SU1024819A1 - Electromagnetic flaw detection method - Google Patents
Electromagnetic flaw detection method Download PDFInfo
- Publication number
- SU1024819A1 SU1024819A1 SU792857918A SU2857918A SU1024819A1 SU 1024819 A1 SU1024819 A1 SU 1024819A1 SU 792857918 A SU792857918 A SU 792857918A SU 2857918 A SU2857918 A SU 2857918A SU 1024819 A1 SU1024819 A1 SU 1024819A1
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- SU
- USSR - Soviet Union
- Prior art keywords
- magnetic field
- components
- defect
- fixed gap
- determined
- Prior art date
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- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
СПОСОБ ЭЛЕКТРОМАГНИТНОЙ ДЕФЕКТОМЕТРИИ , заключающийс в том, что контролируемую поверхность намагничивают с помощью магниточувствительного преобразовател , установленного по нормали к контролируемой поверхности с фиксированным зазором, выдел ют составл ющие магнитного пол , обусловленные дефектом, отличающийс тем, что, с целью повышени точности, одновременно выдел ют составл ющие магнитного пол с по-. мощью второго магниточувствительного преобразовател , установленного на той же нормали с другим фиксированным зазоррм, используют тангенциальные составл ющие магнитного пол , а глубину 1i дефекта определ ют ло соотношению выделенных составл ющих из зависимости. H,. Г VK .z:, где Н и Н - определенные тангенциальныесоставл ющие магнитного пол рассе ни , обусловленные (Л дефектом и измеренные 41ри зазорах и Z.iCOOJBe-TCTBeHHQ-t К - коэффициент пропорциональности .A METHOD FOR ELECTROMAGNETIC DEFECTOMETRY, which consists in magnetizing a controlled surface with a magnetically sensitive transducer installed normal to a controlled surface with a fixed gap, separate components of the magnetic field, caused by a defect, which is different in that magnetic field components with a. The tangential components of the magnetic field are used by the power of the second magnetosensitive transducer mounted on the same normal with another fixed gap, and the depth 1i of the defect is determined by the ratio of the selected components from the dependence. H ,. Г VK .z :, where Н and Н are the determined tangential components of the magnetic field of the scattering, caused by the defect and measured 41 gaps and Z.iCOOJBe-TCTBeHHQ-t К is the proportionality factor.
Description
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Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU792857918A SU1024819A1 (en) | 1979-12-25 | 1979-12-25 | Electromagnetic flaw detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU792857918A SU1024819A1 (en) | 1979-12-25 | 1979-12-25 | Electromagnetic flaw detection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU1024819A1 true SU1024819A1 (en) | 1983-06-23 |
Family
ID=20867156
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU792857918A SU1024819A1 (en) | 1979-12-25 | 1979-12-25 | Electromagnetic flaw detection method |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU1024819A1 (en) |
-
1979
- 1979-12-25 SU SU792857918A patent/SU1024819A1/en active
Non-Patent Citations (1)
| Title |
|---|
| 1. Дефектоскопи , 1969, № k, с. 113-115 В. 2. Там же, 1966, № 5, с. 59 (прототип). * |
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