SU1495641A1 - Method of measuring thickness of layers - Google Patents

Abstract

The invention relates to indestructible control and can be used in measuring the thickness of multilayer products. The aim of the invention is to increase the monitoring performance by reducing the number of operations and registering the analog current in the loop. Initially, two circuits are created from the four linear conductors being combined in pairs, located at different distances to the 8-floor transducer. The resulting circuits excite electromagnetic fields for two fixed currents. Based on the measurement results, a system of linear equations is compiled, which is resolved relative to the thickness of the two layers. When measuring multi-layered objects, the thickness of the outermost layer is initially measured, counting the remaining layers in one layer, and then the size of each layer is found by continuing such operations. 1 il.

Description

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The invention relates to the field of non-destructive testing and can be used to measure the thickness of multilayer products.

The aim of the invention is to increase the monitoring performance by reducing the number of operations and the failure to register analog current to the circuit.

The drawing shows a three-layer object.

Between layers 1-3 with the corresponding thickness T1-TZ and on the surface of the object there are linear conductors 4-7, and on the surface there is a converter 8 floor. In addition, there are 9 and 10 current sources.

The method is implemented as follows.

Form a pair of electrical circuits by combining linear conductors 4, 5 and 6, 7. In each of the resulting

the products number the conductors sequentially from the outermost one from the converter 8 and determine the thickness values for the outermost layer and the remaining layers in this way, counting them as one layer, then determine the thickness of the penultimate layer in the same way, and so on, until determining the thickness of each layer.

Claims (1)

Invention Formula The method of measuring the thickness of layers of multilayer products with the number of layers, consists in the fact that during the manufacture of the product, linear conductors are placed between its layers and on both surfaces so that they are in the same plane, place an invoice transducer on the surface of the product, The circuits include the sources 9 and 10 of the current 20 form a pair of electrical circuits by means of the voltage E1 and E2, respectively. The pairwise four linear circuits then register the HI field strength value at the location of the converter 8 field. After that, the current in one of the circuits is changed and recorded so that the resulting magnetic fields are in phase, the magnitude of the magnetic field strength and the magnitudes of the currents are recorded, then the magnitude of the current in one of the circuits is arbitrarily changed, the half magnitude of the H2 field is recorded. Solving the system of equations for the unknown distances t2 and 1h, using the values of HI and H2 obtained, calculate the values of the distances t2 and ts, if the values for each of the circuits, they pass an in-phase alternating current, characterized in that, in order to increase the monitoring performance, the currents pass constructive size of the transducer t4 HOUNDED values of field strength and wave ti sums and total thickness t of the object, which are defined in advance. Then, word thicknesses are determined from the equalities. Tl ti-12; T2 t2-ta; T3 t3-14. For consistently measuring the thickness of each of the layers of the multi-layer 35 article. The current magnitudes and by the obtained value determine the thickness of the layers between the linear conductors, sequentially use all the linear monitors, group them into four, and determine the thickness of all the layers the products number the conductors sequentially from the outermost one from the converter 8 and determine the thickness values for the outermost layer and the remaining layers in this way, counting them as one layer, then determine the thickness of the penultimate layer in the same way, and so on, until determining the thickness of each layer. Invention Formula so that the resulting magnetic fields are in phase, record the magnitude of the magnetic field strength and the magnitude of the currents, then arbitrarily change the amount of current in one of the circuits, record the semitrailers, pass the in-phase alternating current through each circuit, characterized in that increase in control productivity, currents pass The current magnitudes and by the obtained value determine the thickness of the layers between the linear conductors, sequentially use all the linear monitors, group them into four, and determine the thickness of all the layers