SU752203A1 - Digital analyzer of semiconductor device time characteristics - Google Patents

Description

my values by increasing the accuracy of setting the pa: 1trov of the test impulse of the nporpaiMMnpyeMoro generator directly on the outputs of the device under test. The goal is achieved by the fact that the analyzer has additionally introduced a unit for comparing and correcting dough pulses consisting of a time relay, a device for analogue and comparing, a memory device and a digital-analog converter, and a device for analyzing and comparing connected to a time relay, a control unit, an auto.shift device directly. and with the clock pulse generator via a digital-to-analog converter.

The scheme of the described device noisa3ai: a in the drawing.

The digital analyzer contains a strobe pulse auto-shift system / connected to a frequency generator of test pulses 2 which, in conjunction with a strobe pulse auto-shift system /, sets the frequency of the test pulse generator 3. The last one, in turn, is designed for amplification, change, and duration and delays of test pulses supplied to the input of the test instrument, for example, an IC placed in contact device 4. Measurement control unit 5 with its inputs is connected with a stroboscopic discriminator 6 rN by the switch 7. Measurement control unit 5 controls the operation of the autoswitch system 1, shaper of test i-pulses 2, generator of test pulses 3 and unit of comparison and correction of parameters of the generator of test pulses 8, including memory and digital analog conversion of amplitude values 9, offset 10, fr. duration of the test pulse, analysis and comparison device 12 and time relay 13. A commutator 7 connects the outputs of the test IC to the stroboscopic speed discriminator 6 , sources of supply and loads (the latter are not shown on the drawing). The values of the measured parameters of the test pulse for the mean time are transferred from the automatic shift system of the strobe pulses to the device A. Analysis and comparison 12. And from its output through the devices 9, 10, 11 to the generator of test pulses 3. Analyze. p works as follows.

The test pulse, with a following frequency, programmed by my control unit 5 and determined by the autoshift system / and frequency generator of test pulse 2, is sent to the test pulse generator 3.

(The parameters of the test pulse (amplitude, offset, duration of the front end) are programmed depending on the type of the measured circuit in the test pulse generator. 3c block, comparison and correction of the parameters of the test pulse generator 5 and from the control unit 5. Before the measurement starts, test imdulse with given parameters. is supplied through

comm (Mutator 7 for the circuit under test, as well as. and directly to the strobe. discriminator 6, which is gated by the strobe pulses of the automatic shift device).

The measurement of the parameters of the dough pulse is performed by its meter having a high accuracy of measurement. Measured values of test pulse parameters from an autoshift device /

transferred to the device for analysis and comparison 12, where CPA (look with the specified ones. If the measured and specified parameters differ, the values of the specified parameters are adjusted using the device 9, 10,

//. The CoPtrol and Parameter Correction of the meters of tests: the impulse is carried out periodically. The frequency of the correction control is determined by the time relay .13 or by the measurement program. The accuracy of measuring the dynamic parameters of the IC is significantly impaired.

F o ip m th l invention

A digital analyzer of temporal characteristics of semiconductor devices, containing a contact device for connecting a test device and a test pulse generator, which through

The switch is connected "on the input of the stroboscopic discriminator, the device and the VTO shift strobe connected to the input of the receiver directly and directly to the input of the test pulse generator via the frequency generator of the test pulses, device autoshift, fo.r world and

A generator of the frequency of test pulses, characterized in that, in order to improve the measurement accuracy, an additional analyzer has been introduced (a unit for comparison and correction of test pulses, consisting

from a time relay, an apalysis and comparison device, a memory device and a digital-to-analog converter, the analysis and comparison device being connected to a time relay by a control unit, a device

autoshift directly, and with a generator of clock pulses through a digital-analog converter.

Sources of info.rma.tsii, pr.Iptye in v.ni.ni.ni l.ri expertise:

1. Autorekoy certificate of the USSR № 3596.39, cl. G 05 B 23/02, 1972.

2. The copyright certificate of application no. 2518245/25, cl. G 01 R 31/26, 1977 (prototype).

Claims (1)

Claim A digital analyzer of the time characteristics of semiconductor devices, containing a contact device for connecting the test device and a test pulse generator, which are connected through the switch to the input of the stroboscopic discriminator, a strobe pulse auto-shifter connected to the input of the latter directly and to the input of the test pulse generator via the test pulse frequency generator, a control unit connected to the inputs with a stroboscopic discriminator and a switch, and the input an auto-shift device, a shaper and a generator of test pulse frequencies, characterized in that, in order to increase the accuracy of the measurement, the analyzer additionally includes a unit for comparing and correcting test pulses, consisting of a time relay, an analysis and comparison device, a memory device and a digital-to-analog converter, moreover, the analysis and comparison device is connected to a time relay by a control unit, an auto-shift device directly, and to a clock generator via a digital-to-analog converter.