SU960998A1 - Method of measuring the response of crt to deflection - Google Patents

Description

one

The invention is fire detection technology, namely, a method for measuring the deviation of a CRT to a deviation.

There is a method of measuring the sensitivity to the OPT of a cathode ray tube, which consists in measuring the ratio of the linear deviation of the electron beam and causing this deviation to the voltage applied to the plates J, o

The disadvantage of this method is the relatively low measurement accuracy.

Also known is the measurement of the sensitivity of a CRT disclosure, which consists in rejecting the electronic and is getting on the screen of the CRT images of two scanning lines or two brightness points (due to alternate supply to the signal and temporary plates of the scanning voltage and constant deflection voltage ), separated from each other by a certain value, determined by the value of the constant deflecting voltage. Using a ruler or

The pattern is used to measure the distance between the pvum lines or points and to calculate the ratio of the distance between the mechanical lines and the value of the deflecting constant voltage G2}.

The disadvantages of this method are low accuracy and considerable time spent on measuring sensitivity.

The purpose of the invention is to improve the accuracy and reduce the measurement time,

This goal is achieved by the fact that according to the method of measuring the sensitivity to the deviation of a cathode ray tube, which involves deflecting an electron beam, forming images of scanning lines on the screen and determining the ratio of the deviation of the electron beam to the deviation voltage, the image of the scanning lines forms a linear electronic pulse; digital sweep, filling the working part of the screen, the amount of deflection of the electron beam is determined 3.beo with a scale grid applied to the superimposed but working part of the screen, the nodal points of which contain photo-optical microsensors, and the values of the deflection voltage nodal points of the scale grid at a given size of the electron beam deflection multiplied by the multi-anode coefficient. FIG. I shows a CRT screen with a superimposed grid over it, at the narrow points of which miniature photo-optical microsensors are installed, with a light-sensitive stratum facing the CRT screen; 2 - pulse waveforms, according to the principle of operation of the proposed method. The method is carried out by a slider. A large-scale grid with miniature photo-optical microsensors is superimposed on the working area of the CRT screen in such a way that its center is aligned with the center of the screen, and the horizontal and vertical axes of the scale grid are parallel to the corresponding screen. arbitrary, but strictly constant, which provides a rigid fixation of the geometric coordinates of the centers of the sensors as inter-self, for example, with respect to the position sensor in the bottom left corner (FIG. 1). Then, for example, from the lower left corner in the screen plane, the electron beam is turned from bottom to top and from left to right into a rectangular raster on the screen of the tube. Such a beam sweep is obtained by supplying CRTs with vertically deflecting and horizontal deflecting plastics, changing linearly the stepwise voltage of the UH (Fig. 2a) and frame and / 2 ((| ig. 26) sweeps. In this case, each successive increment of the step voltage of the line and frame scans is chosen so that a predetermined resolution is provided between two adjacent nodes of the scale grid, for example, if the size of the grid cell size is lOxlO mm respectively, 100 or 200 steps, the resolution is O, 1 and 0.05 mm, respectively. At the moment when the electron beam crosses the nodal points, the corresponding photo-optical microsensors, elevation pulses are formed, for example, b ... 4 (Fig. 2c ), which give the command for the memory of Koopttwrnt microsensors, for example, UA (Fig. 2d) on the X axis and 1/5 (Fig. 2 o) on the U axis. The electrical coordinates of the sensors on the X and Y axes represent the number steps (the number of raster lines), respectively, the beginning of the frame Ui (FIG. 26) and the beginning of the corresponding lowercase, 0 (f, 2a) scans. During a single digital scanning frame, the electrical coordinates of all grid points of the scale grid are memorized. When determining the sensitivity on any part of the screen, the EDT calculates the difference, the electrical coordinates of the same name of the nodal points of the scale grid (raster lines) located on the Edge of this section, respectively, in the direction of the X or Y axis, is converted into the deflection voltage of the electron beam by multiplying by the known constant the voltage scale factor and the value of the bias sensitivity is calculated as the ratio of pa: the distance between the KNOTS points to the electron beam bias voltage. The voltage coefficient K of the sweep along X and Y is separated by the expression K -, where and and and are respectively the magnitude of the voltage and the number of sweep stages. The proposed method for measuring the sensitivity to deviation of a CRT makes it possible to increase the accuracy of measurement of the sensitivity of a deviation, to reduce time costs, to provide automation of the measurement process, to significantly improve the working conditions of the operator. It can be used on the enterprise manufacturers of CRT, as well as on enterprises using CRT in systems for the accurate measurement of object parameters. Formula of the invention A method of measuring the sensitivity to a deviation of a cathode ray tube, consisting in the deviation of an electron beam, forming images of scanning lines on the screen and determining the ratio of the deviation of the electron beam to the deviation voltage, in order to increase the accuracy and reduce the measurement time , the image of the scanning lines is formed by pulses of tones. The electronic digital sweep filling the working part of the screen, the magnitude of the electron beam retracting is determined using a scale grid superimposed on the working part of the screen, 6 nodal points of which are placed by optical micro-sensors, and the deviation voltage is defined as the difference of unoperated electrical co-ordinates the scale grid points on the zoomed electron beam deviation size multiplied by the scale factor. Sources of information taken into account in the examination 1. Koganov I. L. Industrial electr., A. M., Goseirgoizdat, -1961 with. 371-373. 2, Oscillographic electron tube. Methods of measuring axial parameters. GOST. 4-74 (prototype).

Claims (1)

Claim A method for measuring the sensitivity to deviation of a cathode ray tube, which consists in deflecting an electron beam, forming on the screen images of scan lines and determining a ratio of the magnitude of the deviation of the electron beam to the value of the deflecting voltage, characterized in that, in order to increase the accuracy and reduce the measurement time, the image of the lines 960998 of the 6th ray multiplied by the scale factor. sweeps are formed by pulses of linear electronic digital sweep filling the working part of the screen, the deviation of the electron beam is determined using a scale grid superimposed on the working part of the screen, at the nodal points of which are placed photo-optical microchips, and the value of the deflecting voltage is determined as the difference of the same name, 10 nat of the nodal points of the scale grid at a given size of the deviation of the electron