SU555128A1 - Quality control method for magnetic heads - Google Patents

Description

I

 The invention relates to instrumentation, in particular, to a method for controlling the quality of magnetic 1X) smart, mainly for recording gopovok.

There is a method of quality control of magnetic heads, based on the use of a scientific research institute of a microscope with a measuring scale in the eye and a set of a number of mirrors. This method is laborious and not a yo-evop er to have a dstatOchnb dog dog presentation on the 6th floor and on its quality, and, on the other hand, on the quality of the test.

The prototype of the invention is a technical solution that represents the control of the quality of magnetic heads, based on an analysis of the distribution patterns of the scattered fields. But when using1. This method of determining the causes of anomalies of the distribution of the scattered fields of the monitored heads takes a long time, which is not always, especially in conditions of mass production, acceptable.

The aim of the invention is to reduce the time to determine the causes of the anomalous distribution of stray fields,

This is achieved in that Cartney floor rasseyni actual magnetic golovkn CPA NIWA with a set of templates, resulting interferentsni by superimposing abutment dochennry rtruktury pines on built ekvypotentsiali heads based Academy of Law Horno anticipated distortions form they Started it no pxrtouTHi arise, for example due zymagaichennosti spout , gluing, curvature of the aasor and other reasons.

Claims (1)

FIG. Figure 1 shows artificially a picture of the sex of a scattered image with equipotentials built using an integrator, and FIG. 2 is a picture of the real floor of an integrated magnetic head obtained with an electron microscope. To obtain stencils, the found xot equipotentials from the surfaces of the models of magnetic crystals are a priori supposedly imparted by distortions on the sheet or on the sheet, which are superimposed on any pattern (for example, by cutting) of the ordered structure of lines or cells. As a result of interference from the ordered system of parallel lines and diverging equipotentials, a moire pattern appears. This picture is similar to that in the electron microscope, ITJC. both are obtained as a result of interference from parallel and radially diverging lines. FIG. Figures 1 and 2 show specific real pictures, the first of which was obtained using a deliberately defect-free magnetic head and using stencils, and the second using an electron microscope. Make the Lenna head close to perfect, i Advantage; The proposed method is also possible in that it can be used for controlling pole tips of heads, where control efficiency is also necessary. The invention The method for controlling the quality of magnetization heads, based on the analysis of patterns of field distribution is scattered, is distinguished by the fact that, in order to reduce the time for determining the causes of the anomalous distribution of scattering fields, the field pattern of a real magnetic head is compared with a set of stencils, obtained as a result of interference from the superimposed NIN of the ordered structure of lines on the constructed equipoteniiiali heads taking into account a priori suspected distortions of the shape of their working surface arising, for example measures due to the magnetization of the spout, hardening, chamfer clearance and other reasons. IV m4-f: k v f T; «« Jw «L-:. :. .v; -v :::: l r -.H -:.; -L: l :: .-: .-.:. ; 4vvi I i G //.- ;; l- :. ;.;:;. .- h-l ..: /. ; -. . V, .-,:. . "1" a f .-. :,: -:; . V .. -. - m. one ;.- .; . Figure 2.t ---.------ :: -. --- .- ui V-t -.-.-. V, ....-. Vs bulffl. .:, - - F-- .... 4 - SK