the second end of the curved portion to the central portion. The peripheral portion is more than the central portion. It is not subject to deformation, and at the same time, the peripheral part can be connected with an internal membrane inflammation. The elastic film may also include an extension portion that connects the peripheral portion to the first end of the curved portion. The extension portion can be rotated when pulled by the curved portion. The curved portion may include two curved portions. The elastic film may also include a peripheral portion, the peripheral portion is connected to an internal film holder, and at the same time, the second end of each curved portion is connected to the central portion, and the internal film holder is adjacent to the lower portion of the two curved portions. And allow the lower one of the two wild songs to move freely. Generally speaking, in another aspect, the present invention is characterized by a method for grinding a substrate, the method comprising mounting a substrate on a carrier head of a chemical mechanical polishing device such that a first side of the substrate abuts the carrier head, The carrier head includes a base portion, a retainer, and an elastic film. The elastic film includes a center portion to provide a mounting surface of the substrate, and the substrate is polished using a polishing pad, wherein the polishing pad and the base One of the first sides of the substrate is in contact, and the second side of the substrate is in contact with the first side of the substrate. During grinding, the elastic film can be moved so that the profile of the pressure applied to the substrate can be substantially not affected by the wear of the retainer.

通常就另一樣態來說,本發明的特徵是彈性薄膜彎曲 部的一種操作方法,該彎曲部連接一個承載頭和該彈性薄 膜的一個週邊部’該方法包含維持一個臂曲部的位置,使 其大致上平行於安裝在彈性薄膜中心部的基材,同時承載 頭的護圈保持原來的大小,該彎曲部的第一端點連接該承 載頭,並且當研磨進行時,將一延伸部旋轉向該護圈,該 延伸部連接該彎曲部的第二端點和該彈性薄膜的週邊部, 並且當該護圈磨損時,將該延伸部旋轉向該彎曲部。Generally speaking, in another aspect, the present invention is characterized by an operation method of an elastic film bending portion, which connects a load head and a peripheral portion of the elastic film. The method includes maintaining a position of an arm bending portion so that It is substantially parallel to the substrate installed at the center of the elastic film, while the retaining ring of the bearing head maintains the original size. The first end of the curved portion is connected to the bearing head, and an extension is rotated when grinding is performed. To the retainer, the extension connects the second end of the curved portion and the peripheral portion of the elastic film, and when the retainer wears, rotates the extension toward the curved portion.

本發明可實施下列一或數個優點,一個彈性薄膜可加 以規劃而使化學機械研磨裝置的承載頭較不受護圈磨損影 響,一個彈性薄膜可包含一個彎曲部,該彎曲部則透過一 個延伸部連接一個週邊部,當該護圈磨損時,該延伸部受 到該彎曲部拉引而轉動,導致該週邊部上有效負載面積隨 著該延伸部受拉引而減小,該彈性薄膜可再加以規劃而使 有效負載面積得以隨著該彎曲部的第一端點和該彈性薄膜 中心部之間距離縮減而減小。 【實施方式】 如上.所述’有些承载頭包含一個彈性薄膜和一個護 圈,該彈性薄膜具備一個接收基材的安裝表面而該護圈則 用以固定該承载頭内的基材於該彈性薄膜下方,該彈性薄 膜後面的一個艙室受壓導致該薄膜向外擴張,因而施加負 7The present invention can implement one or more of the following advantages. An elastic film can be planned so that the bearing head of the chemical mechanical polishing device is less affected by the wear of the retainer. An elastic film can include a bend, and the bend can extend through an extension. When the retaining ring is worn, the extension portion is pulled by the bending portion to rotate, causing the effective load area on the peripheral portion to decrease as the extension portion is pulled. It is planned so that the payload area decreases as the distance between the first end point of the curved portion and the center portion of the elastic film decreases. [Embodiment] As described above, some of the carrier heads include an elastic film and a retainer, and the elastic film has a mounting surface for receiving the substrate, and the retainer is used to fix the substrate in the carrier head to the elasticity. Under the film, a chamber behind the elastic film is pressed to cause the film to expand outward, thus applying a negative 7

