SU1608547A1 - Method of detecting defects in ceramic capacitors - Google Patents
Method of detecting defects in ceramic capacitors Download PDFInfo
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- SU1608547A1 SU1608547A1 SU884479340A SU4479340A SU1608547A1 SU 1608547 A1 SU1608547 A1 SU 1608547A1 SU 884479340 A SU884479340 A SU 884479340A SU 4479340 A SU4479340 A SU 4479340A SU 1608547 A1 SU1608547 A1 SU 1608547A1
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- SU
- USSR - Soviet Union
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- defects
- defect
- ceramic capacitors
- sample
- detecting defects
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- Testing Electric Properties And Detecting Electric Faults (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Изобретение позвол ет повысить производительность труда, достоверность обнаружени дефектов и упростить способ. Дл этого измерение электропроводности производ т непрерывно и одновременно с абразивной обработкой. Путь сошлифовывани материала образца в плоскости, перпендикул рной плоскост м обкладок конденсатора. Сопротивление изол ции образца практически не измен етс , если стачиваемые объемы не содержат дефектов изол ции. При вскрытии в процессе шлифовани дефекта сопротивление изол ции образца увеличиваетс , что фиксируетс прибором, к которому при помощи электродов подключен исследуемый конденсатор. После этого абразивную обработку конденсатора прекращают.The invention makes it possible to increase labor productivity, reliability of defect detection and to simplify the method. To do this, the measurement of electrical conductivity is carried out continuously and simultaneously with abrasive processing. The path of grinding the sample material in a plane perpendicular to the planes of the capacitor plates. The insulation resistance of the sample remains almost unchanged if the volumes being ground do not contain insulation defects. When the defect is opened during the grinding process, the insulation resistance of the sample increases, which is fixed by the device to which the capacitor under study is connected by means of electrodes. After this, the abrasive processing of the condenser is stopped.
Description
Изобретение относитс к способам об- нару. Кени дефектов локализации неоднород- ност(й образцов, в частности обнаружени дефе тов типа раковин и пор в керамических конденсаторах.The invention relates to methods for circumcision. Keni has localization defects in the inhomogeneity (of samples, in particular, the detection of shell-type and pore defects in ceramic capacitors.
Целью изобретени вл етс повышение производительности труда и достовер- HOCT1J1 результатов поиска дефектов типа ин и пор в керамических конденсатор и м е р. При сошлифовывании мате- риалп образца в плоскости, перпендикул р- 1ЛОСКОСТЯМ обкладок конденсатора, еменно контролируетс величина со- влени изол ции. Сопротивление изо- конденсатора практически неThe aim of the invention is to increase the productivity and reliability of the HOCT1J1 search results for defects such as in and pores in a ceramic capacitor and measure. When grinding the material of the sample in the plane perpendicular to p-1 LOSTERS of the capacitor plates, the magnitude of the insulation condition is monitored. The resistance of the iso-capacitor is practically not
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изме|| етс при шлифовке, если стачивае мые Объемы не содержат дефектов изол ции . При вскрытии в процессе шлифовани дефекта сопротивление изол ции образца скачком увеличиваетс , что фиксируетс регистрирующим прибором. После этого абразивна обработка исследуемого конденсатора прекращаетс и образец передаетс дл визуального осмотра обнаруженного дефекта под микроскопом и дл физико-химических исследований.change || during grinding, if the machined Volumes do not contain insulation defects. When the defect is opened during the grinding process, the resistance of the sample insulation increases abruptly, which is recorded by a recording device. Thereafter, the abrasive treatment of the condenser under study is stopped and the sample is transferred for visual inspection of the detected defect under a microscope and for physico-chemical studies.
Ф о р м ул а и 3 о б р е те н и . Способ обнаружени дефектов в керамических конденсаторах, заключающийс в том, что подключают к испытуемому образцу токопровод щие электроды, измер ют электропроводность, по величине которой суд т о наличии дефектов типа раковин и пор, о т л и ч а ю щ и и с тем, что, с целью повышени производительности труда, достоверности обнаружени дефектов и упрощени способа, измерение электропроводности производ т непрерывно и одновременно с абразивной обработкой испытуемого конденсатора , а о наличии дефекта суд т по скачкообразному изменению величины электропроводности.F o rm ul and 3 o bre te n i. The method of detecting defects in ceramic capacitors, which consists in connecting current-conducting electrodes to a test specimen, measures the electrical conductivity, judging by the magnitude of which the presence of defects such as shells and pores, that, in order to increase labor productivity, reliability of defect detection and simplification of the method, the measurement of electrical conductivity is performed continuously and simultaneously with the abrasive treatment of the test capacitor, and the presence of a defect is judged by a step change value of electrical conductivity.
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Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU884479340A SU1608547A1 (en) | 1988-09-05 | 1988-09-05 | Method of detecting defects in ceramic capacitors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU884479340A SU1608547A1 (en) | 1988-09-05 | 1988-09-05 | Method of detecting defects in ceramic capacitors |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU1608547A1 true SU1608547A1 (en) | 1990-11-23 |
Family
ID=21397830
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU884479340A SU1608547A1 (en) | 1988-09-05 | 1988-09-05 | Method of detecting defects in ceramic capacitors |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU1608547A1 (en) |
-
1988
- 1988-09-05 SU SU884479340A patent/SU1608547A1/en active
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