SU615432A1 - Arrangement for testing microcircuit parameters - Google Patents

Description

The invention relates to electronic engineering and can be used to control the parameters of microcircuits.

Devices are known for monitoring current parameters of microcircuits.

One of the known devices for KOIS control of current parameters, the microcircuit contains a software voltage source with a repeater in the feedback circuit, a switch, a null indicator, a programmable current source, a measuring line, a recorder and a control signal generator 1 |.

The main disadvantage of this device is the presence of a significant leakage current generated by a repeater and a programmed current source connected in parallel to the input of the test chip, RpoMe, the presence of these elements reduces the electrical strength of the measuring path.

Another disadvantage of the device is the difficulty of technical implementation of a high-precision low current generator.

The closest technical solution to the present invention is a device for monitoring the parameters of a vikroschema containing a software station, connected to a control signal generator, a registrator, a voltage meter, a commutator, as well as through a collector circuit equipped with a memory card and and via a switch connected via a measuring line with a shotgun j.

The core of the known device is the reduced electrical conductivity of the measuring line and a significant leakage current caused by the repetition of the shaft, which is set to reduce the capacitance of the remote path with a fast response rate. This creates limitations for such devices in the range of measurable parameter chips.

The goal of H3 € JpeTeKHH is to expand the range of measured parameters of the microcircuits.

The goal is achieved by the fact that the proposed device contains a strobe signal generator, a matching transformer and a switch, and to the control signal generator, one can be connected in series with a strobe signal generator, matching tpaBcfu.pJSSTOp; key connected in parallel with the fOKOCXc mmy resistor.

This arrangement / icTBO allows you to expand the range of monitored parameters of microcircuits.

This is achieved due to the fact that in this device the intrinsic leakage current and electrical strength of the measurement line of the military is determined by the characteristics of the matching transformer.

The transformer, which is used with modern insulating materials, provides a lower leakage current and a much higher electrical resistance than the riotor.

The introduction of a key connected in parallel with the collector resistor and a strobe signal generator avoids a decrease in the device speed.

The drawing shows the scheme of the described device for controlling the parameters of the chip.

The device contains a software source and a hardware I, which serves to set the required mode on the checked output of chip 2, as well as on other terminals determining its internal state, current collector 3. equipped with a MyjaTOp 4 memory management circuit and a measuring device {Illumination 5 through which a controlled current flows, a voltage meter 6 measuring the voltage drop across the current collector resistor 3, a result recorder 7 connected to the voltage meter 6 and the control signal generator 8. Control generator signals output 8, moreover, is connected to the gating signal generator 9, the output Kotorogo voltage pulse through a matching transformer 10 is applied to the key 11, soedi1 eniyyso tokoskhemnogo resistor control circuit 3, a switch 4 and a voltage meter 6.

The device works but the program. The control signal generator 8 generates a test command — in the form of n-bit control words, which are recorded in the program voltage source J, switch 4, measure. He is a wife of Reg. 6, Reg. 7, and in the memory control circuit there is a lot of resis. torus 3 by the signal of their address and service signal. “Launch. Thus, in each of these objects, the necessary information is entered for carrying out this test (test) according to which voltage meter 6, the collector 3 n of the program source receive the specified settings. Switch 4 produces a test mode for the tested output of chip 2, which is programmed to take into account the fall of the voltage on the current-carrying resistor 3. In addition, the internal state 2 of the stimulus voltages on the output, which is not measured, is set.

The duration of one test T is determined by the time interval between the "Run" signals corresponding to a single address. By this signal, the strobe signal generator 9 through the matching transformer 10 maintains the key P in the on state for a time Ti 0.1 Tr. During this period of time, the capacitance is quickly charged and measure the voltage through the low resistance of the key P. After turning off the key 11 the time interval Td-Tt through the collector resistor 3 only the current is controlled by W (chips 2 the line capacity is already charged and the leakage current of the matching transformer is very small. This is achieved by making the matching transformer frame Partitioned from a dielectric with a large specific surface and volume resistance, for example, from a fluoroplastic, and the primary and secondary windings are placed in different sections.

Voltage meter 6 evaluates the magnitude of the flowing current of the microcircuit 2 by the voltage drop on the current-circuit resistor 3 according to the Goden-Unsuitable principle. This information, in the form of a high or low level, is transmitted to the recorder 7, which contains an exclusive-OR logic and a memory register storing the control results.

Comparative tests of this device with the known one showed the possibility of extending the range of measured current parameters of the microcircuits by two gigawas and test voltages to OOOV.

This allows you to monitor microchips with optocoupler connections.

Claims (2)

Invention Formula A device for controlling the parameters of a microcircuit containing a software voltage source connected to a control signal generator, a recorder, a voltage meter, a switch, as well as through a current collector resistor equipped with a memory control circuit, and directly to a switch connected through measuring line with the device under test, which is based on the fact that, in order to expand the range of measured parameters, it contains a series-connected strobe signal generator., a matching transformer a key attached to the generator control signals, and the key of the collector yodklyuchepny parallel resistor .. Sources of information taken into account in the examination: L USSR Author's Certificate 417748, cl. G 01 R 31/26, 1974. 2. Suy patent number 3423677, cl. 324-73, 1969.