SU420952A1 - DEVICE FOR MEASUREMENT OF DIFFERENCE PHASES OF TWO ELECTRIC SIGNALS - Google Patents

Description

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The invention relates to a radio metering technique and can be used to certify phase shifters, exemplary and operational measures of phase shifts.

The known device for measuring the phase difference of two electrical signals, containing an optical quantum oscillator (laser), two optical splitters, two optoelectronic modulators of optical rays, the electrical signals under study, a zero-body with an indicator combining two modulated beams, an indicator of the interference pattern produced unmodulated beam, characterized by low measurement accuracy and a limited range of operating frequencies.

The purpose of the invention is to improve the accuracy, expanding the range of operating frequencies and ensuring smooth adjustment in the working frequency range.

This is achieved by additionally introducing an optical circuit into the device, including a system of mirrors and a nanism, forming modulated and unmodulated rays, and a Michelson interferometer.

The drawing shows a diagram of a device for measuring the phase difference of two electrical signals.

The device contains a source of three coherent optical beams, consisting of a laser

1 and two optical splitters (50% reflective mirrors 2 and 3), two modulators 4 and 5, in which the initial electrical signals are converted into intensity-modulated optical rays. Mirrors 6, 7, 8 serve to introduce the unmodulated beam into the interferometer. Two modulated and unmodulated beams arrive at the input of the optical system formed by an interferometer (100% reflecting mirrors 9, 10, 50% reflecting mirror 11 and a compensation plate 12) and an additional system for modulated beams (mirrors 13, 14 with two-sided

100% reflection, combined with the main mirrors of the interferometer, and turning prisms 15, 16, mechanically combined with mirrors 10 and 9, respectively. At the output of the optical system, a null-organ 17 and an indicator 18 of the interference pattern are installed.

The electrical signals ((i) (fi) and, n., Sm ((i) f- (f-2), for which it is necessary to measure the phase difference (ф2- (fi)), are accessed via inputs 19 and 20 to the modulators 5 and 4, respectively. Preset equality of the interferometer arms, equality of the propagation channels of electrical signals in the device. For this, one of the electrical signals t / i or (/ 2 is supplied simultaneously to both modulators 4 and 5. By moving the prism 15 (the direction of movement indicated in the drawing by arrows) achieve a minimum reading on the null organ 17, comparing intensively simultaneously incoming optical rays.

After the equality of the shoulders is established, the signals 62 and Ui, respectively, are applied to the modulators 4 and 5. Again by moving the prism 15, a minimum indication is obtained on the null organ 17. The phase difference is determined by measuring the amount of movement of the prism 15, which is proportional to the phase shift.

The displacement amount is determined on the interference pattern indicator 18 by the interference footage counting when measuring the interference pattern produced by the unmodulated beam introduced into the interferometer using mirrors 2, 6, 7, 8. In this case, the measurement error of the displacement amount does not exceed where X -

wavelength of an optical quantum generator.

Subject invention

A device for measuring the phase difference of two electrical signals, containing an optical quantum generator, two optical beam splitters, two optoelectronic modulators of optical rays with electrical signals under study, a zero-body with a combination of two modulated beams, an interference pattern indicator produced by an unmodulated beam, characterized by that, in order to increase accuracy, expand the range of operating frequencies and ensure smooth adjustment, it additionally introduces optical schemes Comprising a system of mirrors and SEB prism .formiruyuschuyu modulated and unmodulated beams, and a Michelson interferometer.

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