Kil ^00403788 載於該基材。 不幸的疋有些薄膜的設汁中,該薄膜所施加的壓力分 布會隨著該的磨損而?文變,t其是當該護圈受磨損 時’該薄膜和該承載頭其餘部分的接觸點(attachment p〇int)Kil ^ 00403788 is carried on this substrate. Unfortunately, in some film designs, the pressure distribution of the film will follow the wear and tear? The text change, which is the point of contact between the film and the rest of the carrier head when the retainer is worn. (Attachment point)

會移動而靠近該研磨墊片,降低的接觸點會向下壓迫該薄 膜的外緣部分,因此在該薄膜的邊緣產生額外的負載,結 果隨著該濩圈的磨損,該基材週邊的研磨速率減低倘若 該研磨速率隨著該護圈的磨損而改變,不同晶圓之間研磨 4面(polishing profile)將不會一致,所以具備一個不受護 圈磨耗影響之承載頭將非常有用。 參考第1圖中,一或數個基材1〇將用一個包含承載 頭100的化學機械研磨(CMP)裝置來研磨,一個適當CMP 裝置的描述可參照美國專利編號5,73 8,574之圖式和說 明,該專利之完整彼露於參照時加入本文中。 該承載頭100包含一個基部組合(baseassembly)104、Will move closer to the polishing pad, and the lowered contact point will press down the outer edge portion of the film, so an extra load will be generated on the edge of the film, and as the ring wears, the periphery of the substrate will be polished Reduced rate If the polishing rate changes with the wear of the guard ring, the polishing profile will not be consistent between different wafers, so it will be very useful to have a carrier head that is not affected by the wear of the guard ring. Referring to FIG. 1, one or more substrates 10 will be ground by a chemical mechanical polishing (CMP) device including a carrier head 100. A description of a suitable CMP device can be referred to the figure of US Patent No. 5,73 8,574 And description, the completeness of this patent is incorporated herein by reference. The carrier head 100 includes a base assembly 104,

一個護圈1 1 0和一個彈性薄膜1 08,該彈性薄膜丨〇8連接 該基部 104 且伸展於其下而形成一個可加壓室 (pressurizable chamber)106 〇 雖然圖式中沒有顯示,該承載頭仍可包含其他元件, 譬如可供該基部 104活動式懸吊的外殼(housing),可供 該基部 104旋轉的羅盤水平機構(gimbal mechanism)(可 考慮作為該基部組合之部分),該基部1 04和該外殼之間 的裝載室(loading chamber),該可加壓室106内一或數 個支撐結構,或接觸該彈性薄膜1 内面一或數個内部薄 8 200403788 膜用以轭於該基材補充壓力,譬如該承載頭100可如美 國專利編號6,1 83,354,或美國專利應用編號〇9/47〇,82〇(西 疋1 999年12月23日建檔),或美國專利應用編號 09/712,389(西το 2000年η月13日建檔)所描述者建構, 該專利之完整披露於參照時加入本文中。 參考第2Α和2Β圖中,該彈性薄膜1〇8由彈性材料 所製成,譬如neoprene、氯丁二烯(chlor〇prene)、乙烯丙 烯橡膠(ethylene propylene rubber)或矽酮(silicone),譬如 該彈性溥膜108可以由壓模(compression molded)石夕_或 是液體注模(liquid injection molded)石夕酮製成,相較於壓 模製程,該液體注模製程產生較軟的材料,如後所述,將 可增加該彈性薄膜1 08彎曲部的轉動能力。 該彈性薄膜1 〇 8應該是不沾水的,耐久而且對於該研 磨製程是化性安定的,該彈性薄膜1 〇 8可包含一個具備基 材安裝表面122的中心部120,一個從研磨表面伸展開的 周邊部124,一個彈性延伸部126以及一個向内伸展的彎 曲部128,其中該彎曲部128具有一個夾持該基部1〇4的 内緣。 該彈性薄膜108的中心部120可以如美國專利編號 6,210,255所論者,包含一個彈性唇部(fiexibie Ηρ portion),該專利之完整披露於參照時加入本文中。 該周邊部124相對於該彈性薄膜1〇8的其他部分,比 較不受變形影響,譬如第2A和2B圖所示,該周邊部ι24 可以較該中心部120或f曲部丨28為厚,或者是該周邊部 9 200403788 1 24可以用較該彈性薄膜1 08的其他部分更剛硬材料製 成,或是該周邊部124可以包含一種強化材料,或是可圍 著支撐或間隔結構(見第3 Α圖)伸展以避免變形。 該延伸部126具有一基部130連接至該周邊部124, 並且具有一端點1 3 2連接至該彎曲部1 2 8,同時該延伸部 1 2 6可加以規劃,使得該端點1 3 2可回應來自該彎曲部1 2 8 的拉引而向内旋轉。 如第2A和2B圖所示,當該護圈11〇受磨損時,該 彎曲部128和該基部1〇4的接觸點(attachment p〇int)會移 動而靠近該研磨墊片,當該脊曲部128的受夾持端向下移 動時,該f曲部128會將該延伸部126向下拉引’因此減 低有效負載面積,亦即涵蓋該周邊部124的負載面積部 分,同時藉此等比例降低該薄棋的邊緣所承受的負載。 此一負載的降低可以補償護圈磨損後所增加的負載, 因此該承載頭之應用可提供不同晶圓之間更均勻的研磨壓 力剖面,結果該研磨製程,尤其是研磨速率剖面也更穩定 而且更具重複性,此外由於該製程對於護圈磨損較不敏 感,或是說實質上不受護圈磨損影響,該護圈將可承受更 大的耗損,也因此可以使用更長時間才需替換或修補當 然當護圈磨損到某-相當大程度冑,該壓力剖面又會變成 對於護圈磨損敏感。 如第3A-3C圖戶斤示,在另一實施例中,f曲部128 和328均連接該基部1〇4,使用兩個彎曲部將產生兩個壓 力艙344、346,此一配置可用於美國專利應用編號 10 200403788 09/7 12,389(西 該專利之完整 該彎曲部1 2 8 的中心部1 2 0 支撐元件342 該内薄膜 如硬金屬或硬 錄鋼製成。 如第3B謂 延伸部1 2 6開 轉,該有效壓 周邊部124的 增加導致該基 的增加,該延 和328向外拉 如第3C 膜1 〇 8則相對 上方的彎曲部 於減低該有效 力艙344下方 時,則會增加 引所引起的效 膜夾持的尖角 磨損時,彼此 元2〇〇〇年n 月1 3日建檔)所述之承載頭, 坡露於參昭眸士 “、、野加入本文中。如第3A圖所示, 和328起初的西 曰 配置疋大致平行於該彈性薄膜 個衣形的内薄膜夾持340和一個環形的 共同強化該彈性薄膜的周邊部124。 "夺〇和該支撐元件342係由鋼硬材料, 2材所製成’譬如該内薄膜夾持340可用不 ”斤不田壓力艙344、346内壓力增加時, 始向外方疋轉’隨著該延伸冑1 2 6逐漸向外旋 力面積,亦即兮·# ^ ^ 落第一壓力艙344内施加於該 水平面積也隨之辨 _ 〈嶒加’此一有效壓力面積的 材邊緣於該第一 M AAw η Α Λ Λ- 壓力艙344底下所承受負載 伸部12 6的而士/- ^丄 卜%轉同時將該二彎曲部1 2 8 引0 圖所示,當護圈!