SU926606A1 - Device for measuring distribution of resonator electromagnetic field strength - Google Patents

Description

(5) DEVICE FOR MEASURING THE STRESS DISTRIBUTION OF ELECTROMAGNETIC FIELD

I.

The invention relates to an ultra-high frequency (microwave frequency) guard and can be used to measure the distribution of an electromagnetic field in a resonator .;

A device is known for measuring the intensity of the ejetromagnetic field of a resonator, containing a spherical perturbing body installed inside the resonator under investigation, and an indicator whose input is the input of a signal from the 1P resonator under investigation.

However, the known device has insufficient sensitivity and measurement accuracy due to the fact that metallic perturbing bodies distort the pattern of lines of force and, as a consequence, introduce an error in the measurement of its distribution,

The purpose of the invention is to increase accuracy while increasing sensitivity. RESONATOR

The goal is achieved by the fact that the device for measuring the distribution of the intensity of the electromagnetic field of a resonator contains a spherical perturbing body made of high-resistance photo-semiconductor material and installed inside the resonator under investigation, the indicator whose input is the input of the signal from the investigated

10, and an amplitude-modulated optical radiation source installed outside the resonator under study for irradiating the disturbing body.

15

The drawing shows a structural electrical circuit of the proposed device.

The device contains a spherical perturbing body 1, a resonator 2 under investigation, an indicator 3, an amplitude-modulated optical radiation source C, an ultra high frequency (UHF) oscillator 5, a decoupling gate, a lens system 7 and a microwave detector 8. The device works as follows. The disturbing body 1 introduced into the field of the resonator 2 under study, which is used as a photoconductive material, is illuminated with amplitude-modulated optical radiation, and the amplitude of the change of its transmission coefficient is measured as a parameter of the investigated resonator 2 with the disturbing body 1. A perturbing body 1 of radius 5 m is made of a high-resistance semi-semiconductor material for which condition 1 f is the specific resistance of the photo of the semiconductor material; 6f its dielectric constant; UJ - the frequency of the studied sex. Inequality (1) reflects the fact that in a photo-semiconductor material at frequency w there is no screening of the electric field by free current carriers and, therefore, the field pattern in it is similar to the distribution in the dielectric, i.e. The structure of the field lines in the resonator 2 under study does not undergo distortions. BbicoKOOMHoe disturbing body 1, causing a small change in the resonant frequency of the investigated resonator 2 (due to the above reasons) is illuminated with modulated optical radiation with a wavelength

Claims (2)

. HGR D is the boundary wavelength corresponding to its own absorption. Condition (2) reflects the fact that in the photo-semiconductor perturbing body 1 there occurs an intrinsic absorption of optical radiation and, therefore, a non-equilibrium conductivity is created, which varies with the frequency / modulation of the optical radiation. Due to this, it is possible to carry out modulation of the transmission coefficient of the resonator under investigation, and the amplitude of the envelope can serve as a measure of the magnitude of the electromagnetic field at the point where the disturbing body 1 is located. The microwave power from the generator 5 Eres the interrupting valve 6 is supplied to the resonator 2 under study. The transmission coefficient of the resonator 2 under study is modulated with the help of the illumination of the photo-semiconductor perturbing body 1 placed in the cavity of the resonator under investigation. 2. Illumination of the disturbing body 1 is carried out by a source 4 of amplitude-modulated optical radiation, which is focused at the point of location of the disturbing object using a lens system 7. The power transmitted through the investigated resonator 2 is detected by the detector 8, the amplitude-modulated signal is recorded. The oscilloscope 9a modulates the depth of signal modulation using a selective voltmeter 10. The technical advantages of the proposed device for measuring the field distribution in the resonator under study consist in increasing the range of measured voltages and increasing the accuracy of measuring the field distribution. If spheres of the same size are chosen as the perturbing body in the known and proposed arrangements, then the field strength measured by the perturbing body of photo-semiconductor material is minimal, three orders of magnitude smaller than that measured by the perturbing body made of metal. Moreover, the measurement accuracy, despite the identical dimensions of the perturbing bodies, is higher, since the metal sphere distorts the picture of the floor more strongly. Apparatus of the Invention A device for measuring the intensity distribution of a resonator's electromagnetic field, comprising a spherical perturbing body installed inside a resonator under investigation, and an indicator whose input is an input signal from the resonator under investigation, characterized in that, in order to improve accuracy while simultaneously increasing sensitivity, the spherical-shaped perturbing body is made of high-resistance photo-semiconductor material, and an amplitude-modulated optical source is introduced About radiation for irradiating a spherical form of a perturbing body, installed outside the resonator under study. Sources of information taken into account in the examination 1. Tisher F. Technique measurements at ultrahigh frequencies. M., Fizmatgie, 1963, p. (prototype).