SU1064243A1 - Device for checking semiconductor diodes - Google Patents

Abstract

A device for controlling semiconductor diodes, containing a contact panel whose output is connected to the input of the first cop of the voltator whose output is connected to an electrical terminal block, which is additionally introduced in order to increase the efficiency of control. BLOCK of synchronization, second switch, analyzer, analysis results processing unit, i launch unit, communication unit, display unit, first i and second outputs of the InEyunizash unit and connected respectively to the nepBOKiy and the second inputs of the second to the third and fourth inputs of which are connected to the output of the contact panel, the third and fourth outputs of the synchronization unit are connected to the first and second inputs of the Analyzer, the third and fourth inputs of which are connected to the first and second outputs of the second switch, the fifth output of the synchronization unit is connected to the first input of the analysis results processing unit, the second and third; THI inputs of which are connected to the first and second outputs of the analyzer, and the fourth input connected to the first output of the communication unit, the first input and The gateway and the input of the unit, synchronization, the sixth output of which is connected to the first inputs of the communication unit and the start-up unit, the second input of which is connected to the first output of the analysis results processing unit and to the nepiBOMy control switch, the second control (input which is connected to the third output of the launcher and to the second output of the analysis results processing unit, g whose third output is connected to the first input of the display unit; And to the second input of the communication unit, D: 1 whose third input is connected to the second input do of the display unit and | to the fourth output of the analysis results processing unit. Jo jo

