SU132867A1 - Method for analyzing random processes - Google Patents

Method for analyzing random processes

Info

Publication number
SU132867A1
SU132867A1 SU655514A SU655514A SU132867A1 SU 132867 A1 SU132867 A1 SU 132867A1 SU 655514 A SU655514 A SU 655514A SU 655514 A SU655514 A SU 655514A SU 132867 A1 SU132867 A1 SU 132867A1
Authority
SU
USSR - Soviet Union
Prior art keywords
random processes
voltage
analyzing random
analyzing
screen
Prior art date
Application number
SU655514A
Other languages
Russian (ru)
Inventor
Л.Б. Венчковский
Original Assignee
Л.Б. Венчковский
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Л.Б. Венчковский filed Critical Л.Б. Венчковский
Priority to SU655514A priority Critical patent/SU132867A1/en
Application granted granted Critical
Publication of SU132867A1 publication Critical patent/SU132867A1/en

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  • Analysing Materials By The Use Of Radiation (AREA)

Description

Дл  исследовани  веро тностных распределений случайного процесса обычно используют либо сложные многоканальные анализаторы , либо осуществл ют последовательный анализ, требующий больщих затрат времени.To study the probability distributions of a random process, either complex multichannel analyzers are usually used, or a sequential analysis is carried out that takes a lot of time.

Предлагаемый фотографический способ свободен от этих недостатков и характеризуетс  сочетанием достаточно высокой точности (пор дка нескольких процентов) со сравнительной простотой аппаратуры (стандартный осциллограф и фотоприставка) и быстродействием. Способ заключаетс  в том, что исследуемое напр жение подают на отклон ющие пластины электронно-лучевой трубки (на одну пару пластин, если исследуетс  одномерный закон распределени , л на обе пары пластин, если исследуетс  двумерный закон распределени ). При этом  ркость засветки различных точек экрана трубки оказываетс  пропорциональной частоте попадани  электронного луча в эти точки или в конечном итоге плотности распределени  веро тностей исследуемого напр жени . Полученное на экране напр жение фотографируют на фотопластинку. Почернение фотоэмульсии анализируют с помощью микрофотометра. Дл  устранени  погрещностей, вызванных нелинейностью характеристической кривой фотографической эмульсии и непосто нством ее при изменении условий съемки и обработки -фотоматериала , на ту же пленку фотографируют с экрана осциллографа изображение калибровочного напр жени , измен ющегос  по известному закону. В качестве напр жени  можно использовать линейное вилообразное напр жение с несколькими наклонами с известным соотношением тангенсов углов наклона или же экспоненциальное напр жение .The proposed photographic method is free from these drawbacks and is characterized by a combination of sufficiently high accuracy (on the order of a few percent) with comparative simplicity of the apparatus (standard oscilloscope and photo attachment) and speed. The method consists in that the test voltage is applied to the deflection plates of the cathode ray tube (for one pair of plates, if a one-dimensional distribution law is tested, l for both pairs of plates, if a two-dimensional distribution law is investigated). In this case, the brightness of the illumination of different points of the tube screen is proportional to the frequency of electron beam hit at these points or, ultimately, the probability density of the voltage under investigation. The voltage received on the screen is photographed on a photographic plate. Blackening of the emulsion is analyzed using a microphotometer. To eliminate irregularities caused by the nonlinearity of the characteristic curve of a photographic emulsion and its inconsistency when changing the conditions of filming and processing of photomaterials, an image of a calibration voltage changing according to a known law is photographed from the oscilloscope screen on the same film. As a voltage, one can use a linear forked voltage with several slopes with a known ratio of tangents of slope angles, or an exponential voltage.

SU655514A 1960-02-12 1960-02-12 Method for analyzing random processes SU132867A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU655514A SU132867A1 (en) 1960-02-12 1960-02-12 Method for analyzing random processes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU655514A SU132867A1 (en) 1960-02-12 1960-02-12 Method for analyzing random processes

Publications (1)

Publication Number Publication Date
SU132867A1 true SU132867A1 (en) 1960-11-30

Family

ID=48403885

Family Applications (1)

Application Number Title Priority Date Filing Date
SU655514A SU132867A1 (en) 1960-02-12 1960-02-12 Method for analyzing random processes

Country Status (1)

Country Link
SU (1) SU132867A1 (en)

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