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Priority to SU4436152/21ApriorityCriticalpatent/SU1581032A1/en
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Testing Electric Properties And Detecting Electric Faults
(AREA)
Abstract
FIELD: precision measurement. SUBSTANCE: noise signal is applied to input of any amplifier measured from the set from reference noise source; noise temperature T is lower or higher than environment temperature T. Reference noise source is used for measurement of noise temperature of set of amplifiers. Relation of M levels of power of noise signal is measured at output of the amplifier at frequency of measurement of noise temperature of set of amplifiers. Then noise signal with noise temperature Tis applied to input of amplifier and relation Mof levels of power of noise signal with noise temperature Tis applied to input of the amplifier. Attenuation α introduced of the path to be measured is determined from the relation given in the description of the invention. EFFECT: simplified method due to reduction of necessary connections and disconnections. 1 dwg
SU4436152/21A1988-06-031988-06-03Method of measuring attenuation of section
SU1581032A1
(en)
METHOD AND ASSEMBLY FOR MEASURING LOWNESS AND IN PARTICULAR FOR DETERMINING THE LOWERING DISTORTION AND / OR THE GROUP PROPAGATION TIME DISTORTION OF A MEASUREMENT OBJECT