SU1045167A1 - Substance dielectric constant measuring device - Google Patents
Substance dielectric constant measuring device Download PDFInfo
- Publication number
- SU1045167A1 SU1045167A1 SU823439905A SU3439905A SU1045167A1 SU 1045167 A1 SU1045167 A1 SU 1045167A1 SU 823439905 A SU823439905 A SU 823439905A SU 3439905 A SU3439905 A SU 3439905A SU 1045167 A1 SU1045167 A1 SU 1045167A1
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- SU
- USSR - Soviet Union
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- arm
- output
- polarizer
- measuring device
- dielectric constant
- Prior art date
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- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
УСТРОЙСТВО ДЛЯ ИЗМЕРЕНИЯ ДИЭЛЕКТРИЧЕСКОЙ ПРОНИЦАЕМОСТИ ВЕЩЕСТВ , содержащее генератор электромагнитного излучени , к выходу которого подсоединен пол ризатор, а также последовательно соединенные анализатор, приемник излучени и регистратор , отличающеес тем, что, с целью повышени точности измерений, на оптической оси между пол ризатором и анализатором установлены два делител луча дл размещени между ними к онтролируемого образца из исследуемого вещества, а также введены два последовательно установленных уголковых поворота, I причем вход первого уголкового поворота соединен с третьим плечом (Л первого делител луча, а выход второго уголкового поворота - с третьим плечом второго делител луча.A DEVICE FOR MEASURING THE DIELECTRIC PERMEABILITY OF SUBSTANCES containing an electromagnetic radiation generator, to the output of which a polarizer is connected, as well as a series-connected analyzer, radiation receiver and recorder, are installed on the optical axis two beam splitters for placing between them an test sample from the test substance, and also two sequentially installed corner rotations are introduced , I wherein the first input of the angle of rotation is connected to a third arm (A first beam splitter, and the output of the second angular rotation - with the third arm of the second beam divider.
Description
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Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU823439905A SU1045167A1 (en) | 1982-05-14 | 1982-05-14 | Substance dielectric constant measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU823439905A SU1045167A1 (en) | 1982-05-14 | 1982-05-14 | Substance dielectric constant measuring device |
Publications (1)
Publication Number | Publication Date |
---|---|
SU1045167A1 true SU1045167A1 (en) | 1983-09-30 |
Family
ID=21012359
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU823439905A SU1045167A1 (en) | 1982-05-14 | 1982-05-14 | Substance dielectric constant measuring device |
Country Status (1)
Country | Link |
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SU (1) | SU1045167A1 (en) |
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1982
- 1982-05-14 SU SU823439905A patent/SU1045167A1/en active
Non-Patent Citations (1)
Title |
---|
1. Бахтин В.Д. Определение диэлектрической проницаемости по отношению амплитуд Е-компонент отраженной и прошедшей через диэлектрик волн. Изв. ВУЗов.-Радиотехника, 1969, т. 12, б, с. 643. 2. Пунько Н.Н. и др. Эллипсометрическа установка дл контрол толщины диэлектрических покрытий в коротковолновой части миллиметрового диапазона.-Дефектоскопи , 1980, № 6, с. 104 (прототип). * |
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