SU189036A1 - - Google Patents

Info

Publication number
SU189036A1
SU189036A1 SU1028431A SU1028431A SU189036A1 SU 189036 A1 SU189036 A1 SU 189036A1 SU 1028431 A SU1028431 A SU 1028431A SU 1028431 A SU1028431 A SU 1028431A SU 189036 A1 SU189036 A1 SU 189036A1
Authority
SU
USSR - Soviet Union
Prior art keywords
head
gap
microscope
generator
electron
Prior art date
Application number
SU1028431A
Other languages
English (en)
Russian (ru)
Publication of SU189036A1 publication Critical patent/SU189036A1/ru

Links

SU1028431A SU189036A1 (https=)

Publications (1)

Publication Number Publication Date
SU189036A1 true SU189036A1 (https=)

Family

ID=

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3999793A (en) * 1971-12-15 1976-12-28 Regie Nationale Des Usines Renault Energy absorbing bumper
US5075623A (en) * 1989-08-31 1991-12-24 Alps Electric Co., Ltd. Method for measuring three-dimensional spatial magnetic field distribution using algebraic reconstruction and convergence

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3999793A (en) * 1971-12-15 1976-12-28 Regie Nationale Des Usines Renault Energy absorbing bumper
US5075623A (en) * 1989-08-31 1991-12-24 Alps Electric Co., Ltd. Method for measuring three-dimensional spatial magnetic field distribution using algebraic reconstruction and convergence

Similar Documents

Publication Publication Date Title
US4928248A (en) Light source driving device
Plows et al. Stroboscopic scanning electron microscopy
SU189036A1 (https=)
Krasyuk et al. Time-resolved photoemission electron microscopy of magnetic field and magnetisation changes
US4801796A (en) Streak camera unit with elliptical deflection
Sjoeberg et al. Long-working-distance microscope used for diesel injection spray imaging
US5754298A (en) Method and apparatus for imaging semiconductor device properties
US4626690A (en) Apparatus for chopping a charged particle beam
JP2887391B2 (ja) 粒子線強度変調装置
EP0166815A1 (de) Verfahren und Vorrichtung zur Spektralanalyse eines Signals an einem Messpunkt
US4954773A (en) Voltage measurement with an electron probe without external trigger signal
JPH11271626A (ja) 走査型レーザ顕微鏡
DE69120233T2 (de) Photoemissionselektronenstrahlmesssonde mit gepulstem Laser
Ezaki et al. Extension of the capture range under high-speed motion using galvanometer mirror
JP4213883B2 (ja) 磁界の測定方法および磁界測定装置、ならびに電流波形測定方法および電界測定方法
Li et al. Two-Dimensional Field Mapping of GaAs Microstrip Circuit by Electro-optic Sampling
Picard et al. Flexible micromirror linear array for high-resolution projection display
Quitmann et al. Measuring magnetic excitations in microstructures using X-ray microscopy
SU312327A1 (ru) Способ наблюдения в электронном микроскопе быстропротекающих процессов в полупроводниках
SU296044A1 (ru) УСТРОЙСТВО дл КОНТРОЛЯ и РЕГИСТРАЦИИ ХАРАКТЕРИСТИК ТРИГГЕРНЫХ СХЕМ
Fukuchi et al. Development of a high‐speed laser interferometer using an acousto‐optic deflector
Pagano et al. Picosecond semiconductor lasers for characterizing high-speed image shutters
Bahnmüller et al. Characterization of pulsed Nd: YAG-laser beams as an optimization tool in laser drilling applications
JP3025833B2 (ja) ビデオ信号による検査装置
de Graaf et al. A measurement system for the visual analysis of integrated micromechanical devices