SU596894A1 - Method of determining maximum permissible current of avalanche transit time diodes - Google Patents

Method of determining maximum permissible current of avalanche transit time diodes

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Publication number
SU596894A1
SU596894A1 SU762357011A SU2357011A SU596894A1 SU 596894 A1 SU596894 A1 SU 596894A1 SU 762357011 A SU762357011 A SU 762357011A SU 2357011 A SU2357011 A SU 2357011A SU 596894 A1 SU596894 A1 SU 596894A1
Authority
SU
USSR - Soviet Union
Prior art keywords
maximum permissible
transit time
permissible current
determining maximum
current
Prior art date
Application number
SU762357011A
Other languages
Russian (ru)
Inventor
Вадим Львович Аронов
Иван Иванович Архипов
Original Assignee
Предприятие П/Я А-3562
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Предприятие П/Я А-3562 filed Critical Предприятие П/Я А-3562
Priority to SU762357011A priority Critical patent/SU596894A1/en
Application granted granted Critical
Publication of SU596894A1 publication Critical patent/SU596894A1/en

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Description

ток (например, частотой 2МГц и амплитудой 5мА), после чего пиковое напр жение на диоде восстанавли,заетс  д его зафиксированного УРОВНЯ регулированием температуры корпуса диода-. Регулирование температуры проводитс  с помосц| ю малоинерционного термостати рукадего устройства (диапазон регулиро ки от О до 1б°С). В качестве прибора, регистрирующего приращение температур корпуса диода и имеющего градуировку в величинах максимально допустимого тока и рабочего тока, используетс  вольтметр в цепи подогрева теплоносител  в термостатирующем устройстве. Производительность измерений с записью значений измеренных параметров составл ет около 30 измерений в час. изобретени  Форггула Способ определени  максимально допустимого тока лавинно- пролетных диодов , заключающийс  в пропускании обратного измерительного тока чепез диод И скачкообразном его уменьшении, а также подаче высокочастотного тока и регистрации падени  напр жени  на диоде, отличающийс  тем, что, .с целью повышени  скорости и точности измерений, высокочастотный ток включают одновременно со скачкообразным уменьшением измерительного тока, при чем амплитуду высокочастотного тока выбирают равной скачку измерительного тока, и восстанавливают величину первоначального пикового падени  напр жени  на диоде регулировкой температуры корпуса диода. Источники информации, прин тые во внимаТ1ие при экспертизе: i. Патент ГДР 89915, кл. 21 Р 31/22, 12.05.77. 2. Аронов В.Л., Федотов Я.А. Испытани  и исследование полупроводниковых приборов, М,, Высша  школа , 1975, с. 243.the current (for example, a frequency of 2 MHz and an amplitude of 5 mA), after which the peak voltage on the diode was restored, is set to its fixed LEVEL by controlling the temperature of the diode housing. Temperature control is carried out with help | This unit has a low-inertia thermostat of the device (adjustment range is from 0 to 1b ° C). As a device that records the temperature increment of the diode case and has a graduation in terms of the maximum allowable current and operating current, a voltmeter is used in the heating circuit of the heat carrier in a thermostatic device. The measurement performance with the recorded values of the measured parameters is about 30 measurements per hour. Inorgul's invention. A method for determining the maximum permissible current of avalanche-span diodes, which consists of passing a reverse measuring current through a diode And abruptly decreasing it, as well as applying a high-frequency current and detecting a voltage drop across a diode, characterized in that it increases speed and accuracy. measurements, the high-frequency current is switched on simultaneously with a stepwise decrease in the measuring current, and the amplitude of the high-frequency current is chosen to be equal to the jump in the measuring current, and The magnitude of the initial peak voltage drop across the diode is adjusted by adjusting the temperature of the diode housing. Sources of information taken into account during the examination: i. Patent GDR 89915, cl. 21 P 31/22, 12.05.77. 2. Aronov V.L., Fedotov Ya.A. Testing and research of semiconductor devices, M ,, Higher School, 1975, p. 243.

SU762357011A 1976-05-06 1976-05-06 Method of determining maximum permissible current of avalanche transit time diodes SU596894A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU762357011A SU596894A1 (en) 1976-05-06 1976-05-06 Method of determining maximum permissible current of avalanche transit time diodes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU762357011A SU596894A1 (en) 1976-05-06 1976-05-06 Method of determining maximum permissible current of avalanche transit time diodes

Publications (1)

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SU596894A1 true SU596894A1 (en) 1978-03-05

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Application Number Title Priority Date Filing Date
SU762357011A SU596894A1 (en) 1976-05-06 1976-05-06 Method of determining maximum permissible current of avalanche transit time diodes

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Country Link
SU (1) SU596894A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU184633U1 (en) * 2018-06-04 2018-11-01 Акционерное общество "ПРОТОН-ЭЛЕКТРОТЕКС" INSTALLATION FOR TESTING AVALANCHE DIODES ON RESISTANCE TO THE INFLUENCE OF SHOCK POWER OF REVERSE LOSSES

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU184633U1 (en) * 2018-06-04 2018-11-01 Акционерное общество "ПРОТОН-ЭЛЕКТРОТЕКС" INSTALLATION FOR TESTING AVALANCHE DIODES ON RESISTANCE TO THE INFLUENCE OF SHOCK POWER OF REVERSE LOSSES

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