SU1317370A1 - Method of determining linear parameters of multiterminal network - Google Patents

Abstract

The invention relates to a technique of radio measurements and provides improved accuracy by eliminating errors due to parasitic resistor elements. The method consists in that a sinusoidal signal from the source 1 of a sinusoidal signal is fed through a series-connected resistor 2 to one input of the investigated multipole (THEM) 5. Resistors 3 are connected in parallel to the other inputs of the IMP 5. At all the inputs of the IMP 5, complex voltages U11 Uji are measured. In the absence of IMP 5 and alternately connected to each resistor 3 of the EMF source, the diagonal and nondiagonal components Up.- and Upp-matrices support stresses Up. Then, by alternately connecting the reference resistor in series to each resistor 3 and the EMF source, the voltage is measured. on it is a component of the vector of calibration voltages Uj. The voltage measurement operations on the PMF 5, the reference and calibration voltages are performed N times. The measurement data are used to determine the matrix coefficient by the formulas. C5 and this is read, with systematic corrections dp determining the exact values of the coefficient. matrix IMP 5. Resistors 2.3 and a reference resistor are connected through the contact device 6. 2 Il. from $ (L 00 m SA

Description

113

The invention relates to a technique for measuring radio and measurements and can be used to measure a matrix of linear parameters of transistors, integrated circuits and other multipoles.

The purpose of the invention is to improve accuracy by eliminating errors due to parasitic resistor elements.

FIG. Figures 1 and 2 depict structural electrical diagrams of devices for carrying out the proposed method.

Devices for the implementation of the proposed method contain the source

1 sinusoidal signal resistors

2 and 3, an exemplary resistor 4 and a research multi-terminal 5.

The method is carried out as follows.

To measure the vector of calibration voltages, a device is assembled according to FIG. 1. connecting source 1 through resistor 2 to sample resistor 4, to which contact device 6 is connected, intended to connect the i-input of the investigated multi-pole 5, which has a YP conductivity matrix, and resistor 3 to the output of contact device 6, The jth input of the multi-terminal 5 under study is measured by the components Up, the vector and the calibration voltages. These measurements are carried out N times.

Then assemble the device in accordance with FIG. 2, for which the exemplary resistor 4 is disconnected from the 1-input and the diagonal and off-diagonal components Up are measured, and U (, jj, the reference voltage matrix U.) Each time the source 1 is connected to the next 1-pin of the contact device, one the diagonal component of the vector U and N-1 are non-diagonal of its components, and the operations are repeated N times according to the number of inputs.

To determine the matrix component of the pole voltage, the device of FIG. 2 by connecting a test multipole with a conduction matrix Y to the corresponding inputs of the contact device. The measurement process of the diagonal and non-diagonal components U-- and U, -, is the mother of L

The voltage stresses U are similar to the process of measuring the stress matrix Uo.

02

The measurement data is used to determine the coefficients of the matrix of linear parameters of the studied multipole, with the calibration results of the measuring device in the form of component vectors of voltages U | j and the matrix of voltages U, as well as the calibration data of the probe of the measuring device, namely the value of its input conductivity At a given measurement frequency, they are used to determine systematic corrections, by means of which exact values of coefficients are determined.

matrix of the studied multipole by finding the coefficients of the matrix:

Y D (M) - (MO r l, where D is a scalar matrix with a diagonal element equal to 2; M and Mj, are matrices whose diagonal and off-diagonal coefficients are determined by the formulas

2 -11. ( one )

UOH Uoi

t, -

YY -Ji- r

ii / i n T i

Wow;

Un;

- one)

M -.

about uj / v

/ --- - - I; ij, tl pviy o I,

GU,. - Y - i - (- m Y) Uojj Co, i

M

oi;

2UoJic Uj) u .s Y

 ri l,

v ojjpj ;; M

Y. - Y „(- 1) Y ,.

0

1 and j are the indices of the inputs of the studied multipole; . is the diagonal element of the voltage matrix U for input i;

and about,-; is the diagonal element of the voltage matrix U for input i;

and UQ- are elements of the voltage vector% for inputs i and J;

to;

j

m ..

II

m

oji

31317370

- matrix element of voltage - M and M - of stresses and, which corresponds to voltage

at input j, when a source of emf is connected to g input i;

the conductivity of the reference resistor for input i;

conductivity of a sample 10 resistor for input J;

- input conductivity of the measuring device;

-diagonal element f5 of the matrix of stresses U

for input j;

- the off-diagonal element of the matrix Ug, which corresponds to the voltage 20 at the input j when the emf source is connected to the input i.

M

Oi

M

oj-;

where 1 and J

Claims (1)

Invention Formula The method of determining linear parameters of a multipole, including applying a sinusoidal signal to one of the inputs of the studied multipole when connected to it in series, and to the other inputs in parallel, resistors and measuring complex voltages U--, Ts- on all inputs of the studied MHOG, different By the fact that, in order to improve accuracy by eliminating errors caused by parasitic elements of resistors, the voltages Up. are additionally measured, on each of the resistors in the absence of the test When a multipole is connected in turn to each of the resistors in series with an EMF source, the voltages on the reference resistor are measured while they are alternately connected in series to each of the resistors and the source of the EMF, and the linear parameters of the tested multipole are determined by finding the matrix coefficients: Y D (M) - - (M,) . where D is the scalar matrix with a diagonal element equal to 2 matrices whose diagonal and non-diagonal coefficients are determined by the formulas m .. II m M Oi M oj-; where 1 and J are the entry indices of research Wooi 01 . i .I .; one. ij oi, oj, diagonal element of the voltage matrix U for input i; the diagonal element of the voltage matrix U for input i; element of the voltage vector U for input i; element of voltage vector and for input j; the element of the matrix of voltages and, which corresponds to the voltage at the input j when connecting the source of the EMF to the input 1; conductance of reference resistor for input i; conductivity of the reference resistor for the input; input conductivity of the measuring device; the diagonal element of the stress matrix 1), for the input j; diagonal element of stress matrix 1 for input j; The non-diagonal element of the matrix Up, which corresponds to the voltage at the input j when the emf source is connected to the input i of the i. Cfi (L V / jr Compiled by R. Kuznetsova Editor A. Renin Tehred M. Khodanych Corrector I. Muska Order 2418/40 Circulation 730 Subscription VNIIPI USSR State Committee for inventions and discoveries 113035, Moscow, Zh-35, Raushsk nab., 4/5 Production and printing company, Uzhgorod, G |) oektna, 4 (.E Jl