SU1237932A1 - Device for diagnostic checking of equipment supports - Google Patents

Abstract

The invention relates to a measurement technique and can be used in instrument engineering and mechanical engineering in determining the state of the supports of various instruments and mechanisms. The aim of the invention is to expand the functionality of the device by providing diagnostics of devices with high-speed rotors. When the rotor of the tested device 5 grows, the vibrations arising from it .- .pa are recorded by vibration -.) DS: - IR -: 6, 7 and are fed to the control key. The main equipment 8, where by.; - / the composition of the children is determined by the defect,: l: device 5. To separate the defects, each of the supports includes a drive 2 of the centrifuge 1, the resulting gyroscopic momentum additionally loads the supports device 5 and causes the modulation of the signal from the support defects by the signal arising from the additional load of the supports from the gyroscopic moment. The demodulators 9, 10 demodulate the signals from the supports and feed them to the phase meter 11, where they are compared with the reference signal from the block 12 of the reference signal. With antiphase demodulated signals, a defect exists in one of the supports. For any other phase difference, defects are present in both supports. The location of the defect is determined by comparing in phase one of the demodulated signals from block 12, which is formed from the mark on the rotor of the device under study 5. 1 Il. U y so with oo y

Description

The invention relates to a measurement technique and can be used in instrument engineering and mechanical engineering in determining the state of the supports of various instruments and mechanisms.

The aim of the invention is to expand the functionality of the device by providing diagnostics of devices with high-speed rotors.

The drawing shows the block diagram of the device.

The device contains a centrifuge 1 with a drive 2, placed on the base 3. On the centrifuge, the mechanism 4 for fixing the diagnosed device 5 is installed.

On the diagnosed device 5 are placed vibration sensors 6, 7, connected to the instrumentation equipment 8.

To the outputs of the instrumentation equipment 8, demodulators 9, 10 are connected, and outputs connected to the phase meter 11. A block 12 of the reference signal is connected to the third input of the phase meter 11. The inputs of the block 12 of the reference signal is connected to the electrical output of the actuator 2 and the device under study 5.

The device works as follows.

The rotor of the device under study 5 is driven into rotation, the vibrations of the supports arising from this are fixed by means of vibration sensors 6 and 7 and fed to the control and measuring equipment 8, where the amplitudes of the frequency components determine the defects of the supports of the device 5. Then the centrifuge 1 is rotated.

Since the axis of rotation of the rotor of the device 5 and the axis of rotation of the centrifuge 1 are perpendicular, a gyroscopic response moment occurs, equal to

 with,

where - the moment of inertia of the rotor of the device; s is the angular velocity of rotation of the rotor;

fi. - The rotational speed of the centrifuge.

This moment creates an additional load P acting on the supports, the magnitude of which is determined by the equality

R

where S is the distance between the supports.

The direction of this load on the supports of the opposite sign.

Due to the presence of the aforementioned load, various defects and the amplitude of the components resulting from these defects are better manifested.

In one period of rotation of the rotor of the device 5, the location of each defect of the rotating parts of the supports is at a certain time once at the point of action of the load P.

If there is an existing defect in one of the supports of the device 5 (or both), the signals with a frequency corresponding to this defect appear at the outputs of the instrumentation equipment 8, but are modulated from the actual load P in amplitude. These signals are fed to the corresponding demodulators 9 and 10, where they are demodulated and fed to a phase meter 11, in which the phase difference between these signals is measured.

Since the voltage from the actual load P on the contact surface has the opposite sign in each support semicircle, in the case of the antiphase signals mentioned above, the defect exists only in one of the supports, and for any other phase difference of these signals - in both supports.

 The location of the defect is determined by comparing in phase one of the demodulated signals with a reference signal, which is formed by the block 12 from the mark on the rotor of the device 5. At the same time,

When the drive 2 of the centrifuge 1 is turned on in the reference signal block 12, an electrical impulse is generated, the occurrence of which corresponds to a certain phase of the reference signal, i.e., the generated signal determines the phase of the reference signal relative to the onset of load P, which is further taken into account when determining the location defect in the corresponding support.

Thus, by demodulating signals from defects perceived by vibro sensors, and comparing the phases of these signals in the process of simultaneous rotation of the rotor of the device under investigation around two perpendicular axes, it is possible to separate the defects of each support and

the reference signal to determine the location of the defect in the support.

Claims (1)

Invention Formula 0 Device for diagnostics of instrument supports, containing a centrifuge with a drive, mounted on the centrifuge mechanism for fixing the instrument being diagnosed, two vibration sensors placed on the device being diagnosed, connected to vibro5 sensors and instrumentation, characterized in that diagnostics devices with high-speed rotors, it is equipped with two demodulators, each of which is connected to the output of instrumentation, phase meter , connected by the first and second inputs, respectively, to the outputs of the first and second demodulators, a reference signal unit connected by the first input to the output of the drive, the second input connected to the device under study, and the output to the third input of the phase meter. 0