Description

The invention relates to electronic engineering, is intended to preliminarily check the semi-wire of NIR diodes, their orientation and correct connection to a universal parameter meter and can be used in classifiers and other automatic devices. A device for classifying semiconductor diodes is known comprising a control unit, an orientation unit, a discharge unit, a measuring circuit, a decoder, triggers and electromagnets of the sorting unit, a terminal resistor for disconnecting the diode under test, a pulse generator, and key elements. The device allows the orientation of the semiconductor diode to be memorized and, based on the result, is oriented. To each measurement position used in the device for classification. during the movement of the diode from one measurement position to another 1J :. The disadvantage of this device is the inability of the orientation circuit to detect breaks and short circuits in the tested diodes. To determine these defects, I use a measuring device, which increases the time of the test. The closest to the proposed device for controlling semiconductor devices contains a contact panel, a logic device and a switch controlled by a logic device and providing the required connection of the electrodes to the psi parameter meter; WITHOUT connecting the electrodes to the contacts; contact panel. At the same time, the output of the contact panel is connected to the input of the switch, the output of which is connected to the measuring terminals 2. A disadvantage of the known device is that simultaneously with the orientation of the semiconductor device, the device does not short-circuit the device or the electrodes, or p-p- transitions. In this case, the rejection of devices with defects is performed by the measuring device. When using the device in multi-station universal measuring devices controlled by electronic computing machines, it is necessary to expend machine time to reject devices with defects. Before this, the work at international posts is suspended, which leads to an increase in the inspection time of the batch of instruments. The purpose of the invention is to increase the productivity of the control. This goal is achieved by the fact that the device for controlling semiconductor diodes, containing a contact panel, the output of which is connected to the input of the first switch, the output of which is connected to the measuring terminals, is additionally introduced a synchronization unit, a second switch; analyzer, processing unit of analysis results, startup unit, communication unit, display unit, the first and second outputs of the synchronization unit are pinched respectively to the first and second inputs of the second switch, the third and fourth inputs of which are connected to the output of the contact panel, the third and fourth outputs the synchronization unit is connected to the first and second inputs of the analyzer; the third and fourth inputs of which are connected to the first and second outputs of the second switch; fifth: the output of the synchronization unit is connected to the first during the processing of the analysis results, the second and third inputs of which are connected to the first and second outputs of the analyzer, and the fourth input is connected to the first output of the communication unit, the fifth input of the analyzer and the input of the synchronization unit, the sixth output of which is connected to the first inputs of the and a startup unit, the second input of which is connected to the first output of the analysis results processing unit and ic to the first control input of the first switch; ora, the second control input of which is connected to the third input of the launch unit IR second The output of the analysis results processing unit, the third output of which is connected to the first input of the imaging unit and to the second input of the communication unit, the third input of which is connected; to the second input of the display unit and the retreme output of the processing unit of the analysis results. FIG. 1 shows a block diagram of the device in FIG. 1 2 — its frictional diagram (variant). The device for monitoring semiconductor diodes contains a contact panel 1, the output 1 of which is connected to the switch 2, the outputs 3 and 4 of which are connected to the parameter meter (not) . The diodes are loaded via communication unit 5, the output of which is connected to the input of the synchronization block b, the third and fourth outputs of which are connected to the first and second inputs of the analyzer 7. The first and second outputs of the analyzer 7 are connected to the second center and third inputs of the analysis result processing unit 8 and its third and fourth inputs are connected to the first and second outputs of the second KOJjwyTaTopa 9, the third and fourth inputs of which are connected to the output of block 1, and the first and second inputs to the first and second inputs of the second, fifth and sixth the outputs of which are connected to the first input of block 8 and to the first inputs of communication block 5 and start block 10. The second and third inputs of block 10 are connected to the first and second outputs of block 8 and to the first and second control inputs of switch 2. The fourth input of block 8 is connected to the first output of block 5 and to the fifth input of block 7, and its third output is connected to the first input of the display unit 11 and to the second input of the unit 5. The fourth output of the unit 8 is connected to the second intake 9 of the unit 11 and to the third input of the unit 5. The contact panel 1 contains contacts 12 and 13. The first switch 2 contains relay amplifiers 14 and 15, a relay DB with pins 17 and 18 / relay 19 with pins 20 and 21. Blo 5, the communication with the automatic loader comprises an inverter 22 and AND-elements 23 and 24. The synchronization unit 6 comprises a start button 25 a pulse generator 26, a counter 27, decoder 28 and elements 29 and 30 delay. The analyzer 7 contains the elements AND-NOT 31 and 32, as well as triggers 33 and 34. The unit 8 for processing the results, the analysis contains the elements AND-NOT triggers 39 and 40, as well as the triggers 4 and 42 for open and short circuits. Switch 9 contains relay wuxi, lithiums 43 and 44, relay 45 with contacts 46 and 47 and relay 48 with contacts 49 AND 50 :. . ; .-. - l. The Launcher block 10 includes the element OR 517 AND-NOT element 52 and the element 53 of the launch. The display unit 11 contains the elements OR 54, the amplifiers .55-57, the defect signaling lamp 58, the breakaway signaling lamp 59 and the short-circuit signaling lamp 60. When using an automatic loader, the device works as follows. An automatic loader (not shown} connects the diode under test to pins 12 and 13 of the contact panel, and both the anode and the cathode of the test diode can be connected to pin 12. Let the diode be connected; a year to pin 12 and an anode to pin 13 - connection I, and the opposite connection - connection I. After connecting the diode, the automatic loader through the inverter 22 of the communication unit 5 with the automatic loader pr6iz: starts the device.At the Start signal, the triggers 33 and 34 of the analyzer 7 and the flip-flops 39-42 are installed 8 Processing the results of the analta to the initial state, the generator of the pulses of the synchronization unit 26 starts its operation. The device operates in four cycles. When the first pulse arrives from the pulse generator 26, the first operating cycle of the device begins in the counter 27. The decoder 28 decrypts the state counter 27. In the first cycle, the decoder 28 outputs a signal to the switch 9 and to the analyzer 7. In the switch, the relay 45 is triggered through the relay amplifier 43 and with its contacts 46 and 47 connects the diode to the NAND element 31 of the analyzer 7. In the first so The output diode connected to pin 12 of the contact panel 1 is connected to one of the inputs of the NAND element 31. In this case, the connection of the diode to the contact panel 1 or the presence of an open circuit between contacts 12 and 13 corresponds to the feed 1 to the input of the AND-NOT element 31, and the connection of the diode or the presence of a short circuit between the pins or in the p-p-junction corresponds to the supply O. With the delay formed by the delay element 29 and necessary for reliable connection of the diode to the input of the AND-NE element 31, to the second input of the AND- element NOT 31 signal is received 1. If there is an input ah of the AND-NE element of 31 logical units, the trigger 3.3 is set to one state. At this point, the first cycle of operation of the device ends. Thus, in the first operation cycle of the device, the trigger 33 is set to one state when 1 test diode is connected or there is an interruption in the electrode leads or the pn-junction of the lnbo trigger 33 remains in the zero state when the test diode is connected It or there is a short circuit in the electrode pins or pn junction. When the next pulse arrives from the pulse generator 26 into the counter 27, the second cycle of operation of the device begins. The decoder 28 outputs a signal to the switch 9 and the analyzer 7. In switch 9, the relay 48 is triggered through the relay amplifier 44 and connects D1 | ppk to the NAND element 32 of the analyzer with its contacts 4.9 and 50. In the second cycle, the output of the diode connected to the contact 13 of the contact panel 1 is connected to one of the inputs of the NAND 32 element. In this case, the connection of the I test diode to the contacting element or the presence / short circuit between contacts 12 and 13 corresponds to the supply of O to the input of the element IS – HE 32, and the connection 11 or presence break between contact 12 and 13 1. The appropriate filing :: delay element formed

