SU425235A1 - DEVICE FOR TESTING THE CONTACT OF SWITCHING MACHINES - Google Patents

Description

one

The present invention relates to electrical devices for testing the co-tacts of switching devices and can be used to determine the durability of the relay contacts and to control the parameters of the contacts being tested during testing.

Devices for testing contacts of electromagnetic relays are known, comprising a pulse generator, a control circuit including sensing and logic elements, and a failure control node.

To enable testing of a large number of contacts of switching devices, a disconnecting contact of the control relay is connected in series with each contact of the device under test, the winding of which is connected in parallel with its own and test contacts, as well as one sensitive element for all tested contacts. At the same time, the pulse counter is connected to the input of the current supply driver of the contacts of the test apparatus and logic elements.

The drawing shows the electrical circuit of the proposed device.

The device contains a pulse generator 1, which determines the frequency of the circuit. The output of the pulse generator 1 is connected through the disconnecting contacts of the PI executive

relay 2 with the input of a synchronizing pulse counter 3, the output of which is connected to the current driver 4 of the power supply of the contacts of the apparatus under test (relay). Contact Pz

an auxiliary electromagnetic relay provides the switching of the windings of the tested relays Pa, Pb, P-relay assembly is a series connection of cells built on

following principle. The contacts of the relays Pa, Pb, and -Rt are connected in series with the open contacts of the relay for the detection of failures of the relay protection relay, RD-R, the windings of which are connected in series to form branches parallel to the contact circuits. The branches in each cell are connected the fault detection relay is connected in parallel with a circuit consisting of its own normally closed contact

and the closing contact of the tested relay. Sensitive element 5 is connected in series with the relay assemblies, the output of which is connected to the zero control trigger input 6. The single installation trigger input of control 6 is connected to the output of synchronizing counter 3. The output of control trigger 6 is connected to the input of the coincidence circuit 7 "And, to another input of which Sigpal "Poll from the synchronization counter 3 is received. The output of the coincidence circuit 7 is connected to the input of the fault entry element 8. The transition of the fault memory element 8 to one state is called t triggered by relay 2 through relay amplifier 9. Relay amplifier 10, the input of which is connected to synchronization counter 3, and relay 11 is intended for switching the windings of the tested relays Pa, Pb ---, РРЪ with which the current regulator 12 is connected. Contacts PI, PZ ---, Lu relays, respectively, include indicator devices, such as signal lamps L, L2, Lz. .., L.

After power is turned on, the pulses from the master oscillator 1 through the disconnecting contact of relay 2 are fed to the input of counter 3, which controls the relay amplifier 10, and trips the contacts of the relays Pa, Pb, and RT with the frequency determined by generator 1 and counter 3. The relay 11 and The supply of the windings to the windings of the tested relays Pa, Pb, and Rt is fixed by the ignition of lamp L1. From the corresponding output of counter 3 to the input of control trigger 6, an impulse arrives, which does not return it to such a state that the match circuit 7 "AND is prepared to pass the interrogation signal from clock counter 3. The pulses from counter 3 delayed relative to the signal applied to a single control trigger input 6, is fed to the input of the current driver 4, in which current pulses with the required parameters are formed, and through the sensing element 5 are supplied to the opening circuit and successively to Keyed contacts of tested relays. The signal taken from the secondary winding of the sensing element 5 returns the control trigger 6 to the initial state. In this case, the " closes "

The polling signal from the corresponding output of the counter 3, which enters the input of the coincidence circuit 7, does not pass through the closed circuit. As a result, the failure memory element 8, the relay amplifier 9 and the relay 2 will remain in the initial state. After operation of the counter 3, the relay amplifier 10 and the relay 11, the contacts of the relays Pa, Pb are tested. , Pm are transferred to other states, and the cycle is repeated as described.

The circuit returns to its initial state by giving the signal "Initial installation in the reset circuit of the pulse counter 3, the trigger

control 6 and the fault memory element 8. The number of relay actuations can be recorded by a counter.

Subject invention

Claims (2)

1. Device for testing contacts of switching devices, containing a pulse generator, impulse counter, circuit A control consisting of sensitive logic elements and a failure control node, characterized in that, in order to enable testing of a large number of contacts of switching devices, a break contact of the control relay is connected in series with each contact of the apparatus under test, as well as one sensing element for all tested contacts. 2. The device according to claim 1, characterized in that the pulse counter is connected to the input of a current driver - power supply of contacts test apparatus and logic elements. fa. PS 04} V 4 5 ± 5 fa I I I I I (1 I i 5 V 1 P / V- / / A - «M 5 U7L 1 4, V - h x V 1 P 4