SU1533496A1 - METHOD OF MEASURING THE DEFORMATION OF CRYSTALLINE STRUCTURE OF SURFACE LAYERS - Google Patents
METHOD OF MEASURING THE DEFORMATION OF CRYSTALLINE STRUCTURE OF SURFACE LAYERSInfo
- Publication number
- SU1533496A1 SU1533496A1 SU4336309/25A SU4336309A SU1533496A1 SU 1533496 A1 SU1533496 A1 SU 1533496A1 SU 4336309/25 A SU4336309/25 A SU 4336309/25A SU 4336309 A SU4336309 A SU 4336309A SU 1533496 A1 SU1533496 A1 SU 1533496A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- deformation
- sample
- measuring
- surface layers
- ray
- Prior art date
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Способ измерения деформации кристаллической структуры поверхностных слоев в контролируемом образце, включающий измерение угловой зависимости дифрагированной волны многокристальным рентгеновским дифрактометром и определение деформации по этой зависимости, отличающийся тем, что, с целью увеличения чувствительности, изготавливают тестовый образец из того же материала и по технологии, полностью соответствующей контролируемому образцу, деформирующим воздействием на поверхности исследуемого образца формируют периодическую структуру из чередующихся с постоянным периодом из интервала значений от 0,1 мкм до 2 длин экстинкции рентгеновского излучения областей с нарушенной и ненарушенной структурой, определяют деформацию в тестовом образце по интенсивности сателлитных пиков, возникающих при дифракции рентгеновского излучения на периодических нарушениях поверхности, и по ней судят о деформации контролируемого образца.A method for measuring the deformation of the crystal structure of the surface layers in a controlled sample, including measuring the angular dependence of the diffracted wave by a multi-crystal X-ray diffractometer and determining the deformation by this dependence, characterized in that, in order to increase the sensitivity, a test sample is made of the same material and technology fully consistent a controlled sample, a deforming effect on the surface of the sample under study form a periodic structure alternating with a constant period from a range of values from 0.1 μm to 2 x-ray extinction lengths of areas with disturbed and undisturbed structures, determine the strain in the test sample by the intensity of satellite peaks arising from x-ray diffraction on periodic surface irregularities, and judge it about the deformation of the controlled sample.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU4336309/25A SU1533496A1 (en) | 1987-12-03 | 1987-12-03 | METHOD OF MEASURING THE DEFORMATION OF CRYSTALLINE STRUCTURE OF SURFACE LAYERS |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU4336309/25A SU1533496A1 (en) | 1987-12-03 | 1987-12-03 | METHOD OF MEASURING THE DEFORMATION OF CRYSTALLINE STRUCTURE OF SURFACE LAYERS |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU1533496A1 true SU1533496A1 (en) | 2000-02-20 |
Family
ID=60519847
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU4336309/25A SU1533496A1 (en) | 1987-12-03 | 1987-12-03 | METHOD OF MEASURING THE DEFORMATION OF CRYSTALLINE STRUCTURE OF SURFACE LAYERS |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU1533496A1 (en) |
-
1987
- 1987-12-03 SU SU4336309/25A patent/SU1533496A1/en active
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