SU742822A1 - Device for measuring resonance frequencies of piezoceramic resonators - Google Patents
Device for measuring resonance frequencies of piezoceramic resonators Download PDFInfo
- Publication number
- SU742822A1 SU742822A1 SU782700654A SU2700654A SU742822A1 SU 742822 A1 SU742822 A1 SU 742822A1 SU 782700654 A SU782700654 A SU 782700654A SU 2700654 A SU2700654 A SU 2700654A SU 742822 A1 SU742822 A1 SU 742822A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- piezoceramic
- resonator
- resonance frequencies
- generator
- measured
- Prior art date
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- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
Description
матор 5, например, - на неинвертирующий вход операционного усилител 3.Mat 5, for example, to the non-inverting input of the op amp 3.
Особенно эффективно обострение г1мйпитудно-частотной характеристики пьзэокерамического резонатора при использовании положительной обратной св эк, когда частота генератора совпадает с резонансной частотой пьезокерамвческого резонатора, импеданс Которого при этом резко уменьшаетс и тем НЕШболее существенно увеличиваетс коэффициент усилени операционпого усилител .Especially effective is the sharpening of the frequency-response characteristic of a piezoceramic resonator using positive feedback, when the generator frequency coincides with the resonant frequency of the piezoceramic resonator, whose impedance sharply decreases and thereby significantly increases the gain of the operational amplifier.
;В iTipejipiaraeMOM устройстве четырехполюсник вследствие большой селекТИЕ|НОСТИ имеет очень узкую полосу прс|пускани , котора в р де случаев ло |ет составл ть 1 Гц, благодар че. му резко повышаетс точность определе и максимума амплитудно-частотной характеристики пьезокерамического резойатора . При этом вли ние добротности ;резонатора на результат измерени рефко снижаетс в св зи с повышением селективности четырехполюсника в цепом , что приводит к уменьшению погрешности измерени резонансных частот.; In the iTipejipiaraeMOM device, the quadrupole due to the large selec- tion of the | STEET has a very narrow bandwidth, which in some cases is 1 Hz, thanks to something. The accuracy of the determination and maximum of the amplitude-frequency characteristic of a piezoceramic resistor is greatly increased. At the same time, the influence of the quality factor of the resonator on the measurement result of the refco decreases in connection with an increase in the selectivity of the quadrupole in the circuit, which leads to a decrease in the measurement error of the resonant frequencies.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU782700654A SU742822A1 (en) | 1978-12-18 | 1978-12-18 | Device for measuring resonance frequencies of piezoceramic resonators |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU782700654A SU742822A1 (en) | 1978-12-18 | 1978-12-18 | Device for measuring resonance frequencies of piezoceramic resonators |
Publications (1)
Publication Number | Publication Date |
---|---|
SU742822A1 true SU742822A1 (en) | 1980-06-25 |
Family
ID=20800196
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU782700654A SU742822A1 (en) | 1978-12-18 | 1978-12-18 | Device for measuring resonance frequencies of piezoceramic resonators |
Country Status (1)
Country | Link |
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SU (1) | SU742822A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2765836C2 (en) * | 2020-07-03 | 2022-02-03 | Федеральное государственное бюджетное учреждение науки Институт проблем управления им. В.А. Трапезникова Российской академии наук | Method for measuring resonant frequency and q-factor |
-
1978
- 1978-12-18 SU SU782700654A patent/SU742822A1/en active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2765836C2 (en) * | 2020-07-03 | 2022-02-03 | Федеральное государственное бюджетное учреждение науки Институт проблем управления им. В.А. Трапезникова Российской академии наук | Method for measuring resonant frequency and q-factor |
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