SU1228042A1 - Method of determining availability of inductive shunt circuit - Google Patents

Abstract

The invention relates to an instrumentation technique. The purpose and the power supply are .1-I of the invention, extending the functionality and simplifying the testing of inductances with shunt circuits. Instead of a controlled inductance 5 with a circuit 6, a reference inductance is established with a deliberately intact shunt circuit. The gain of the amplifier is set 40-50% lower than the value corresponding to the threshold of indicator 3. At the same time, a signal with an amplitude equal to or exceeding the amplitude of the induced signal at the amplifier output is 1.4-1.5 times the input of the amplifier. When testing a controlled inductance for the exclusion with (L K -iieti / MpytHuu tzfchchichient uya eni

Description

If the recorder contains a false trigger, probe 1, amplifier, and indicator 3, the control conditions must not differ from the test conditions of the reference inductance by more than 10%. In the case of a faulty shunt circuit 6, a signal is induced at the input of the amplifier with an amplitude exceeding the amplitude of the signal induced at the output of the amplifier 1.4-1.5

I

The invention relates to instrumentation engineering and can be used to control isomals containing inductances, for example, relays or reed switches.

The purpose of the invention is to expand the functional possibilities and simplify the testing of inductances with shun-tying circuits.

The essence of the method is that the voltage is set within the operating voltage of the power supply and with the help of a recording device, which remains from the probe, an amplifying device with an adjustable gain factor, and an indicator device, compares the level of electromagnetic radiation inductance at the voltage release to the level electromagnetic radiation of a reference inductance with a known intact shunt circuit, for which the voltage is preliminarily supplied and removed from the reference inductance, and the threshold The recorder units are set at 40–50% higher than the EMF level induced by the reference inductance radiation at the moment of removal. When testing a controlled inductance, the control conditions (voltage value, distance from the probe, ambient temperature, etc.) are different from the conditions when testing the reference inductance by no more than 10%.

The drawing shows a device for implementing the method.

The device contains probe 1, usshshtel 2 with adjustable gain, indicator 3, key 4, contr,

times. When a shunt circuit is operational, the magnitude of the induced signal becomes, respectively, 1.4-1.5 times less. The method allows detecting a malfunction of the shunt remotely, which reduces the complexity of the search for a defect. The method is suitable for controlling the presence of any shunt circuits, including those that do not contain a valve, allows you to automate the check, 1 slug.

a rollable inductance 5, a shunt circuit 6 and a power source 7. The power source 7 is connected via a switch 4 to a controlled inductance 5, a shunt circuit 6. Probe 1 is connected to an amplifier 2, to the output of which an indicator 3 is connected. The method is carried out as follows.

In place of a controlled inductance 5 with a circuit 6, a reference inductance is established with a knowingly intact shunt circuit and the supply voltage is applied with a key 4. When you remove a voltage from a reference inductance with a key 4, an amplitude signal is applied at the input of amplifier 2

and

log in

KE

(one)

de Ug 1 - the amplitude of the signal at the input D® amplifier with good

shunt;

K is a coefficient depending on the distance between the probe and the signal source and on the parameters of the probe; Ец, - ЕДС self-induction at the serviceable shunt about о

-: ll: iMi ЕЫ -LfF | е

de L is the inductance value; di - - current change rate

4t-i,)

res inductance;

R is the ohmic resistance of inductance;

RIJ - shunt resistance;

and - power supply voltage;

t - the current time; t is the initial moment of time. By adjusting the gain, the amplifier is set 40-50% lower than the value corresponding to the threshold of indicator 3 (triggering indicator 3 indicates the response of the recorder consisting of probe 1, amplifier 2, indicator 3). Thus, to trigger the indicator 3, it is further necessary to impose a signal with an amplitude at the input of amplifier 2

input b -b5XVy

Then a controlled inductance test is performed. At the same time, in order to exclude false cases of the registrar, the control conditions should not differ from the conditions when checking the reference inductance by more than 10%.

If the shunt circuit 6 of the monitored inductance 5 is faulty, then at the time of voltage relieving by unlocking the switch 4, the signal at the input of the amplifier 2 is amplified

and

x

KE,

where K practically has the same numerical value or close to that of K in formula (1), since the control conditions are close to the control conditions of the reference inductance,

E - self-induced EMF in the absence of a shunt.

: li5 (4..t di and L.),

E-L -

where is insulation resistance in

ductility (obviously

R R + R ,,

and

 1), os

The full symbols correspond to those of formula (2). In this way.

 1 corresponds to

HER,

 1. From this it follows that with an operable shunt circuit 6 - (1.4 - 1.5) and,

and.

81. W

Q

15

20 25

thirty

35

0

0

WHAT leads to the operation of the indicator 3. With an operable shunt circuit UBX (IH - 1.5) Up, q, since the control conditions differ by no more than 10%, and the variation of the inductance parameters and the shunt circuit is no more than 20% and therefore, indicator 3 does not work.

For practical application of the proposed method, the necessary gain factor of amplifier 2 is predetermined to control a specific inductance in a particular device at a strictly defined position of probe 1.

The proposed control method allows detecting a shunt fault remotely, without opening the product, reduces the laboriousness of finding a defect, is suitable for monitoring the presence of any shunt circuits, including not. containing valves, as well as suitable for testing inductance shunting with low ohmic resistance, which increases the quality of the test. In addition, the method allows to automate the check.

Claims (1)

Invention Formula A method for determining the presence of a shunting inductance circuit by measuring an electromagnetic radiation signal when the supply voltage is removed from an inductance, characterized in that, in order to extend the functionality and simplify the test, the signal with prov. The measured inductance is compared with the magnitude of the electromagnetic radiation signal of the reference inductance, and the trigger threshold of the meter is set 40-50% higher than the level of the electromagnetic radiation signal induced by the radiation of the reference inductance, and the conditions for measuring the reference and tested inductances can differ by no more than 10% . VNIIPI Order 2284/46 Circulation 728 Subscription Proizv.-poly. pr-tie, Uzhgorod, st. Project, 4