SU596894A1 - Method of determining maximum permissible current of avalanche transit time diodes - Google Patents
Method of determining maximum permissible current of avalanche transit time diodesInfo
- Publication number
- SU596894A1 SU596894A1 SU762357011A SU2357011A SU596894A1 SU 596894 A1 SU596894 A1 SU 596894A1 SU 762357011 A SU762357011 A SU 762357011A SU 2357011 A SU2357011 A SU 2357011A SU 596894 A1 SU596894 A1 SU 596894A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- maximum permissible
- transit time
- permissible current
- determining maximum
- current
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Description
ток (например, частотой 2МГц и амплитудой 5мА), после чего пиковое напр жение на диоде восстанавли,заетс д его зафиксированного УРОВНЯ регулированием температуры корпуса диода-. Регулирование температуры проводитс с помосц| ю малоинерционного термостати рукадего устройства (диапазон регулиро ки от О до 1б°С). В качестве прибора, регистрирующего приращение температур корпуса диода и имеющего градуировку в величинах максимально допустимого тока и рабочего тока, используетс вольтметр в цепи подогрева теплоносител в термостатирующем устройстве. Производительность измерений с записью значений измеренных параметров составл ет около 30 измерений в час. изобретени Форггула Способ определени максимально допустимого тока лавинно- пролетных диодов , заключающийс в пропускании обратного измерительного тока чепез диод И скачкообразном его уменьшении, а также подаче высокочастотного тока и регистрации падени напр жени на диоде, отличающийс тем, что, .с целью повышени скорости и точности измерений, высокочастотный ток включают одновременно со скачкообразным уменьшением измерительного тока, при чем амплитуду высокочастотного тока выбирают равной скачку измерительного тока, и восстанавливают величину первоначального пикового падени напр жени на диоде регулировкой температуры корпуса диода. Источники информации, прин тые во внимаТ1ие при экспертизе: i. Патент ГДР 89915, кл. 21 Р 31/22, 12.05.77. 2. Аронов В.Л., Федотов Я.А. Испытани и исследование полупроводниковых приборов, М,, Высша школа , 1975, с. 243.the current (for example, a frequency of 2 MHz and an amplitude of 5 mA), after which the peak voltage on the diode was restored, is set to its fixed LEVEL by controlling the temperature of the diode housing. Temperature control is carried out with help | This unit has a low-inertia thermostat of the device (adjustment range is from 0 to 1b ° C). As a device that records the temperature increment of the diode case and has a graduation in terms of the maximum allowable current and operating current, a voltmeter is used in the heating circuit of the heat carrier in a thermostatic device. The measurement performance with the recorded values of the measured parameters is about 30 measurements per hour. Inorgul's invention. A method for determining the maximum permissible current of avalanche-span diodes, which consists of passing a reverse measuring current through a diode And abruptly decreasing it, as well as applying a high-frequency current and detecting a voltage drop across a diode, characterized in that it increases speed and accuracy. measurements, the high-frequency current is switched on simultaneously with a stepwise decrease in the measuring current, and the amplitude of the high-frequency current is chosen to be equal to the jump in the measuring current, and The magnitude of the initial peak voltage drop across the diode is adjusted by adjusting the temperature of the diode housing. Sources of information taken into account during the examination: i. Patent GDR 89915, cl. 21 P 31/22, 12.05.77. 2. Aronov V.L., Fedotov Ya.A. Testing and research of semiconductor devices, M ,, Higher School, 1975, p. 243.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU762357011A SU596894A1 (en) | 1976-05-06 | 1976-05-06 | Method of determining maximum permissible current of avalanche transit time diodes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU762357011A SU596894A1 (en) | 1976-05-06 | 1976-05-06 | Method of determining maximum permissible current of avalanche transit time diodes |
Publications (1)
Publication Number | Publication Date |
---|---|
SU596894A1 true SU596894A1 (en) | 1978-03-05 |
Family
ID=20660205
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU762357011A SU596894A1 (en) | 1976-05-06 | 1976-05-06 | Method of determining maximum permissible current of avalanche transit time diodes |
Country Status (1)
Country | Link |
---|---|
SU (1) | SU596894A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU184633U1 (en) * | 2018-06-04 | 2018-11-01 | Акционерное общество "ПРОТОН-ЭЛЕКТРОТЕКС" | INSTALLATION FOR TESTING AVALANCHE DIODES ON RESISTANCE TO THE INFLUENCE OF SHOCK POWER OF REVERSE LOSSES |
-
1976
- 1976-05-06 SU SU762357011A patent/SU596894A1/en active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU184633U1 (en) * | 2018-06-04 | 2018-11-01 | Акционерное общество "ПРОТОН-ЭЛЕКТРОТЕКС" | INSTALLATION FOR TESTING AVALANCHE DIODES ON RESISTANCE TO THE INFLUENCE OF SHOCK POWER OF REVERSE LOSSES |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101685078B (en) | Method for operating a heatable exhaust gas probe | |
SU596894A1 (en) | Method of determining maximum permissible current of avalanche transit time diodes | |
GB1590794A (en) | Viscosimeter and/or densitometer | |
RU2529761C1 (en) | Method to measure thermal junction-to-case resistance of semiconductor instrument and device for its realisation | |
ATE76966T1 (en) | TEMPERATURE MEASUREMENT DEVICE FOR DETECTING LARGE TEMPERATURE FLUCTUATIONS. | |
GB1403711A (en) | Ignition test instrument | |
RU2677262C1 (en) | Digital temperature meter | |
JPS568563A (en) | Measuring device for reactance change | |
US4066948A (en) | Concentration measuring apparatus and process | |
RU2682101C1 (en) | Temperature meter | |
SU920581A1 (en) | Method of measuring diode volt-amper characteristic perfection coefficient | |
SU421959A1 (en) | METHOD OF MEASURING PUNCHING VOLTAGE;? - p-TRANSITIONS OF SEMICONDUCTOR INSTRUMENTS WITH AIRBALL MECHANISM OF BREAKTHROUGH | |
SU777613A1 (en) | Device for registering lightnings | |
SU637676A1 (en) | Gaseous and liquid media parameter measuring method | |
SU957135A1 (en) | Method of measuring avalanche transit time diod heat resistance | |
SU834760A1 (en) | Device for monitoring frequency characteristic of tape recorder | |
SU636562A1 (en) | Arrangement for non-destructive measuring of power semiconductor device impact current | |
SU647555A2 (en) | Device for contact-free measuring of rotating article temperature | |
SU805218A1 (en) | Method of testing electro-thermal pulse pickups of non-electric values | |
SU645098A1 (en) | Capacitance measuring method | |
SU434324A1 (en) | Frequency meter | |
SU978075A1 (en) | Automatic dielcometer | |
SU567939A1 (en) | Small displacement measuring device | |
SU1711052A1 (en) | Method of testing heat-insulating material thermophysical characteristics | |
SU1012161A1 (en) | Method of controlling quality of semiconductor device structure component connection |