〗η & 虛 間丨10向下磨損時,該彈性薄 於該基部104向卜銘命> 外墙 ^ π上移動,該第一壓力膽344 1 2 8則將該延伸μ 1,& W 126向内拉引,因此有助 壓力面積以及該邊緣負載,然 的彎曲部328下降至接觸該内 而當該第一壓 薄膜夾持340A retainer 1 10 and an elastic film 108, which is connected to the base 104 and stretched under it to form a pressurizable chamber 106. Although not shown in the figure, the load bearing The head may still contain other components, such as a housing for movable suspension of the base 104, a gimbal mechanism for rotation of the base 104 (considered as part of the base assembly), the base A loading chamber between 04 and the housing, one or more supporting structures in the pressurizable chamber 106, or contacting the inner surface of the elastic film 1 or several inner thin films 8 200403788 The film is used to yoke on the The substrate is supplemented with pressure. For example, the carrier head 100 can be, for example, U.S. Patent No. 6,183,354, or U.S. Patent Application No. 09 / 47,080 (filed on December 23, 999), or U.S. Patent Constructed as described in application number 09 / 712,389 (filed on 13/13/2000), the complete disclosure of which is incorporated herein by reference. Referring to Figures 2A and 2B, the elastic film 108 is made of an elastic material, such as neoprene, chloroprene, ethylene propylene rubber, or silicone, such as The elastic diaphragm 108 can be made of compression molded or liquid injection molded stone ketone. Compared with the compression molding process, the liquid injection molding process produces a softer material. As will be described later, the turning ability of the bent portion of the elastic film 108 can be increased. The elastic film 108 should be non-sticking, durable and stable to the grinding process. The elastic film 108 can include a central portion 120 having a substrate mounting surface 122, and one extending from the polishing surface. The unfolded peripheral portion 124, an elastic extension portion 126, and an inwardly extending bending portion 128, wherein the bending portion 128 has an inner edge that grips the base portion 104. The central portion 120 of the elastic film 108 may include a fiexibie Ηρ portion as discussed in US Patent No. 6,210,255, the complete disclosure of which is incorporated herein by reference. The peripheral portion 124 is relatively unaffected by deformation relative to other portions of the elastic film 108. For example, as shown in FIGS. 2A and 2B, the peripheral portion ι24 may be thicker than the central portion 120 or the f-curved portion 28. Alternatively, the peripheral portion 9 200403788 1 24 may be made of a harder material than other portions of the elastic film 108, or the peripheral portion 124 may include a reinforcing material or may surround a support or spacer structure (see (Figure 3 Α) Stretch to avoid distortion. The extension portion 126 has a base portion 130 connected to the peripheral portion 124, and has an end point 1 2 2 connected to the curved portion 1 2 8 while the extension portion 1 2 6 can be planned so that the end point 1 2 2 can be In response to the pull from the curved portion 1 2 8, it rotates inward. As shown in Figures 2A and 2B, when the retainer 11 is worn, the contact point (attachment point) of the curved portion 128 and the base portion 104 will move closer to the abrasive pad. When the clamped end of the curved portion 128 moves downward, the f-curved portion 128 will pull the extension portion 126 downward, thereby reducing the payload area, that is, covering the load area portion of the peripheral portion 124, and so on. The proportion reduces the load on the edge of the thin chess piece. This reduction in load can compensate for the increased load after wear of the retainer. Therefore, the application of the carrier head can provide a more uniform polishing pressure profile between different wafers. As a result, the polishing process, especially the polishing