SU996871A1 - Scanistor conversion characteristic measuring device - Google Patents

Description

The invention relates to a measuring technique and can be used to measure the conversion characteristics of scanstors.

A device for monitoring semiconductor converters ij is known.

However, this device does not allow measurement of the conversion characteristic of coordinate-sensitive photoelectric converters (scanstors).

The closest to the present invention is a device for measuring the conversion characteristic of the scanstor, comprising a light source, an optical system, a micrometer screw, a measuring voltmeter, and a bias voltage source connected to the dividing bus terminals of the scanner 2.

In the known device, the accuracy of measurement of the conversion characteristic of the scanner is low, since the device does not allow to take into account the influence on it of the currents of the emitter and collector, of the scanistor. In addition, when measuring the conversion characteristic of the scanner, the illumination on it is created in a strip and the measurement accuracy is directly related to

this stripe width, which increases the error.

The aim of the invention is to improve the measurement accuracy of the conversion characteristic of the scanstor.

This goal is achieved by the fact that a device containing a light source, an optical system, a micrometer screw, a measuring volt 10 meter and a bias voltage source connected to the scanner dividing bar contacts, is additionally inserted with an opaque shutter mounted with a micrometer screw , the source of the reference voltage and the load resistance, while one output of the source of the reference voltage is connected to one of the contacts of the dividing bus of the scistor, a load resistance The connection is connected between the other output of the voltage source and the collector collector, and the measuring voltmeter is connected to the load resistance.

The drawing shows a diagram of the proposed device.

Claims (1)

The device includes a light source 1 and an optical system 2, 30 an opaque shutter 3 connected to a micrometer screw 4, a bias voltage source 5 connected to the dividing contacts of the scanner 6, a reference voltage source 7, a load resistance 8 and a measuring voltmeter 9 The device works as follows. Scanner 6 is illuminated by a parallel beam of light formed by an optical system 2 located between the light source by an opaque shutter 3. In the initial state, the opaque shutter 3 overlaps the scanstor, and the parallel light beam does not fall on the photosensitive surface of the scanstor. The voltage from the bias voltage source 5 is distributed along the dividing bus of the scanner b in accordance with the non-uniformity of its resistance. The reference voltage from the voltage source 7 applied to the collector 6 of the scanner 6 through the load resistance 8 shifts the line of zero potential to one of the edges of the scanner b. Thus, a blocking voltage is applied to the entire structure of the scanner 6, which creates with sources 5 and 7. As long as the opaque shutter 3 completely blocks the parallel beam of light through the resistance of load 8, the dark current of the scanstor b is created, creating a drop on it voltage. This voltage is detected by a measuring voltmeter 9. By rotating the micrometer screw 4, the opaque shutter 3 moves, and a parallel light beam of light illuminates a portion of the scanner b, resulting in a current depending on the magnitude of the illumination and on the distribution of the potential along the scanner dividing busbar b. This photocurrent, together with the dark currents of the emitter and collector junctions, creates a voltage drop on the load resistance 8, recorded by the measuring voltmeter 9. By successively moving the opaque curtain 3 along scanner b, they remove the conversion characteristic of the scanstor. The introduction of a movable opaque shutter, having the ability of a micrometer screw to move, a source of reference voltage and load resistance, allows to take into account the effect of the current EASHTter and co-monitor of the scanner on the conversion characteristic and, consequently, increase the accuracy of measurement of the conversion characteristic. Apparatus of the Invention A device for measuring the conversion characteristic of a scanner comprising a light source, an optical system, a micrometer screw, a measuring voltmeter and a bias voltage source connected to the separator bar's contacts, in order to increase the measurement accuracy of the scanner conversion performance additionally, an opaque shutter was installed, installed with the possibility of movement by a micrometer screw, a source of voltage and resistance load, while one output of the voltage source is connected to one of the pins of the dividing bus of the scanner, the load resistance is connected between the other output of the voltage source and the scanner collector, and the measuring voltmeter is connected to the load resistance. Sources of information taken into account during the examination 1. USSR Author's Certificate No. 529433, cl. G 01 R 31/26, 1972. 2, L. schenko L.S. and others. Characteristics and parameters of the deviation of solid-state deployments of scanners. -In pr .: Semiconductor devices and their application. Ed. Fedorov. Issue 28. M., Soviet Radio, 1974, p. 219 (prototype.).