30 delay and necessary for reliable connection of the diode to the input element AND IS NOT 32, the second output e e-. of signal 12, signal 1 is received. When the input element is ngshi

units are triggered to one. At this point, the second cycle of operation will be arranged by the station. . . Thus, “in the second cycle of operation of the device, the trigger 34 is installed in a single state when the II diode under test is connected to the contact panel 1 with a break in the electrode leads or the p-1 junction, or. the trigger 34 remains in the zero state when 1 test diode is connected or there is a short circuit in the electrode leads or

20 pn-junction.

All possible combinations of logical level when connecting a diode to the contact panel 1 are shown in the truth table.

 H 1 H

and II

ABOUT

35

ABOUT . ABOUT

I j1

one

..40

It follows from the table that, based on the o6pai6oTKK position of the flip-flops .33 and 34, it is possible to determine both the position of the diode in the contact panel 1 and the presence of a short circuit or break in the electrode leads or the p – n junction of the diode.

The processing of the position of the flip-flops 33 and 34 is performed by the block 8 Processing the results of the analysis during the third cycle of operation, which begins when the next Il tulse arrives; FROM pulse generator 26 into the counter 27. Decoder 28 decrypts the state of the counter 27 and gives permission to remove the information from the trigger 33 and 34 analyzers 7 through the elements AND-NOT 35-38 for a trigger 39-42 of block 8 Processing-analysis results.

Depending on the health of the diode and its position in the contact nat 1, only one of the flip-flops 39-42 of the processing unit 8 is set to one state.

tatov analysis. When I connects to a serviceable semiconductor diode, a trigger 39 is set; when It is connected, even a semiconductor diode is connected — Trigger 40; if there are arcs in the electrode pins or pn-junction, test the south diode - trigger 41; in the presence of a short Grind in electrode fluxes or p-tj-derehrd of the test diode: - three ger 4-2 .. ,,;, /, - i. ,;

In the case of an IGV equal to a semiconductor diode from the result processing block 8 a: the signal to the switch 2 is supplied to correct the connection of the diode to the parameter meter. When IG is connected, a signal is output from the output; yes, trigger 39 is fed to a relay amplifier 14 krmmutafor 2 and causes relay 16 to trip, | which your pins 17 and 18 make the correct connection of the diode to the outputs

3 and 4. In this case, the dirda is connected to the output 3, and the | anode is connected to the output

4 during the third cycle I of the device.,; ... .1-,:: -,. - When connecting the signal from the output of the trigger 40, it enters the relay amplifier 15 with a voltage of 1px 2 and triggers the relay 19j which, with its contacts 20 and 21, makes a correct connection of the daod a to the displace 3 and the cathode of the Id connects to output 3, and to vykhrdu 4 in t "the third third of the tact of the device

If there is an error: the diode is connected to the power supply 1 Unit level. It enters through the | element OR 51 of the launching unit 10 to the right from the inputs of the AND-NOT element 52, the permission to start the meter J.