rate profile, is more stable and More repeatable, and because the process is less sensitive to the wear of the retainer, or is substantially unaffected by the wear of the retainer, the retainer can withstand greater wear and tear and can therefore be used for longer periods of time Or repair. Of course, when the retainer wears to a certain-considerable extent, the pressure profile will become sensitive to the wear of the retainer. As shown in Figures 3A-3C, in another embodiment, the f-curves 128 and 328 are connected to the base 104, and the use of two bends will generate two pressure chambers 344, 346. This configuration is available In U.S. Patent Application No. 10 200403788 09/7 12,389 (the complete part of the patent is the central part of the curved part 1 2 8 support element 342 the inner film is made of hard metal or hard-recorded steel. Such as extension 3B The part 1 2 6 turns. The increase of the effective pressure peripheral part 124 leads to the increase of the base. The extension 328 pulls outward like the 3C membrane 1 08. When the upper part of the curved part is lowered, the lower part of the effective force compartment 344 is reduced , It will increase the wear caused by the sharp corners of the effective film clamping caused by the bearing heads described in each other (filed on March 13th, 2000). Included in this article. As shown in Figure 3A, the initial configuration of 328 and 328, which are approximately parallel to the elastic film-shaped inner film holder 340, and a ring-shaped peripheral portion 124 together strengthen the elastic film. &Quot; 〇〇 and the support element 342 are made of steel hard material, 2 materials, such as the inner thin When the pressure in the pressure chambers 344 and 346 of the clamping 340 is not increased, it starts to turn outwards. With this extension, 1 2 6 gradually rotates outward the area of the force, that is, xi · # ^ ^ A pressure chamber 344 applied to the horizontal area is also identified. _ 嶒 Plus' The edge of the material of this effective pressure area is under the first M AAw η Α Λ Λ-the load extension 12 6 under the pressure chamber 344 And the taxi /-^ 丄 卜% turn at the same time lead the two curved parts 1 2 8 as shown in the picture, when the retainer! 〖Η & When the virtual space 丨 10 wears down, the elasticity is thinner than the base 104 and moves towards Bu Mingming > the outer wall ^ π, the first pressure gall 344 1 2 8 extends the extension μ 1, & W 126 is pulled in, so it helps the pressure area and the edge load, but the bent portion 328 is lowered to contact the inside and when the first pressing film is clamped 340

該邊緣負載 該二彎曲部128和328向外拉 應彼此制衡,審慎選擇薄膜材料或是該内薄 (taper angle),這些效應將可以在護圈ιι〇 平衡而減低或使邊緣負載變化最小化。 11 200403788 然而該二效應平衡的結果可能不會一致,而使最終的The edge load and the two curved portions 128 and 328 should be balanced with each other. Carefully choose a thin film material or the taper angle. These effects can be balanced in the retainer, and the edge load can be reduced or minimized. . 11 200403788 However, the result of the balance of the two effects may not be consistent, so that the final

邊緣負載產生許多變動,若只專注於該第一壓力艙344上 方彎曲部128的移動效應則有助於改善一致性,如第4圖 所示,該第一壓力艙344下方彎曲部328的移動所引起的 邊緣負載效應可藉由減低彎曲部328和該内薄膜夾持440 的接觸面而減小’因此為了消除或大幅減小該第一壓力艙 344下方彎曲部328和該内薄膜夾持440上表面的接觸, 必須削減該内薄膜夾持44〇,彎曲部328和該内薄膜爽持 440上表面接觸的消除或減小即可降低護圈磨損的敏感 度,因為當護圈u〇磨損時,彎曲部328仍能上下自由運 動,如此便不會影響該基材邊緣負載。 雖然前述已直接針對本發明之數個實施例進行說明 之,但其它修改或進一步之實施例也可依照本發明之精神 而設計之,而這些都不脫離本發明所定義之範圍。譬如診 薄膜可固定於該承載頭上不同的位置,如夾持在該護圈^ 該基部之 向内延伸 可浮動或 開成數個 構,而該 了解的是 感度,該 可能沒有 此其他實 ,該薄 靜止於 薄膜, 支撐結 即使該 薄膜的 接觸該 施例仍 膜可固定 該艙室内 譬如該薄 構再固定 薄膜的特 設計仍然 研磨墊片 涵蓋於下 在一個支撐結構,而該支撐 ,與其是單件薄膜,該薄膜 臈的彎曲部可固定在一個支 於該薄膜的周邊部,此外, 殊形狀的確減低對護圈磨損 非常有用,譬如該承載頭的 或是該承栽頭根本沒有護圈 述申請專利範圍定義之範圍 f- S'-^ ^ 12 200403788 【圖式簡單說明】 本發明上述一或數個實施例之細節,以及其他的特 徵、優點及目的可在參閱下列圖式之後有更詳盡之了解。 