CN104515469B
(zh)
|
|
用于检查微观样本的光显微镜和显微镜学方法
|
AU728407B2
(en)
|
|
Moire interferometry system and method with extended imaging depth
|
TW402686B
(en)
|
|
Optical inspection method and apparatus
|
US4160598A
(en)
|
|
Apparatus for the determination of focused spot size and structure
|
US3907438A
(en)
|
|
Contour measuring system for cylinders
|
JPH03175327A
(ja)
|
|
電磁線、特に光線を直接位相測定するための方法及びその方法を行なうための装置
|
US3912396A
(en)
|
|
Electronic lens tester
|
US4577940A
(en)
|
|
Moire microscope
|
US5255069A
(en)
|
|
Electro-optical interferometric microdensitometer system
|
JP2005098933A
(ja)
|
|
収差測定装置
|
TW546468B
(en)
|
|
Focus error correction method and apparatus
|
SU346702A1
(ja)
|
|
|
JP4775943B2
(ja)
|
|
検査装置及び検査方法並びにそれを用いたシリンダブロックの製造方法
|
US5786896A
(en)
|
|
Oblique incidence interferometer with fringe scan drive
|
Capstaff et al.
|
|
A compact motion picture densitometer |
De Backer
|
|
In-plane displacement measurement by speckle interferometry |
US3829222A
(en)
|
|
Device to introduce an optic measuring index at photoelectric detection of photographic plates
|
JPS63241510A
(ja)
|
|
テレセントリック列カメラを有する光学式走査装置
|
US3501238A
(en)
|
|
Method and apparatus for enhancing differences between similar spatial signals
|
US4758731A
(en)
|
|
Method and arrangement for aligning, examining and/or measuring two-dimensional objects
|
Accardo et al.
|
|
The use of speckle interferometry in the study of large works of art |
JP3447877B2
(ja)
|
|
濃度計測光学系
|
SU1275248A1
(ru)
|
|
Способ измерени дисторсии оптических систем
|
JP2007024559A
(ja)
|
|
レンズユニット、形状検出装置、形状検出方法およびシートの製造方法
|
SU494722A1
(ru)
|
|
Способ количественной оценки неоднородностей в прозрачных средах
|