SU1649692A1 - Contact device for integrated circuit testing - Google Patents

Abstract

The invention relates to electronic engineering and can be used to test signals at the terminals of a microcircuit without soldering them from the board. The purpose of the invention is to reduce damage to the microcircuit, increase the reliability of contact and expand the range of controlled products. The device is mounted on a microcircuit and fixed on it by means of a spring gripper 3. At the same time, intermediate contacts 5 are pressed due to spring properties to the terminals of the microcircuit. Push forward, pressing the contact pushes the petals of the intermediate contact 5 and increases the reliability of the contact with the output of the microcircuit. The pin has a pointed end with which it is inserted into a plenary-type microcircuit pin and provides a reliable contact for passing signals from the microcircuit pin to the measuring device. 4 il.

Description

The invention relates to electronic engineering and can be used to test signals at the terminals of microcircuits without soldering them from the board.

The purpose of the invention is to reduce damage to the microcircuit, increase the reliability of contact and expand the range of controlled products.

FIG. 1 shows the proposed device in the frontal projection; in fig. 2 - the same, in a lateral projection; in fig. 3 - contacts in the position prior to contacting; in fig. 4 - contacts at the time of contact.

The contact device comprises a dielectric case 1, a socket 2, a gripper 3, with which the device is fixed on the microcircuit 4, the intermediate contacts 5c diverge from the socket 2 with sockets made in the form of pin contacts with petals. In the sockets 2 pin connectors 6 are placed. The device contacts with the leads 7 of the microcircuit 4, mounted on the board 8.

The device works as follows.

The device is mounted on the microcircuit 4 and fixed on it with the help of the spring grip 3. At the same time, the intermediate contacts 5 are pressed due to the spring properties to the terminals 7 of the microcircuit 4, pushing forward, the pin contact 6 presses the tab of the intermediate contact 5 and thereby increases the reliability contact with pin 7 of the chip.

 Pin 6 has a pointed end with which it is inserted into pin 7 of chip 4 of the planar type and thus provides reliable contact for the passage of signals from the pin of the chip to the measuring device.

This device provides reliable contact on all monitored pins of various types of microcircuits. In addition, the monitoring can be carried out on boards examined on test benches or on a repaired functioning electronic device of computing or radio engineering.

The invention makes it possible to reduce the time for checking electronic circuits, to improve the quality of the equipment being manufactured or repaired, and to increase the percentage of usable products.

Claims (1)

A contact device for controlling microcircuits, containing a dielectric body, a grip for mounting a device on a body of a controlled chip, and pin contacts, characterized in that, in order to reduce damage to the microcircuit, increase the reliability of contact and expand the range of monitored products, it is provided with intermediate contacts with sockets the shape of the pin contacts and elastic petals placed with the possibility of adherence to the pins of the controlled chip, and Each petal is bent toward the axis of the socket with the possibility of interaction with a pin contact with tension. t-b / 8 FIG. 2 1 4ZV.J Fm.4