SU472346A1 - Monitoring device for contacting probe installations - Google Patents

Description

one

The invention relates to computing and can be used in automated devices for controlling integrated circuits.

There are known devices for controlling the contacting of PROBE installations, containing a head with probes, a measuring circuit, an integrated circuit under study.

The purpose of the invention is to increase the reliability of the control.

This is achieved by introducing electromagnetic relays into the device, a NOT-OR logic circuit, a trigger, a voltage source and resistors, with the moving contacts of each electromagnetic relay connected to the probe heads, normally closed contacts to the inputs of the measuring circuit, normally open contacts with the inputs of the logic circuit "IE - OR" and through the resistors with a voltage source, and the output of the logic circuit "NOT - OR connected to the trigger input.

The drawing shows the scheme of the proposed device control probe installations.

The integrated circuit 1 has contact strips which, with the aid of probes 2-6, are connected to a measuring circuit. Probe 2 connects the common power supply bus with ground ground circuit 1, and with probes 3-6 and through normally closed contacts of relay 7-10, the outputs of circuit 1 are connected to measuring circuit 11.

After the integrated circuit has been placed under the probes and the coordinate table has been lifted to provide contacts of the probes 2-6 with the contact pads of the circuit 1, the relay 7-10 is activated, disconnecting the probes 3-6 from the measuring circuit 11, connecting the probes 3-

6 through resistors 12–15 to power source 16 providing direct bias of the diodes associated with the pads. At the same time, a current flows from resistance 12-15, and to the inputs of the logic circuit "NOT - OR 17" and low load levels are reached, and at the output of the circuit "NOT - OR 17, a high level appears, which flips trigger 18. If at least one probe (3, 4, 5 or 6) is not

has an electrical contact with the output of the integrated circuit 1, the current does not flow through the corresponding resistance, and a high voltage level is supplied to one of the inputs of the “IE – OR” circuit.

From the output of the circuit 17 and the trigger input 18, a low voltage level is received, and the trigger 18 remains in the initial state, which indicates the absence of electrical contact of the corresponding probe. The number of the probe without electrical contact with

integrated circuit, is determined by the absence of current through the corresponding resistance.

Subject invention

A device for controlling contacting probe installations, containing heads with probes, a measuring circuit, an integrated circuit under investigation, characterized in that, in order to increase the control reliability, electromagnetic relays are introduced into it, a logical circuit "NOT - OR, trigger, voltage source and resistors , the moving contacts of each electromagnetic relay are connected to the probes of the heads, normally closed contacts - to the inputs of the measuring circuit, normally open contacts - to the inputs of the logic circuit "NOT - OR and through the cut the blinds with a source voltage, and the output of logic "NOT - OR coupled to an input trigger.