SU473133A1 - Device for pre-testing semiconductor devices - Google Patents

Description

one

The invention relates to electronic engineering.

The device is intended for preliminary testing of semiconductor devices and can be used in classifiers and other automatic devices for various purposes.

A device for connecting electrodes of electronic devices to a parameter meter is known. This device does not allow, at the same time as controlling the orientation of the electrodes of semiconductor devices in a contact device, to reject semiconductor devices with a permanent short circuit in the electrode leads or / -n junctions. In addition, in the case of the QZR p-junction, it is impossible to protect the parameter meter from overloads.

The aim of the invention is to reject semiconductor devices with a permanent short circuit of electrode leads or a p-junction and simultaneously control the orientation of the semiconductor device in a contact device.

The goal is achieved due to the fact that storage devices that are parallel to the device containing the power supply unit, the parameter meter, the composite transistor unit, the key block, the connecting device and the sorting device are entered.

connected to the outputs of the transistors and RC-nepochkami and consistently through a block of keys to the connecting device.

The drawing shows an olok diagram of the proposed device for pre-testing semiconductor devices.

The device contains a power supply unit 1, a unit of composite transistors 2, a block of keys 3, a connecting device 4, a sorting device 5, a parameter meter o. The composite transistor block 2 is connected via a key block 3 with a connecting device 4, with a sorting device 5 and a parameter meter 6.

When connecting the test semiconductor device to the device 4 composition TC electrical circuits.

The current will flow through the circuit of the composite transistor, the conductivity of which coincides with the polarity of the included p-j junction. So, when the polarity of the tested p-junction connected with the conductivity of transistor 7 coincides, transistor 7 opens, charges capacitance 8 and, through resistor 9, charges capacitance 10. Transistor I opens, and the signal goes to a block of keys 3 that disconnect the circuits the transistors 7, 11 from the connecting device 4 and make the required connection of the electrode terminals

the semiconductor device under test to the parameter meter 6.

When the polarity of the p-l junction being connected to the circuit with the conductivity of transistor 12 coincides, transistor 12 opens, charges capacitance 13 and, through resistor 14, charges capacitance 15. Transistor 16 opens, and the signal goes to key block 3. Other operations are similar set forth.

When connected to the connecting device 4 of the device, in which a short circuit occurs in the pn-junction or electrode leads, transistors 12, 16 and the capacitance 13, 15 are opened in the positive half-cycle of alternating voltage of the power supply unit 1, and in the negative half-cycle transistors 7, 11 and capacitances 8, 10 are charged at the alternating voltage. with tiruyuschee device 5 will go signal, the apparatus operates and Discard test semiconductor device

with a short circuit in the electrode pins or pn junction.

The automatic device, created on the basis of the proposed device, allowed raising the productivity more than 10 times and increasing the output of suitable devices by 2.5%. The automatic device was tested on transistors of type KT-315 with sorting cycles of 10,000 transistors per hour.

Subject invention

A device for pre-testing semiconductor devices comprising

power supply unit, parameter meter, composite transistor unit, key block, connecting and sorting devices, characterized in that, in order to reject short circuits in the p-l junction, c. simultaneous control of the orientation of the device in the contact device, it contains storage capacitors that are connected in parallel to the outputs of the composite transistors and the / C-chains and sequentially through the unit

keys to the connecting device.

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