第1圖為一個包含彈性薄膜的承載頭剖面圖; 第2A圖為第1圖之承載頭局部展開圖; 第2B圖為該護圈磨損後之彈性薄膜示意圖; 第3A-3C圖為具備兩個彎曲部之彈性薄膜運轉示意There are many changes in the edge load. If we only focus on the moving effect of the curved portion 128 above the first pressure chamber 344, it will help improve the consistency. As shown in Figure 4, the movement of the curved portion 328 below the first pressure chamber 344 The edge load effect caused can be reduced by reducing the contact surface between the curved portion 328 and the inner film holder 440, so in order to eliminate or greatly reduce the clamped portion 328 below the first pressure chamber 344 and the inner film holder The contact of the upper surface of 440 must reduce the inner film clamping 44. The elimination or reduction of the contact between the curved portion 328 and the upper surface of the inner film 440 can reduce the sensitivity of the retainer wear, because when the retainer u When worn, the curved portion 328 can still move freely up and down, so that it does not affect the edge load of the substrate. Although the foregoing has directly described several embodiments of the present invention, other modifications or further embodiments can also be designed in accordance with the spirit of the present invention without departing from the scope defined by the present invention. For example, the diagnostic film can be fixed at different positions on the carrier head, such as being clamped in the retainer ^ The inward extension of the base can be floated or opened into several structures, and what should be understood is sensitivity, which may not have this other reality. The thin film rests on the film, and the support knot can fix the film even if the film contacts the embodiment. For example, the special design of the thin structure and the fixed film is still ground. The pad is covered by a support structure, and the support is not a single Piece of film, the curved part of the film can be fixed to a peripheral part supported by the film, and the special shape really reduces the wear of the retainer, such as the bearing head or the retaining head does not have a retainer at all The scope of the definition of the scope of patent application f- S '-^ ^ 12 200403788 [Brief description of the drawings] Details of one or more embodiments of the present invention, as well as other features, advantages and purposes, can be changed after referring to the following drawings Thorough understanding. Figure 1 is a cross-sectional view of a bearing head containing an elastic film; Figure 2A is a partial expanded view of the bearing head of Figure 1; Figure 2B is a schematic diagram of the elastic film after the retainer is worn; Figures 3A-3C are Schematic diagram of the elastic film operation of each bend

第 4圖為具備兩個彎曲部之彈性薄膜以及修剪夾持 (cut back clamp)示意圖; 不同圖式中相同的參照符號表示相同的元件。 【元件代表符號簡單說明】FIG. 4 is a schematic diagram of an elastic film having two curved portions and a cut back clamp; the same reference symbols in different drawings represent the same components. [Simple description of component representative symbols]

10 基材 100 承載頭 104 基部 106 可加壓室 108 彈性薄膜 110 護圈 120 中心部 122 基材安裝表面 124 周邊部 126 延伸部 13 200403788 128 彎曲部 130 基部 132 端點 328 彎曲部 340 内薄膜夾持 342 支撐元件 344 壓力艙 346 壓力艙 440 内薄膜夾持10 Base material 100 Carrier head 104 Base 106 Pressurizable chamber 108 Elastic film 110 Retainer 120 Central portion 122 Substrate mounting surface 124 Peripheral portion 126 Extension 13 200403788 128 Bend 130 Base 132 End point 328 Bend 340 Inner film clamp Holding 342 support element 344 pressure chamber 346 pressure chamber 440 film clamping

1414

Claims (1)

