TR201902478T4 - Sıvı algılama için yöntem ve sistem. - Google Patents
Sıvı algılama için yöntem ve sistem. Download PDFInfo
- Publication number
- TR201902478T4 TR201902478T4 TR2019/02478T TR201902478T TR201902478T4 TR 201902478 T4 TR201902478 T4 TR 201902478T4 TR 2019/02478 T TR2019/02478 T TR 2019/02478T TR 201902478 T TR201902478 T TR 201902478T TR 201902478 T4 TR201902478 T4 TR 201902478T4
- Authority
- TR
- Turkey
- Prior art keywords
- liquid
- data
- xrd
- interference function
- examples
- Prior art date
Links
- 239000007788 liquid Substances 0.000 title abstract 11
- 238000001514 detection method Methods 0.000 title abstract 3
- 238000000034 method Methods 0.000 title abstract 3
- 239000000126 substance Substances 0.000 abstract 4
- 238000002441 X-ray diffraction Methods 0.000 abstract 3
- 238000001228 spectrum Methods 0.000 abstract 2
- 238000002591 computed tomography Methods 0.000 abstract 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/637—Specific applications or type of materials liquid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Sıvı algılamasına yönelik bir yöntem ve sistem açıklanmaktadır. Buluşun örneklerine göre sıvı algılamasına dair yöntem şu hususları içermektedir: sıvı maddenin CT verilerinin ve XRD enerji spektrum verilerinin eş zamanlı olarak elde edilmesi amacıyla sıvı madde üzerinde CT taraması ile X-Ray Kırınımı (XRD) taraması gerçekleştirilmesi (S102); sıvı maddenin CT verileri ile XRD enerji spektrum verilerine istinaden sıvı maddenin bir molekül girişim fonksiyonunun ekstrakte edilmesi (S104) ve sıvı maddenin molekül girişim fonksiyonu ve CT verilerinin kullanılması suretiyle tespit edilmesi (S106). Buluşun örneklerine göre sıvı algılama yöntem ve sistemiyle, sıvı maddenin daha yüksek bir sinyal gürültü oranı ve daha büyük bir etkin aralığıyla moleküler girişim fonksiyonu elde edilebilmekte ve bundan dolayı sıvı maddelerin daha geniş bir aralığı tespit edilebilmektedir.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610294907.2A CN107345925B (zh) | 2016-05-05 | 2016-05-05 | 液体检测方法和系统 |
Publications (1)
Publication Number | Publication Date |
---|---|
TR201902478T4 true TR201902478T4 (tr) | 2019-03-21 |
Family
ID=57963044
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TR2019/02478T TR201902478T4 (tr) | 2016-05-05 | 2017-02-01 | Sıvı algılama için yöntem ve sistem. |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP3242127B1 (tr) |
CN (1) | CN107345925B (tr) |
PL (1) | PL3242127T3 (tr) |
TR (1) | TR201902478T4 (tr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115078414B (zh) * | 2022-08-18 | 2022-11-04 | 湖南苏科智能科技有限公司 | 基于多能量x射线的液体成分抗干扰智能检测方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2005091225A1 (en) * | 2004-03-17 | 2005-09-29 | Philips Intellectual Property & Standards Gmbh | Beam-hardening and attenuation correction for coherent-scatter ct |
US7519154B2 (en) | 2006-08-15 | 2009-04-14 | Ge Security, Inc. | Systems and methods for using a crystallinity of a substance to identify the substance |
US7831019B2 (en) * | 2007-12-28 | 2010-11-09 | Morpho Detection, Inc. | System and methods for characterizing a substance |
US8582718B2 (en) | 2010-11-30 | 2013-11-12 | Morpho Detection, Inc. | Method and system for deriving molecular interference functions from XRD profiles |
BR112014017258B1 (pt) * | 2012-01-13 | 2022-03-29 | Ingrain, Inc | Método para avaliar um reservatório e sistema para avaliar um reservatório |
CN103913472B (zh) * | 2012-12-31 | 2016-04-20 | 同方威视技术股份有限公司 | Ct成像系统和方法 |
FR3023001A1 (fr) * | 2014-06-30 | 2016-01-01 | Commissariat Energie Atomique | Procede d'analyse d'un objet en deux temps utilisant un rayonnement en transmission puis un spectre en diffusion. |
CN106896122B (zh) * | 2015-12-18 | 2019-07-30 | 清华大学 | 液体检测方法和系统 |
-
2016
- 2016-05-05 CN CN201610294907.2A patent/CN107345925B/zh active Active
-
2017
- 2017-02-01 PL PL17154154T patent/PL3242127T3/pl unknown
- 2017-02-01 TR TR2019/02478T patent/TR201902478T4/tr unknown
- 2017-02-01 EP EP17154154.3A patent/EP3242127B1/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP3242127A1 (en) | 2017-11-08 |
EP3242127B1 (en) | 2018-11-28 |
CN107345925A (zh) | 2017-11-14 |
CN107345925B (zh) | 2019-10-15 |
PL3242127T3 (pl) | 2019-05-31 |
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