In the presence of a diode break, a single level from the output yoke of the flip-flop 41 is supplied to the OR element 54 of the display unit 11 and then the amplifier 55 turns on the defect alarm lamp 58 and also goes to the amplifier 56 1and turns on the alarm signal lamp 59. At the same time, a single level from the direct output of the trigger 41 is fed to one of the inputs of the NAND element 23 of the communication unit 5 with the autoloader, giving permission to generate a break signal from the autoloader.

If there is a diode short circuit, the unit level from the output of the trigger 42 enters the element OR 54 of the block 11 Yndik1a1a1i and further, similarly to work in the presence of a break, turns on the defect signaling lamp 58, and also sends to the amplifier 57 and turns on the short circuit signaling lamp 60, simultaneously a single level from the output of the trigger 42 is fed to the ndins from the inputs of the lecture I; -NON 24 blr 5 communication with the automatic loader, giving permission to transmit the short-circuit signal from the bootloader. The last impulse from the pulse generator 26 goes to counter 27, is decoded in the decoder 28 and translates the operation of the device into the fourth cycle. The signal from the decoder 28 goes to one of the inputs of the AND-NOT elements 52, 23 and 24, the generator 26 by impulse and the counter 27. In the presence of a resolving potential, on the second input of the element AND-NOT 52, i.e. Tests of a serviceable diode, the start-up and: Parameter is taken through the start-up element 53. In the presence of p sreshak potential at the second input element AND-NOT 23, i.e. in the presence of a circuit in the electrode leads or in the pn-junction of the test semiconductor diode, information is transmitted to the automatic loader on a break. If there is a resolving potential at the second input of the element AND-NOT 24, i.e. in the presence of a short circuit in the electrode leads or a p-tj junction of the test semiconductor diode, the information is transmitted to the automatic loader about the short circuit. The signal supplied to the pulse generator 26, prohibits the generation of pulses and their transfer to the counter, and the signal of actions to the counter 27, resets the counter to its original position. Thus, the device for monitoring semiconductor diodes provides the required connection of the electrodes to the parameter meter with an arbitrary connection of the electrodes to the contacts of the contact device, at the same time performs testing of the diodes with a short 3ms or break in the electrode outputs of the pn junction, and also automatically produces Starting the parameter meter after connecting in case of a healthy diode or sending signals to the automatic loader to reset the diode in case of a faulty diode yes This reduces the time of checking party semiconductor diodes multistation universal devices controlled by electronic computers 1ashinami. As a result, the control performance is improved.

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Claims (1)

DEVICE FOR CONTROL OF SEMICONDUCTOR DIODES, containing a contact panel, the output of which is connected to the input of the first switch, the output of which is connected to the measurement terminals, which is connected with the fact that, in order to increase the monitoring performance, it is additionally introduced synchronization unit, a second switch, an analyzer, an analysis results processing unit, a start unit, a communication unit, an indication unit, wherein the first and second outputs of the synchronization unit are connected respectively to the first and second inputs of the second switch a, the third and fourth inputs of which are connected to the output of the contact panel, the third and fourth outputs / synchronization block are connected to the first and second inputs of the analyzer, the third and fourth inputs of which are connected to the first and second outputs of the second switch, the fifth output of the synchronization block is connected * to the first input of the analysis results processing unit, the second and third inputs of which are connected to the first and second outputs of the analyzer, and the fourth input is connected to the first output of the communication unit, the fifth input of the analyzer and input a unit, [synchronization, the sixth output of which is connected to the first inputs of the communication unit and the start-up unit, the second input _ of which is connected to the first output of the analysis processing unit ι and the first control_input of the first I / V switch, the second control (the input of which is connected to the third AND, [the output of the launch block and to the second output! an analysis results processing unit, g the third output of which is connected to the first input of the display unit and to the second input of the communication unit, the third input of which is connected to the second input of the display unit and • to the fourth output of the processing unit ^ analysis results.