200403788 拾、申請專利範園: 1. 一種用於基材化學機械研磨之承載頭,該承載頭至少 包含: 一個基部;200403788 Patent application park: 1. A carrier head for chemical mechanical polishing of a substrate, the carrier head includes at least: a base; 一個護圈圍繞著一個基材接收表面上的基材;及 一個彈性薄膜延伸於該基部下方而形成一個艙 室,該彈性薄膜提供該基材接受表面,並且可加以規 劃而使得施加於基材的壓力剖面能大致上不受護圈磨 耗影響。 2.如申請專利範圍第1項所述之承載頭,其中該彈性薄 膜更包含一個具備基材接受面的中心部分,以及一個 具備第一端點的彎曲部分,該第一端點結合該基部使 有效負載面積得以隨著該彎曲部的第一端點和該中心 部之間距離縮減而減小。A retainer surrounds the substrate on a substrate receiving surface; and an elastic film extends below the base to form a compartment, the elastic film provides the substrate receiving surface, and can be planned so that the The pressure profile can be largely unaffected by the wear of the retainer. 2. The bearing head according to item 1 of the scope of patent application, wherein the elastic film further comprises a central portion having a substrate receiving surface and a curved portion having a first end point, the first end point being combined with the base portion The payload area is reduced as the distance between the first end of the curved portion and the central portion is reduced. 3.—種用於基材化學機械研磨之承載頭,該承載頭至少 包含: 一個基部;及 一個彈性薄膜延伸於該基部下方而形成一個艙室 並提供一個基材接受表面,該彈性薄膜更包含一個具 備基材接受面的中心部分,以及一個具備第一端點的 彎曲部分,該第一端點則連結該基部。 15 200403788 4.如申請專利範圍第3項所述之承載頭,其中該彎曲部 直接連結該基部。 5 .如申請專利範圍第3項所述之承載頭,其中該彎曲部 間接連結該基部。 6.如申請專利範圍第3項所述之承載頭,其中該彈性薄 膜可加以規劃而使有效負載面積得以隨著該彎曲部的 第一端點和該中心部之間距離縮減而減小。 7·如申請專利範圍第3項所述之承載頭,其中該彈性薄 膜在該中心部邊緣包含一個周邊部。 8. 如申請專利範圍第7項所述之承載頭,其中該周邊部比 該中心部較不受制於變形。 9. 如申請專利範圍第7項所述之承載頭,其中該周邊部 連結一個内在薄膜夾持。 10. 如申請專利範圍第9項所述之承載頭,其中該周邊部 連結一個支撐元件。 1 1 ·如申請專利範圍第7項所述之承載頭,其中該彈性薄 膜包含一個延伸部,該延伸部連結該周邊部和該彎曲 16 200403788 部的一個第二端點。 1 2 .如申請專利範圍第1 1項所述之承載頭,其中該延伸 部受到該彎曲部拉引時會旋轉。 1 3 ·如申請專利範圍第1 1項所述之承載頭,其中該延伸部 旋轉以致施加於該周邊部的有效負載面積得以隨著該 延伸部之受拉引而減小。3. A carrier head for chemical mechanical polishing of a substrate, the carrier head comprising at least: a base; and an elastic film extending below the base to form a compartment and providing a substrate receiving surface, the elastic film further includes A central portion having a substrate receiving surface and a curved portion having a first end point, the first end point is connected to the base portion. 15 200403788 4. The bearing head according to item 3 of the scope of patent application, wherein the bent portion is directly connected to the base portion. 5. The bearing head according to item 3 of the scope of patent application, wherein the bent portion is indirectly connected to the base portion. 6. The bearing head according to item 3 of the scope of patent application, wherein the elastic film can be planned so that the payload area decreases as the distance between the first end point of the curved portion and the center portion decreases. 7. The bearing head according to item 3 of the scope of patent application, wherein the elastic film includes a peripheral portion at an edge of the central portion. 8. The bearing head according to item 7 of the scope of patent application, wherein the peripheral portion is less subject to deformation than the central portion. 9. The carrier head according to item 7 of the scope of patent application, wherein the peripheral portion is connected with an internal film clamp. 10. The bearing head according to item 9 of the patent application scope, wherein the peripheral portion is connected with a supporting element. 1 1 The bearing head according to item 7 in the scope of patent application, wherein the elastic film includes an extension portion connecting the peripheral portion and a second end point of the curved 16 200403788 portion. 1 2. The bearing head according to item 11 of the scope of patent application, wherein the extension portion rotates when being pulled by the bending portion. 1 3 The bearing head according to item 11 of the scope of patent application, wherein the extension portion is rotated so that a payload area applied to the peripheral portion is reduced as the extension portion is pulled. 1 4.如申請專利範圍第1 1項所述之承載頭,其中該彎曲 部的第一端點成輻射狀在該彎曲部的第二端點内側, 同時該延伸部可向内拉引。 1 5 ·如申請專利範圍第1 1項所述之承載頭,該承載頭進 一步至少包含一個護圈圍繞著該基材接收表面上的基 材。 1 6 ·如申請專利範圍第1 5項所述之承載頭,其中該延伸 部移動以致施加於基材的壓力剖面大致上不受護圈磨 耗影響。 1 7 .如申請專利範圍第1 5項所述之承載頭,其中該延伸 部旋轉而導致施加於該周邊部的有效負載面積減小, 同時使至少一部分護圈磨耗引起的該薄膜邊緣所增加 17 200403788 之負載得以抵鎖。 1 8.如申請專利範圍第3項所述之承載頭,其中該彈性薄 膜包含兩個彎曲部,當中每一個均具備一個第一端點 連結該基部。