SU503551A3 - Рентгеновский спектрометр - Google Patents
Рентгеновский спектрометрInfo
- Publication number
- SU503551A3 SU503551A3 SU1895239A SU1895239A SU503551A3 SU 503551 A3 SU503551 A3 SU 503551A3 SU 1895239 A SU1895239 A SU 1895239A SU 1895239 A SU1895239 A SU 1895239A SU 503551 A3 SU503551 A3 SU 503551A3
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- spectrometer
- source
- axis
- ray spectrometer
- sample holder
- Prior art date
Links
- 230000005855 radiation Effects 0.000 description 8
- 239000013078 crystal Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 2
- 238000002485 combustion reaction Methods 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000011152 fibreglass Substances 0.000 description 1
- 229910001234 light alloy Inorganic materials 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
- G01N2223/0568—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction spectro-diffractometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/301—Accessories, mechanical or electrical features portable apparatus
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7209419A FR2175667B1 (enExample) | 1972-03-17 | 1972-03-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU503551A3 true SU503551A3 (ru) | 1976-02-15 |
Family
ID=9095393
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU1895239A SU503551A3 (ru) | 1972-03-17 | 1973-03-16 | Рентгеновский спектрометр |
Country Status (15)
| Country | Link |
|---|---|
| US (1) | US3919549A (enExample) |
| JP (1) | JPS4914184A (enExample) |
| AU (1) | AU470805B2 (enExample) |
| BE (1) | BE796853A (enExample) |
| CA (1) | CA981373A (enExample) |
| CH (1) | CH567264A5 (enExample) |
| DE (1) | DE2313259A1 (enExample) |
| FR (1) | FR2175667B1 (enExample) |
| GB (1) | GB1406332A (enExample) |
| IL (1) | IL41804A (enExample) |
| IT (1) | IT983564B (enExample) |
| LU (1) | LU67226A1 (enExample) |
| NL (1) | NL7303751A (enExample) |
| SU (1) | SU503551A3 (enExample) |
| ZA (1) | ZA731904B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5014287A (en) * | 1990-04-18 | 1991-05-07 | Thornton Michael G | Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants |
| US5842486A (en) * | 1997-11-25 | 1998-12-01 | Sussex Plastics Inc. | Hermetically sealed cosmetic compact case |
| US6199559B1 (en) | 1999-12-27 | 2001-03-13 | Rexam Cosmetic Packaging, Inc. | Hermetically sealed cosmetic compact case |
| CN104144551B (zh) * | 2014-03-05 | 2017-03-29 | 南京康众光电科技有限公司 | 一种可控脉冲发射冷阴极x光机高压电源系统 |
| CN107228871B (zh) * | 2017-07-21 | 2023-07-04 | 中国地质大学（武汉） | 一种便携式x射线分析装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2449066A (en) * | 1946-07-19 | 1948-09-14 | Friedman Herbert | Analysis by fluorescent X-ray excitation |
| US2837656A (en) * | 1956-01-31 | 1958-06-03 | Philips Corp | X-ray analysis system and radiation detector for use in such system |
| JPS421996Y1 (enExample) * | 1964-08-03 | 1967-02-06 | ||
| US3471694A (en) * | 1965-03-01 | 1969-10-07 | Philips Electronics & Pharm In | Charge particle barrier consisting of magnetic means for removing electrons from an x-ray beam |
| US3435211A (en) * | 1966-01-04 | 1969-03-25 | Stanford Research Inst | Gaseous glow discharge tube with cathode means surrounding anode means |
| LU54494A1 (enExample) * | 1967-09-18 | 1969-06-24 |
-
1972
- 1972-03-17 FR FR7209419A patent/FR2175667B1/fr not_active Expired
-
1973
- 1973-03-16 CA CA166,594A patent/CA981373A/en not_active Expired
- 1973-03-16 IT IT21702/73A patent/IT983564B/it active
- 1973-03-16 NL NL7303751A patent/NL7303751A/xx not_active Application Discontinuation
- 1973-03-16 IL IL41804A patent/IL41804A/en unknown
- 1973-03-16 CH CH388873A patent/CH567264A5/xx not_active IP Right Cessation
- 1973-03-16 SU SU1895239A patent/SU503551A3/ru active
- 1973-03-16 DE DE2313259A patent/DE2313259A1/de active Pending
- 1973-03-16 BE BE128854A patent/BE796853A/xx unknown
- 1973-03-16 GB GB1278773A patent/GB1406332A/en not_active Expired
- 1973-03-16 US US342279A patent/US3919549A/en not_active Expired - Lifetime
- 1973-03-16 LU LU67226A patent/LU67226A1/xx unknown
- 1973-03-17 JP JP48031341A patent/JPS4914184A/ja active Pending
- 1973-03-19 AU AU53420/73A patent/AU470805B2/en not_active Expired
- 1973-03-19 ZA ZA731904A patent/ZA731904B/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| LU67226A1 (enExample) | 1973-05-22 |
| NL7303751A (enExample) | 1973-09-19 |
| IT983564B (it) | 1974-11-11 |
| DE2313259A1 (de) | 1973-09-27 |
| CA981373A (en) | 1976-01-06 |
| AU5342073A (en) | 1974-09-19 |
| IL41804A (en) | 1976-06-30 |
| FR2175667B1 (enExample) | 1974-08-02 |
| GB1406332A (en) | 1975-09-17 |
| ZA731904B (en) | 1974-03-27 |
| AU470805B2 (en) | 1976-04-01 |
| JPS4914184A (enExample) | 1974-02-07 |
| IL41804A0 (en) | 1973-05-31 |
| US3919549A (en) | 1975-11-11 |
| BE796853A (fr) | 1973-07-16 |
| CH567264A5 (enExample) | 1975-09-30 |
| FR2175667A1 (enExample) | 1973-10-26 |
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