SU574631A1 - Device for measuring temperature in electric apparatus - Google Patents

Description

one

The invention relates to the field of ten-technical measurements and is intended to measure the temperature in hard-to-reach places of electrical machines and apparatus.

Devices for measuring temperature in electrical apparatuses are known, containing a generator as a thermosensitive element whose natural frequency depends on temperature 1, 2.

However, such devices have a large measurement error, and also contain complex and expensive equipment.

The closest in technical essence to the proposed invention is a device for measuring temperature in electrical devices, comprising a photodiode emitter, a light guide, a photodetector, and a recording apparatus. A light emitting diode is connected to a generator whose frequency is temperature dependent. 3.

However, such a device has a relatively low sensitivity, as well as complex and expensive equipment.

The aim of the invention is to increase the sensitivity.

This is achieved by the fact that the temperature-sensitive element is designed as a semiconductor wafer with a metallic coating on one side, to the other side of which a fiber is connected.

FIG. 1 is a schematic diagram of the proposed device; in fig. 2 - the course of the rays in the temperature-sensitive element of the device.

The device is composed of a light source (IC) 1, a photon receiver (FI) 2 with recording equipment 3, branched into two arms from one end of the optical fiber 4 with irregularly distributed fibers and a temperature sensitive element 5. A flat semiconductor plate is used as a temperature sensitive element, on which a metal nib 6 is applied to reflect light.

The device works as follows.

The IC 1 emits monochromatic light (continuously or in pulses), which enters the optical fiber and is directed to the semiconductor wafer. So long as the fiber is irregular, the fibers that bring light to the plate are evenly shifted with the fibers that drive light from the plate.

FIG. Figure 2 shows the path of the rays emanating from one of these fibers. The light emitted by the fiber end is distributed isotropically and, therefore, is reflected from the metal – semiconductor interface, some rays fall into the fibers that bring light to the plate, and some - to the fibers that emit light from the plate IIIHKii. Rays trapped after reflection into the fibers supplying the light return to the IC and are non-operational. The rays that fall after reflection into the fibers, which emit light, fall onto the AFF 2 and their intensity is recorded by the apparatus 3. If the temperature is constant, the intensity of the light that reaches the OP is also peizmenna, since the fibers at the fiber end are glued together with each other and with the semiconductor plate. As the temperature rises, the absorption coefficient of the light by the semiconductor increases, therefore, the rays that fall into the outgoing fibers of the optical fiber, or increase in intensity. The integrity of the light incident on the FP decreases, this decrease is recorded by the apparatus. The intensity of light measured by the recording apiaaratura is related to the temperature of the cusp plate and, consequently, to the temperature at the device point under study. 4 F o rumula of i b rac C e n n A device for measuring the temperature in electrical apparatus, comprising a light source, a fiber in the form of a fiber bundle, a photoreceiver, a temperature-sensitive element and a recording instrument, characterized in that In order to increase the sensitivity, the temperature-sensitive element is designed as a semiconductor plate with a metallic coating on one side, the fiber of which is connected to the other side. Sources of information taken into account in the examination of 1.Pateit USA No. 2169181, cl. 73-340, 1972. 2. The author's certificate of the USSR No. 415515, cl. G 01K 11/12, 1974. 3.Authorial certificateSSSR 181190, cl. H 02 K 15/00, 1966.

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