14. The bearing head according to item 11 of the scope of patent application, wherein the first end of the curved portion is radially inside the second end of the curved portion, and at the same time, the extension portion can be pulled inward. 15 The carrier head according to item 11 of the scope of patent application, the carrier head further comprising at least one retaining ring surrounding the substrate on the receiving surface of the substrate. 16 The bearing head according to item 15 of the scope of patent application, wherein the extension is moved so that the pressure profile applied to the substrate is substantially unaffected by the wear of the retainer. 17. The carrier head according to item 15 of the scope of patent application, wherein the extension portion is rotated to reduce the effective load area applied to the peripheral portion, and at the same time, at least a portion of the guard ring is worn to increase the edge of the film. 17 200403788 The load was blocked. 1 8. The carrier head according to item 3 of the scope of patent application, wherein the elastic film includes two curved portions, each of which has a first end point connected to the base portion. 1 9 ·如申請專利範圍第1 8項所述之承載頭,其中該彈性 薄膜包含一個周邊部分,該周邊部連接一個内部薄膜 夾持,該内部薄膜夾持緊鄰該二彎曲部當中較低者, 並且容許該二彎曲部當中較低者可以自由活動。 20.如申請專利範圍第3項所述之承載頭,其中該彎曲部 在該承載頭内定義兩個壓力艙。 2 1 · —種配合使用基材化學機械研磨裝置之承載頭的彈性 薄膜,該彈性薄膜至少包含:19 · The carrier head according to item 18 of the scope of patent application, wherein the elastic film includes a peripheral portion, the peripheral portion is connected to an internal film holder, and the internal film holder is adjacent to the lower one of the two curved portions. And allows the lower of the two bends to move freely. 20. The bearing head according to item 3 of the patent application scope, wherein the bent portion defines two pressure chambers in the bearing head. 2 1 · — An elastic film of a carrier head used in combination with a substrate chemical mechanical polishing device, the elastic film includes at least: 一個具備基材接受面的中心部分;及 一個具備第一端點的彎曲部分,該第一端點則連 接該承載頭之基部,其中該彎曲部則經規劃而使該中 心部施加於基材的壓力剖面能大致上不受制於該中心 部垂直位置相對於該彎曲部第一端點之垂直運動。 22 ·如申請專利範圍第2 1項所述之彈性薄膜,該彈性薄 膜更至少包含: 18 200403788 一個周邊部,該周邊部連結該彎曲部的一個第二 端點和該中心部。 23 .如申請專利範圍第22項所述之彈性薄膜,其中該周邊 部比該中心部較不受制於變形。A central portion having a substrate receiving surface; and a curved portion having a first end point, the first end point being connected to a base portion of the carrier head, wherein the curved portion is planned so that the central portion is applied to the substrate The pressure profile can be substantially unaffected by the vertical movement of the vertical position of the central part relative to the first endpoint of the curved part. 22 · The elastic film according to item 21 of the scope of patent application, the elastic film further comprises at least: 18 200403788 a peripheral portion, which connects a second end point of the curved portion and the central portion. 23. The elastic film according to item 22 of the scope of patent application, wherein the peripheral portion is less subject to deformation than the central portion. 24·如申請專利範圍第22項所述之彈性薄膜,其中該周 邊部連結一個内在薄膜夾持。 25 ·如申請專利範圍第22項所述之彈性薄膜,該彈性薄 膜進一步至少包含: 一個延伸部,該延伸部連結該周邊部和該彎曲部 的第二端點。 26.如申請專利範圍第25項所述之彈性薄膜,其中該延 伸部受到該彎曲部拉引時會旋轉。24. The elastic film according to item 22 of the scope of patent application, wherein the peripheral portion is connected with an internal film clamp. 25. The elastic film according to item 22 of the scope of patent application, the elastic film further comprising at least: an extension portion connecting the peripheral portion and the second end point of the curved portion. 26. The elastic film according to item 25 of the scope of patent application, wherein the extending portion is rotated when being pulled by the bending portion. 27·如申請專利範圍第2 1項所述之彈性薄膜,其中該彈性 薄膜包含兩個彎曲部。 28.