PL3242127T3 - Sposób i system wykrywania cieczy - Google Patents

Sposób i system wykrywania cieczy

Info

Publication number
PL3242127T3
PL3242127T3 PL17154154T PL17154154T PL3242127T3 PL 3242127 T3 PL3242127 T3 PL 3242127T3 PL 17154154 T PL17154154 T PL 17154154T PL 17154154 T PL17154154 T PL 17154154T PL 3242127 T3 PL3242127 T3 PL 3242127T3
Authority
PL
Poland
Prior art keywords
liquid detection
detection
liquid
Prior art date
Application number
PL17154154T
Other languages
English (en)
Inventor
Zhiqiang Chen
Li Zhang
Tianyi YANG DAI
Yuxiang Xing
Liang Li
Qingping Huang
Yunda Sun
Xin Jin
Ming Chang
Le SHEN
Original Assignee
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Co Ltd filed Critical Nuctech Co Ltd
Publication of PL3242127T3 publication Critical patent/PL3242127T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/637—Specific applications or type of materials liquid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
PL17154154T 2016-05-05 2017-02-01 Sposób i system wykrywania cieczy PL3242127T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201610294907.2A CN107345925B (zh) 2016-05-05 2016-05-05 液体检测方法和系统
EP17154154.3A EP3242127B1 (en) 2016-05-05 2017-02-01 Method and system for liquid detection

Publications (1)

Publication Number Publication Date
PL3242127T3 true PL3242127T3 (pl) 2019-05-31

Family

ID=57963044

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17154154T PL3242127T3 (pl) 2016-05-05 2017-02-01 Sposób i system wykrywania cieczy

Country Status (4)

Country Link
EP (1) EP3242127B1 (pl)
CN (1) CN107345925B (pl)
PL (1) PL3242127T3 (pl)
TR (1) TR201902478T4 (pl)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115078414B (zh) * 2022-08-18 2022-11-04 湖南苏科智能科技有限公司 基于多能量x射线的液体成分抗干扰智能检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE385595T1 (de) * 2004-03-17 2008-02-15 Koninkl Philips Electronics Nv Korrektur der strahlungsaufhärtung und der dämpfung in der coherent scatter computed tomography (csct)
US7519154B2 (en) 2006-08-15 2009-04-14 Ge Security, Inc. Systems and methods for using a crystallinity of a substance to identify the substance
US7831019B2 (en) * 2007-12-28 2010-11-09 Morpho Detection, Inc. System and methods for characterizing a substance
US8582718B2 (en) 2010-11-30 2013-11-12 Morpho Detection, Inc. Method and system for deriving molecular interference functions from XRD profiles
BR112014017258B1 (pt) * 2012-01-13 2022-03-29 Ingrain, Inc Método para avaliar um reservatório e sistema para avaliar um reservatório
CN103913472B (zh) * 2012-12-31 2016-04-20 同方威视技术股份有限公司 Ct成像系统和方法
FR3023001A1 (fr) * 2014-06-30 2016-01-01 Commissariat Energie Atomique Procede d'analyse d'un objet en deux temps utilisant un rayonnement en transmission puis un spectre en diffusion.
CN106896122B (zh) * 2015-12-18 2019-07-30 清华大学 液体检测方法和系统

Also Published As

Publication number Publication date
CN107345925B (zh) 2019-10-15
CN107345925A (zh) 2017-11-14
TR201902478T4 (tr) 2019-03-21
EP3242127B1 (en) 2018-11-28
EP3242127A1 (en) 2017-11-08

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