如申請專利範圍第27項所述之彈性薄膜,該彈性薄膜 更至少包含一個周邊部分,該周邊部連接一個内部薄 膜夾持並且連結該中心部和每一彎曲部的第二端點, 其中該内部薄膜夾持緊鄰該二彎曲部當中較低者,同 19 200403788 時容許該二彎曲部當中較低者可以自由活動。 29.—種研磨基材的方法,該方法至少包含: 安裝基材於一個化學機械研磨裝置的承載頭上, 使得該基材的一個第一面鄰接該承載頭,該承載頭包 含一個基部、一個護圈和一個彈性薄膜,該彈性薄膜 包含一個中心部以提供該基材一個安裝面;及27. The elastic film of claim 21, wherein the elastic film includes two bent portions. 28. The elastic film according to item 27 of the scope of patent application, the elastic film further comprising at least a peripheral portion, the peripheral portion being connected to an internal film to clamp and connect the central portion and the second end point of each curved portion, The inner film is clamped next to the lower one of the two bends, and the lower one of the two bends is allowed to move freely as in 19 200403788. 29. A method for grinding a substrate, the method at least comprising: mounting a substrate on a carrier head of a chemical mechanical polishing device, so that a first side of the substrate abuts the carrier head, the carrier head includes a base, a A retainer and an elastic film including a central portion to provide a mounting surface of the substrate; and 使用一個研磨墊片研磨該基材,其中該研磨墊片 與該基材的一個第二面接觸,而該基材的第二面則與 該基材的第一面相對; 其中,研磨時,該彈性薄膜可以移動而使施加於 基材的壓力剖面能大致上不受護圈磨耗影響。 3 0.—種操作彈性薄膜彎曲部的方法,該彎曲部連接一個 承載頭和該彈性薄膜的一個周邊部,該方法至少包 含:A polishing pad is used to grind the substrate, wherein the polishing pad is in contact with a second surface of the substrate, and the second surface of the substrate is opposite to the first surface of the substrate; wherein, during grinding, The elastic film can be moved so that the pressure profile applied to the substrate can be substantially not affected by the wear of the retainer. 3 0. A method of operating a curved portion of an elastic film, the curved portion is connected to a bearing head and a peripheral portion of the elastic film, the method includes at least: 維持一個彎曲部的位置,使其大致上平行於安裝 在彈性薄膜中心部的基材,同時承載頭的護圈保持原 來的大小,而該彎曲部的第一端點連接該承載頭; 當研磨進行時,將一延伸部旋轉向該護圈,該延 伸部連接該彎曲部的第二端點和該彈性薄膜的週邊 部;及 當該護圈磨損時,將該延伸部旋轉向該彎曲部。 20Maintain the position of a bend so that it is approximately parallel to the substrate installed at the center of the elastic film, while the retaining ring of the load head maintains the original size, and the first end of the bend is connected to the load head; when grinding When in progress, rotate an extension toward the retainer, the extension connecting the second end of the bend and the peripheral portion of the elastic film; and when the retainer wears, rotate the extension toward the bend . 20
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI480124B (en) * 2011-05-31 2015-04-11 K C Tech Co Ltd Membrane assembly and carrier head having the membrane assembly
TWI685399B (en) * 2018-05-17 2020-02-21 日商Sumco股份有限公司 Grinding head, wafer grinding device using the grinding head, and wafer grinding method using the grinding head
CN111168562A (en) * 2018-11-09 2020-05-19 凯斯科技股份有限公司 Bearing head for grinding device and diaphragm thereof
CN114800052A (en) * 2022-03-18 2022-07-29 大连理工大学 Grinding method for improving optical wafer surface shape

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI480124B (en) * 2011-05-31 2015-04-11 K C Tech Co Ltd Membrane assembly and carrier head having the membrane assembly
TWI685399B (en) * 2018-05-17 2020-02-21 日商Sumco股份有限公司 Grinding head, wafer grinding device using the grinding head, and wafer grinding method using the grinding head
US11554458B2 (en) 2018-05-17 2023-01-17 Sumco Corporation Polishing head, wafer polishing apparatus using the same, and wafer polishing method using the same
CN111168562A (en) * 2018-11-09 2020-05-19 凯斯科技股份有限公司 Bearing head for grinding device and diaphragm thereof
CN114800052A (en) * 2022-03-18 2022-07-29 大连理工大学 Grinding method for improving optical wafer surface shape
CN114800052B (en) * 2022-03-18 2023-09-26 大连理工大学 Grinding method for improving surface shape of optical wafer

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